biographical summary of robert j. nemanich - Department of Physics ...

BIOGRAPHICAL SUMMARY OF ROBERT J. NEMANICH 

Business Address 

Department of Physics Phone: (480) 965-2240 

Arizona State University FAX: (480) 965-8093 

PO Box 871504 Email: Robert.Nemanich@asu.edu 

Tempe, AZ 85287-1504 

Education 

Joliet Junior College 1965-67 

Northern Illinois University 1969 B.S. Physics 

Northern Illinois University 1971 M.S. Physics 

The University of Chicago 

Industrial and Academic Positions 

1977 Ph.D. Physics 

1976-1986 Member Research Staff, General Sciences Laboratory (76-82), Project 

Leader, Integrated Circuit Laboratory (82-85), Senior Member Research 

Staff and Acting Area Manager, General Sciences Laboratory (85-86), 

Xerox Palo Alto Research Center, Palo Alto, California 

1986-1990 Associate Professor, Department of Physics, and Associate Member, Dept 

of Materials Science and Engineering, North Carolina State University. 

1990-2006 Professor, Department of Physics, and Associate Member of the Department 

of Materials Science and Engineering, Acting Associate Dean of Research 

(2/2000 through 1/2001), North Carolina State University. 

2006-present Professor and Chair, Deaprtment of Physics, Arizona State University. 

Society Memberships 

American Physical Society (Fellow, 1994) 

Materials Research Society (Past President, President: 1998) 

International Union of Materials Research Societies (Past President, President: 2003-2004) 

Electrochemical Society 

Sigma Xi 

Fields of Research Interest 

Diamond and other wide bandgap semiconductors, Nanostructures, Semiconductor surface 

processing, Heteroepitaxy on Si, Silicide formation, Raman scattering, and Surface science 

Awards 

NC State Alumni Association’s Outstanding Research Award 1994 

NC State Alumni Association’s Distinguished Graduate Professorship 2001 

Contents: 

1. Students 

2. Professional Activities 

3. Policy and Professional Articles 

4. Patents 

5. Books Edited 

6. Review Chapters 

7. Publications 

8. Invited Conference Presentations 

9. Short Courses and Tutorials 

10. Seminars and Colloquia 

11. Grants Awarded and Pending 

1

1. Students 

Graduate Students 

Charles Doland, PhD., Univ of Houston (Adjunct Faculty), Spring 88, “Molybdenum 

Silicide Formation on Single Crystal, Polycrystallilne and Amorphous Silicon: 

Growth, Structure and Electrical Properties.” 

Robert E. Shroder, MS, Fall 88 (Current Address; TWR, Redondo Beach, CA (as of 

12/96), “Diamond and Diamond-Like Thin Films: A Raman Scattering Analysis 

of Carbon Bonding.” 

Robert Fiordalice, MS, Fall 88 (Current Address; Motorolla APRDL, Austin, TX), 

“Raman Characterization of the Ti/Si Thin Film System.” 

Yvonne LeGrice, MS, Fall 89 (Current address; Applied Materials), “Raman and Infrared 

Characterization of Diamond Thin Films.” 

Hyeongtag Jeon, (PhD, Materials Science and Engineering), Fall 90 (Current address 

Honyang University), “Initial Reactions, Surface and Interface Morphologies, 

Phases Transition, and Epitaxial Growth of TiSi2 Formed by Thin Film Reaction 

in Ultrahigh Vacuum.” 

John LaBrasca, MS, Spring 91 (Current address: Intel, Portland, OR), “Scanning 

Tunneling Microscopy and Spectroscopy of Doped Silicon and Titanium Silicide 

Thin Films.” 

Cathy Sukow, MS, Fall 92 (Current address; Brandeis University - Biophysics program), 

“Morphology and Mechanisms of ZrSi2 and TiSi2 on Silicon.” 

Jaewon Cho, PhD, Fall 92 (Current address; Seoul, Korea), “Surface Structure and 

Surface Electronic States Related to Plasma Cleaning of Si and Ge.” 

Kevin Turner, PhD, Fall 92 (Current address; Naval Research Laboratories), “A Study of 

the Nucleation and Growth of Diamond on Silicon by Scanning Tunneling 

Microscopy and Spectroscopy.” 

Jaap van der Weide, (PhD) Fall 93, (Current Address: Waltham, MA) “Properties of 

Diamond Surfaces and Metal-Diamond Interfaces: Schottky Barrier Heights and 

Negative Electron Affinity Effects.” 

Thomas Schneider, (PhD) Spring 94, (Current Address: Texas Instruments, 13536 N. 

Central Expressway, MS 944, Dallas, TX 75243) “Hydrogen Plasma Interactions 

with Silicon Surfaces.” 

Shawn Wagoner, (MS) Summer 94, (Current Address: Micron Technology, Boise, ID). 

“Nucleation and Growth of Homoepitaxial Diamond Films.” 

Julian Selvaraj, (MS) Summer 94, (Current Address: Intel Corp, Oregon) “Photophoretic 

Deflection of Particles in Subatmospheric Pressure Chambers.” 

Terri McCormick, (MS chair) Summer 1994 “The Characterization of Strain, Impurity 

Content and Crush Strength of Single Crystal Diamonds.” (Current Address: 

Harris Semiconductor, Melbourne FL. (Senior Reliability Engineer). 

David Aldrich, (PhD co-chair) Spring 1995 "Characterization of the Solid Phase 

Reaction of Titanium with Silicon Germanium Alloys: Interface Reactions, Phase 

Formation, and Stability." Current Address: Texas Instrument, Semiconductor 

Process & Design Center, Dallas, TX. 

2

Leah Bergman, (PhD chair) Spring 1995 ). “Photoluminescence and Raman Analysis of 

Impurities and Defects in Diamond Films.” Current Address: University of Idaho, 

Moscow, Idaho. 

Eric Watko, (MS chair) Spring 1995 “In situ Characterization of Oxide Thin Film 

Growth.”(Current Address: Raleigh, NC) 

Mike Powers, (MS chair) Summer 1995 )."Photoemission from BN and Secondary 

Electron Emission from Negative Electron Affinity Surfaces." Current Address: 

MKE Quantum Components, Shrewsbury, MA. 

Yuan Dao, (PhD co-chair) Fall 1995 “Growth and Characterization of (Ti1-xZrxSi2) Thin 

Films on Silicon.” Current Address: Texas Instrument, Dallas, TX. 

Jay Montgomery, (PhD chair) December 14, 1995. “Materials and Device Analysis of 

Hydrogen Plasma Prepared Silicon Surfaces,” Current Address: Intel, Santa 

Clara, CA. 

Ja-Hum Ku, (PhD chair) December 19, 1995 “Properties of SixGe1-x Alloy Surfaces and 

Co/SixGe1-x Interfaces.” Current Address: Samsung Electronics, Korea. 

Michael Netzer, (MS chair), November 1996 “Emission Studies of Diamond and Cubic 

Boron Nitride Crystallites Bonded to Metalllic Substrates.” Current Address: 

Harris Semiconductor, P. O. Box 883, MS 59-055, Melbourne, FL 32902-0883. 

Sean King, (PhD co-chair) March 25, 1997, “Surface and Interface Characterization of 

SiC and III-V Nitrides.” Current address: Intel, RA1-234, 5200 NE Elam Young 

Pkwy, Hillsboro, OR 97124-6497. 

John Barnak, (PhD chair) June 24, 1997 “Processing of Si(100) Surfaces by a Remote RF 

H2 and H2/SiH4-Plasma to Remove Surface Contaminants”. Current Address: 

Intel, Oregon 

Peter Baumann, (PhD chair) July, 1997 “Electron Affinity and Electron Emission from 

Diamond Surfaces and Metal-Diamond Interfaces.” Current Address: Aixtron, 

Germany. 

Mark Benjamin, (PhD chair) December 1997, “Electronic Properties of SiC and AlN 

Surfaces and Interfaces.” Current Address: new job as of Spring 2002. 

Andy Stoltz (MS) January 1998, “Interface Stability of Tintanium Silicide on 6H-Silicon 

Carbide (0001).” Current Address: Triangle, VA. 

Steve English (MS chair) September 1998, Current Address: Allied Signal, Maryland, 

“Photoemission Electron Microscopy of Diamond Thin Films.” 

Hong Ying, (PhD chair) October 1998, “In-Situ Remote RF Plasma Cleaning and Surface 

Characterization after SiO2/Si RIE.” Current Address: LSI Logic, San Jose,CA. 

Ambika Somashekhar Carter (MS chair) October 1998, “The Investigation of Hydrogen 

Plasma Processing for Backend Cleaning.”Current Address: IMEC, Leuven, 

Belgium 

Andy Sowers, (PhD chair) January 1999, “Characterization of Field Emission Properties 

of Nitrogen-Doped Diamond.” Current Address: Intel, San Jose, CA., 

Peter Goeller, (PhD co-chair) May 1999, “Cobalt Disilicide Contacts to Si1-xGex Alloys.” 

Current Address: Texas. 

Jim Christman, (PhD chair), August 1999, “Piezoelectric Measurments Using an Atomic 

Force Microscope.” Current Address: Intel, San Jose, CA, 

3

Richard J. Carter, (PhD chair) September 1999, “Surface Morphology and Chemical 

Characterization of Si Surfaces Prepared with HF/Alcohol Vapor Phase 

Chemistries.” Current Address: Post Doc at IMEC, Leuven, Belgium. 

Hoon Ham, (PhD chair) November 1999, “Scanning Tunneling Microscopy of Nanoscale 

Structures of Titanium Disilicide on Clean Silicon Surfaces.”Current Address: 

Serome Ventures, Korea. 

Michael O’Brien, (PhD chair) October 1999, “Photoemission of Silicon Carbide Surfaces 

and Interfaces.” Current Address: Northrup-Grumann, Maryland. 

Brandon L.Ward, (PhD chair), February 2000, “Correlation of Surface Properties with 

Electron Emission Characteristics for Wide Bandgap Semiconductors.” Current 

Address: Intel Corp., Santa Clara, CA. 

Kieran M. Tracy, (PhD co-chair) September 2000, “Deposition and Electrical, Chemical 

and Microstructural Characterization of the Interface Formed between Pt, Au and 

Ag Rectifying Contacts and Cleaned n-typed GaN (0001) Surfaces.” Current 

Address: Intel Corporation, Santa Clara, CA. 

Jeff Hartman, (PhD co-chair) October 2000, “Characterization of the Growth of 

Aluminum Nitride and Gallium Nitride Thin Films on Hydrogen Etched and/or 

cleaned 6H-SiC(0001) Surfaces.” Current Address Northrup-Grumann, Maryland. 

Christian Petrich, (MS). Dec. 2000, Current Address: New Zealand, “Thermostability of 

the 6H-SiC(0001)Si Surface Observed with Photo-Emission Electron Microscopy 

(PEEM).” 

Woochul Yang, (PhD chair), February 2001, “In Situ, Real Time Characterization and 

Growth of Metal Silicide Islands on Si Surfaces by Photo Electron Emission 

Microscopy,” Current Address: NCSU, Post doc. 

Jaehwan Oh (PhD chair), July 2001, “Electrical Characterization of TiSi2 Nanoscale 

Islands by Scanning Probe Microscopy.” Current Address: Intel, Hillsboro, 

Oregon. 

Morgan Ware (PhD chair), January 2002, “Effects of Strain Relaxation in SiGe Growth 

on Uniquely Oriented Si Substrates.” Current Address: Naval Research Lab, 

Washington, DC. 

Philip Hartlieb (PhD-co-chair), February 2002, “Electrical, Chemical, and Structural 

Characterization of the Interface Formed between Ni/Au and Pd/Au Ohmic 

Contacts and Cleaned p-type GaN (0001) Surfaces,” Current address: Clemson 

University. 

Franz A. M. Koeck (MS chair), 2003 “Thermionic Emission from Doped and 

Nanocrystalline Diamond” 

Ted Cook, Jr. (PhD co-chair), May 2003, “Photoemission Investigation of the Electronic 

Properties of Ga-Face GaN (0001)-Dielectric Interfaces” 

Jaeseob Lee (PhD co-chair), May 2003 “Direct Bonding of Gallium Nitride to Silicon 

Carbide: Physical, and Electrical Characterization” (Current address: Univ of Ill., 

Post doc) 

Brian Coppa (PhD co-chair) June 2003, “Electrical, Chemical, and Structural 

Characterization of Au Schottky Contacts on Remote Plasma-Treated n-Type 

ZnO{0001}” (Current address: Micron Semiconductor, Idaho) 

4

Brian Rodriguez (PhD chair) Oct. 2003 “Nanoscale Investigation of the Piezoelectric 

Properties of Perovskite Ferroelectrics and III-Nitrides,” (current address: NC 

State, post doc.) 

James Burnett, (PhD co-chair) March 2, 2004 “Formation of Metal Silicide and Metal 

Germanosilicide Contacts to Si1-xGex Alloys,” 

Yunyu Wang, (PhD chair) Oct. 29, 2004, “Synthesis and Field Emission Properties of 

Carbon Nanotube Films,” (current address: Univ of Texas, post doc) 

Jennifer Huening, (MS chair) Nov. 01, 2004, “Raman Scattering Analysis of Structural 

Transformations due to Precision Engineered Si, 6H-SiC and B-Si3N4,” (Current 

Address: Intel, Hillsboro, Oregon) 

Charles Fulton (PhD chair) Aug 2005 “Spectroscopic Study of the Interface Chemical 

and Electronic Properties of High-K Gate Stacks,” (Current address: Intel, 

Phoenix AZ) 

Jacob Garguilo (PhD Chair) Nov 2006, “Electronic Transition Imaging of Carbon Based 

Materials: The Photothreshold of Melanin and Thermionic Field Emission from 

Diamond” 

Matt Zeman (PhD) 

Yingjie Tang (PhD) 

Joshua Smith (PhD) 

Eugene Bryan (MS) 

Anderson Sunda-Meya (PhD) 

Xinhua (Wendy) Kong (PhD) 

Leigh Winfrey (PhD) 

James Perkins (PhD) 

Joe Tedesco (PhD) 

Jacqueline Hanson (PhD) 

Benjamin Gilbert (MS) 

Jiyoung Choung (PhD) 

Ed Hurt (MS) 

Post Docs/Visiting Scholars Mentored 

Leah Bergman 

Boyan Boyanov 

Y. L. Chen 

Anne Edwards 

Trevor Humphries 

Hyeongtag Jeon 

Eliane Maillard-Schaller 

Koichi Naniwae, Visiting Scholar 

Willie Platow 

Arilza de Oliveira Porto, Visiting Scholar 

Zhihai Wang 

Peichun Yang 

Woochul Yang 

Sanju Gupta 

Brian Rodriguez 

5

International Visiting Students (Diplom research etc.) 

Boike Kropman, 92, (Twente University, Holland) 

Michiel Slotboom, 93, (Twente University, Holland) 

Rob Analbers, 94, (Twente University, Holland) 

Friso Jedema, 96 (Twente Univesity, Holland) 

Christian Koitzsch (Technische Universitat Ilmenau, Germany 7/97-10/98) 

Christian Petrich (August 1998-August 2000) 

Peter Laloli, (Twente University, Holland August-December 1998) 

Edwin Jellema, (Twente University, Holland May-August 1999) 

Lena Fitting, 8/01-8/02 (Rostock University, Germany) 

Marcel Himmerch, 3/31/03-10/10/03 

Roland Koch, 6/04-7/04, 6/05-8/05 

Nina Malchus 1/06-5/06 

Undergraduate Students (years of participation) 

Mark Miller 87, 88 

Mike Reid 88, 89 

James Parks 89, 90 

Shannon Wells 90 (Marsh-White Award at SESAPS) 

Eugen Buehler 89,90,91 (Marsh-White Award at SESAPS and fellowship to attend Int. 

Conf. Of Physics Students, Vienna, Austria) 

Joffa Applegate 91 

Greg Newman 91 

Paul Fullbright 91 

Barbara Bernhard 92 

Robert Corbett, 92, 93 

Richard Carter, 92, 93, 94 

Daniel Cartin , 92 

Bart Lambers, 94, 

Jens Engemann, 94 

Holly Heck, 94 (REU) 

Jesse Frye, 94 (REU) 

Stephen Ellis, 95, 96, 97 

Steven English, 95 

Richard Busby, 95 (REU) 

David Mathes, 95 (REU) 

Darci Allen, 96 (REU) 

Ted Cook, 96, 97 (REU) 

Robin LaSalle, 96 (REU) 

Svjetlana Pejdo 96, 97, 98 

Rebecca Beauchamp (Summer 1997 REU) 

Nicole Morgan (Summer 1997 REU, Fall 1997) 

Brett Connor Fall 97, Spring 98 

Erica Robertson, Fall 97, Spring 98 (Recipient of MRS Undergraduate Research Award) 

6

Jessica Hauser (REU Summer 1998) 

Patrick Murphy (REU Summer 1998) 

Ted Cook (Summer 1998) 

Nithin Reddy (Science House High School Program Summer 1998) 

Jeremy Katz (Science House High School Program Summer 1998) 

Nathan George, Spring 99, 

Eugene Bryan, Spring 99-Summer 2000 

Chris Hinkle, Spring 99 

Ian Makey, Summer 1999 REU 

Mike Muglia, Summer 1999 REU 

Billyde Brown, Summer 1999 ARO, Fall 1999-Summer 2003 

Reece Haywood, Summer 2000, REU 

Berhane Temelso, Summer 2000, REU 

Matt Zeman, Summer 2000, REU 

David Baker, Summer 2001, REU 

Brian Davis, Summer 2001, REU 

Kandace Tanner, Summer 2001, REU 

Sally Royo, Spring 2002 

Brendan Shields, Summer 2002, REU 

Jennifer Huening, Summer 2002, REU 

Michele Buddie, Summer 2002, REU 

Rayshad Ali, Summer 2003, REU 

Jeff Moeur, Summer 2003, REU 

Wor Thongtei, Summer 2003, REU 

Brenden Shields, REU/Enloe High School Student, Summer 03 

Mengning Liang, 2003 

Karen H. Spieler Canne 2003 

John Waldrep 2003-2005 

Claudia Williams 2003 

Lucas Bilbro 2003-2005 

Nicholas Johnson, Summer 2004, REU 

Sarah E. Reising 2004-2005 

Luke Postle 2005 REU 

Roland Koch 2005 REU 

Simon Stampe 2006 REU 

2. Professional Activities 

Co-chairman, Symposium on Thin Films - Interfaces and Phenomenon, Materials Research 

Society, Fall 1985. 

Local Arrangements, 17th International Conference on the Physics of Semiconductors, 

1984. 

Publications Committee, Materials Research Society, 1987-1989. 

Program Committee, Materials Research Society, 1988-1990. 

Co-chairman, Symposium on Heteroepitaxy on Silicon: Fundamentals, Structures and 

Devices, Materials Research Society, Spring 1988. 

7

Meeting Co-Chair, 1989 Fall Meeting of the Materials Research Society. 

Co-chair, Diamond Optics, SPIE's 32 Annual Int. Technical Symposium. 

Local Arrangements: 13th Int. Conference on Amorphous and Liquid Semiconductors - 

1989. 

Discussion Leader, Session Organizer, Gordon Research Conference on Inorganic Thin 

Films & Interfaces, 1989. 

Member of Joint North Carolina/North Rhine-West Phalia Committee on Microstructures; 

Section Organizer, 1989- 

Presidential Visit of Laboratory - February 2, 1990 

Co-chair, Symposium on Chemical Surface Preparation, Passivation and Cleaning for 

Semiconductor Processing, Materials Research Society, Spring 1992. 

Executive Committee (member at large), Division of Materials Physics, the American 

Physical Society, 92-95. 

Chair, Continuing Education Committee, Materials Research Society (1992-1994). 

Co-chair, Symposium on Diamond, SiC and Nitride Wide Bandgap Semiconductors 

Materials Research Society, Spring 1994 

Co-chair, Symposium on III-Nitride, SiC and Diamond Materials For Electronic Devices 


2nd Vice President of Materials Research Society (Elected), Jan-Dec 1996, 

President Elect-Vice President, Materials Research Society, Jan-Dec 1997, 

President, Materials Research Society, Jan-Dec 1998, 

Past President, Materials Research Society, Jan-Dec 1999 

Co-chair, Symposium on Electron-Emissive Materials and Vacuum Microelectronics 


Program Committee: Diamond Films 96-2006 

Editor-in-Chief, Diamond and Related Materials, 1999-present. 

Vice President, International Union of Materials Research Society, 2000-2002 

President, International Union of Materials Research Society, 2002-2004 

Past President, International Union of Materials Research Society, 2004-2006 

Co-chair, Symposium on Nanostructured Diamond and Diamond-Like Materials for 

Micro- and Nanodevices Materials Research Society, Spring 2005 

Chair, Joint ICNDST-ADC-2006 (International Conference on New Diamond Science and 

Technology and Applied Diamond Conference) Research Triangle Park, NC, May 

2006. 

Co-Chair, CIMTEC 2006 (International Conference on Modern Mateials and 

Technologies), 4th Forum on New Materials, Acereale, Sicily, Italy, June 2006. 

8

3. Policy and Professional Articles 

“New Symposium Tutotial Program Debuts at the 1995 MRS Fall Meeting,” R.J. 

Nemanich, MRS Bulletin 20, (11), p. 98-99, November 1995. 

“Group III Nitrides for Field Emissions Displays,” C. R. Bolognesi, Compound 

Semiconductors, Second Annual Epitaxy Issue, Vol. 3 (2) p. 10, March/April 1997. 

“Still looking forward with the MRS way of doing things”, R.J. Nemanich, MRS Bulletin 

23, (1) p. 4, January 1998. 

“MRS goes to Washington,” R.J. Nemanich, R. Gibala, J.M. Phillips, R. Kelley, MRS 

Bulletin 23, (9), p. 14, September 1998. 

“MRS Celebrates 25 Years,” R. J. Nemanich, MRS Bulletin 23, (11), p. 5, November 1998. 

“MRS Volunteers Contribute to Building a Professional Identity,” R. J. Nemanich, MRS 

Bulletin 23, (12), p. 3, December 1998. 

“Advancing the science and technology of diamond, diamond-like carbon, silicon carbides 

and Group 3 nitride materials,” Robert J. Nemanich, editor-in-chief, Diamond and Related 

Materials, 2000, Jan., 9 (1):p. vii. 

“Editorial,” R.J. Nemanich, Diamond and Related Materials, (1), p. vii (2003). 

4. Patents 

“Ohmic Contacts for Hydrogenated Amorphous Silicon,” 1985, No. 4,529,619. R.J. 

Nemanich and M.J. Thompson. 

“High Temperature Refractory Silicide Rectifying Contact,” 1991, No. 5,155,559. T. 

Humphreys, D. Thompson, S. Sahaida, R. Nemanich and K. Das. 

“High Temperature Rectifying Contact and Method for Making Same,” 1991, No. 

5,212,401. T. Humphreys, K. Das and R. Nemanich. 

5. Books Edited 

1. Thin Films - Interfaces and Phenomena, edited by R.J. Nemanich, P.S. Ho and S.S. Lau, 

(Materials Research Society Symposia Proceedings, Vol. 54, 1986). 

2. Heteroepitaxy on Silicon - Fundamentals, Structures and Devices, edited by H.K. Choi, R. 

Hull, H. Ishiwara, and R.J. Nemanich, (Materials Research Society Symposium 

Proceedings, Vol 116, 1988). 

9

3. Chemical Surface Preparation, Passivation and Cleaning for Semiconductor Growth and 

Processing, edited by R.J. Nemanich, C.R. Helms, M. Hirose, and G.W. Rubloff, 

(Materials Research Society Symposium Proceedings, Vol 259, 1992). 

4. Diamond, SiC and Nitride Wide Bandgap Semiconductors, edited by C.H. Carter, Jr., G. 

Gildenblat, S. Nakamura, and R.J. Nemanich, (Materials Research Society Symposium 


5. III-Nitride, SiC and Diamond Materials for Electronic Devices, edited by D. Kurt Gaskill, 

Charles D. Brandt and Robert J. Nemanich, (Materials Research Society Symposium 


6. Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays, edited by 

K.L. Jensen, R.J. Nemanich, P. Holloway, T. Trottier, W. Mackie, D. Temple, J. Itoh 

(Materials Research Society Symposium Proceedings, Vol. 621, 2001). 

6. Review Chapters 

1. “Schottky Barriers on Amorphous Si and Their Applications,” R.J. Nemanich and M.J. 

Thompson, Metal-Semiconductor Schottky Barrier Junctions and Their Applications edited 

by B.L. Sharma, (Plenum Publishing Corp., 1984). 

2. “Schottky Barriers on a-Si:H,” R.J. Nemanich, Semiconductors and Semimetals, Vol. 21, 

Part C, Edited by J. Pankove, (Academic Press, 1984). 

3. “Surface Characterization,” Analytical Chemistry Application Reviews 61, 243R-269R 

(1989). J.E. Fulghum, G.E. McGuire, I.H. Musselman, R.J. Nemanich, J.M. White, D.R. 

Chopra, and A.R. Chourasia. 

4. “Growth and Characterization of Diamond Thin Films,” R.J. Nemanich. Annu. Rev. Mat. 

Sci., vol 21, 535-558 (1991). 

5. “Surface Characterization,” Analytical Chemistry Application Reviews 63, 99R (1991). 

M.A. Ray, G.E. McGuire, I.H. Musselman, R.J. Nemanich, and D.R. Chopra. 

6. “Remote Plasma Processing for Silicon Wafer Cleaning,” R.A. Rudder, R.E. Thomas, and 

R.J. Nemanich. Handbook of Silicon Wafer Cleaning Technology, Edited by W. Kern, 

(Noyce Publications, Park Ridge, NJ), p. 340-372, 1993, 

7. “Characterization of the Composition, Stoichiometry and Related Microstructure of Optical 

Materials,” R. J. Nemanich and T. P. Humphreys. Characterization of Optical Materials, 

Edited by Gregory J. Exarhos (Butterworth-Heinemann, Boston, 1993) p. 49-70. 

10

8. “Surface Characterization,” G. E. McGuire, M. A. Ray, Steven J. Simko, F. Keith Perkins, 

Susan L. Brandon, Elizabeth A. Dobisz, R. J. Nemanich, A. R. Chourasia and D. R. 

Chopra, Anal. Chem. Appl. Rev. 65, 311R-333R (1993). 

9. “Surface Characterization,” G. E. McGuire, Max L. Swanson, Nalin R. Parikh, Steve 

Simko, P. S. Weiss, J. H. Ferris, R. J. Nemanich, D. R. Chopra, and A. R. Chourasia, Anal. 

Chem. Appl. Rev. 67, 199R-220R (1995). 

10. “Optical Properties of Diamond Films and Particles,” Leah Bergman and R. J. Nemanich. 

Handbook of Optical Properties Volume II, edited by R. E. Hummel, P. Wissmann 331- 

371 (CRC Press, 1996). 

11. “Raman Spectroscopy for Characterization of Hard, Wide Band Gap Semiconductors: 

Diamond, GaN, GaAlN, AlN, BN,” Leah Bergman and Robert J. Nemanich. Annual. 

Review of Mater. Sci., Vol. 26, 551-579 (1996). 

12. “Surface Characterization”, G. E. McGuire, P. S. Weiss, J. G. Kushmerick, J. A. Johnson, 

Steve J. Simko, R. J. Nemanich, Nalin R. Parikh, and D. R. Chopra, Anal. Chem. 69, 231R- 

250R (1997). 

13. “Electron Emission from CVD-Diamond Cold Cathodes,” Peter K. Baumann and Robert J. 

Nemanich, Low -Pressure Synthetic Diamond, Manufacturing and Applications, edited by 

B. Dischler and C. Wild , Chapter 15, p 281-303 (1998). 

14. “Electron Emission from Diamond and Other Wide Bandgap Semiconductors,” R. J. 

Nemanich, P. K. Baumann, M. C. Benjamin, S. P. Bozeman and B. L. Ward. Proceedings 

of the International School of Physics Enrico Fermi, The Physics of Diamonds, edited by 

A. Paoletti and A. Tucciarone, Varenna, Italy, p. 537-554, 1997. 

15. “Electron Affinity of AlN, GaN and AlGaN Alloys,” Robert J. Nemanich.Gallium Nitride 

and Related Compounds, Edited by Edgar, Strite, Akasaki and Amano, EMIS Datareview 

Series No. 23, (INSPEC, London, 1998), p. 98-103. 

16. “Band offsets at inerfaces between AlN, GaN and InN,” S. W. King, R. J. Nemanich and R. 

F. Davis. Gallium Nitride and Related Compounds, Edited by Edgar, Strite, Akasaki and 

Amano, EMIS Datareview Series No. 23, (INSPEC, London, 1998), p 500-505. 

17. “Surface Characterization,” G. E. McGuire, J. Fuchs, P. Han, J.G. Kushmerick, P.S. Weiss, 

S.J. Simko, R.J. Nemanich, and D.R. Chopra, Anal. Chem. 71, (12) 373R-388R (1999). 

18. “Wet chemical cleaning and surface preparation of Si,” M. M. Heyns and R. J. Nemanich. 

Properties of Crystalline Silicon, Edited by Robert Hull EMIS Datareview Series No 20, 

(INSPEC, London, 1999), p 219-225. 

11

19. “HF vapour cleaning of oxide on c-Si,” R. J. Carter and R. J Nemanich. Properties of 

Crystalline Silicon, Edited by Robert Hull EMIS Datareview Series No 20, (INSPEC, 

London, 1999), p. 226-234. 

20. “Plasma and other in situ approaches to cleaning of c-Si surfaces,” Hong Ying, R. J. Carter, 

G. B. Rayner and R. J. Nemanich. Properties of Crystalline Silicon, Edited by Robert Hull 

EMIS Datareview Series No 20, (INSPEC, London, 1999), p. 235-242. 

21 “Principles of metal-semiconductor contacts and experimental studies of Ohmic Contacts 

to GaN,” P. J. Hartlieb, R. F. Davis and R. J. Nemanich, Nitride Semiconductors and 

Devices, Edited by H. Morkoc, (Springer, New York, 1999) p. 191-215. 

22. “Raman Scattering Spectroscopy and Analyses of III-V Nitride-Based Materials,” Leah 

Bergman, Mitra Dutta and Robert J. Nemanich. Raman Scattering in Materials Science, 

Edited by W. H. Weber and R. Merlin. Springer, 273-313 (2000). 

23. “Silicide Contacts for Si/Ge Devices,” Chapter 7, J.E. Burnette, M. Himmerlich, R.J. 

Nemanich, Silicide Technology for Integrated Circuits, Edited by L.J. Chen, (IEE, 

London, 2004) p. 175-200. 

24. “Raman spectroscopy of diamond and doped diamond” S. Prawer, R.J. Nemanich, 

Philosophical Translations of the Royal Society A 362, 2537-2565 (2004) 

12

7. Publications 

1975 

1. “Coordination Dependent Vibrational Properties of Amorphous Semiconductor Alloys,” G. 

Lucovsky, R.J. Nemanich, S.A. Solin, and R.C. Keezer. Solid State Commun. 17, 1567- 

1572 (1975). 

2. “Vibrational Modes of Amorphous (GeS2)1-x(As2S3)x and (GeSe2)1-x(As2Se3)x,” R.J. 

Nemanich, S.A. Solin and G. Lucovsky. Proc. of the 4th International Conference on Light 

Scattering in Solids, Campinas, Brazil (1975). 

3. “Raman Spectra of the As2S3-GeS2 and As2Se3-GeSe2 Alloy Systems,” R.J. Nemanich 

and S.A. Solin and G. Lucovsky. Proc. of the 6th International Conference on Amorphous 

and Liquid Semiconductors, Edited by B.T. Kolomiets, Leningrad, Russia (1975) p. 518- 

520. 

1976 

4. “Inexpensive High-speed Dentist Drill Light Chopper and its use in Rejecting 

Luminescence Background from Raman Spectra,” R.J. Nemanich, S.A. Solin and J. 

Doehler. Rev. Sci. Instrum. 47, 741-744 (1976). 

1977 

5. “Mossbauer Study of the Ferromagnetic Behavior of Chromium-rich Fe-Cr Alloys,” R. 

Nemanich, C.W. Kimball, B.D. Dunlap and A.T. Aldred. Phys. Rev. B 16, 124-127 

(1977). 

6. “First Evidence for Vibrational Excitations of Large Atomic Clusters in Amorphous 

Semiconductors,” R.J. Nemanich, S.A. Solin and G. Lucovsky. Solid State Commun. 21, 

273-276 (1977). 

7. “Raman-Brillouin Light Scattering Determination of the Structural Correlation Range in 

GeSe2 Glass,” R.J. Nemanich, M. Gorman and S.A. Solin. Solid State Commun. 21, 277- 

280 (1977). 

8. “Infrared Active Optical Vibrations of Graphite,” R.J. Nemanich, G. Lucovsky and S.A. 

Solin. Solid State Commun. 23, 117-120 (1977). 

9. “Low-Frequency Inelastic Light Scattering from Chalcogenide Glasses and Alloys,” R. J. 

Nemanich Phys. Rev. B 16, 1655-1674 (1977). 

10. “Optical Probes of the Lattice Dynamics of Graphite,” R.J. Nemanich, G. Lucovsky and 

S.A. Solin. Mat. Sci. and Eng. 31, 157-160 (1977). 

13

11. “New Chemically-ordered Compositions in the Glass Systems Ge1-xSx and Ge1-xSex,” G. 

Lucovsky, R.J. Nemanich and F.L. Galeener. Proc. of the 5th International Conference on 

Amorphous and Liquid Semiconductors, Edinburgh, Scotland (1977). 

12. “Observation of an Anomolously Sharp Feature in the 2nd Order Raman Spectrum of 

Graphite,” R.J. Nemanich and S.A. Solin. Solid State Commun. 23, 417-420 (1977). 

13. “Raman Scattering from Intercalated Donor Compounds of Graphite,” R.J. Nemanich, S.A. 

Solin and D. Guerard. Phys. Rev. B 16, 2965-2972 (1977). 

14. “Long Wavelength Lattice Vibrations of Graphite,” R.J. Nemanich, G. Lucovsky and S.A. 

Solin. Proc. of the International Conference on Lattice Dynamics, edited by M. Balkanski 

(Flammarion, Paris, France) 619-622 (1977). 

1978 

15. “Spectroscopic Evidence for Bonding Coordination Defects in Amorphous As,” R.J. 

Nemanich, G. Lucovsky, W. Pollard and J.D. Joannopoulos. Solid State Commun. 26, 137- 

139 (1978). 

16. “Hydrogen Bonding in Silicon-Hydrogen Alloys,” J.C. Knights, G. Lucovsky and R.J. 

Nemanich. Phil. Mag. B 37, 467-475 (1978). 

17. “Thermally Induced Effects in Evaporated Chalcogenide Films. I. Structure,” R.J. 

Nemanich, G.A.N. Connell, T.M. Hayes and R.A. Street. Phys. Rev. B 18, 6900-6914 

(1978). 

18. “Thermally Induced Effects in Evaporated Chalcogenide Films. II. Optical Absorption,” 

R.A. Street, R.J. Nemanich and G.A.N. Connell. Phys. Rev. B 18, 6915-6919 (1978). 

19. “Raman Scattering from the Copper Halides Cul, CuBr, and CuCl in the High Temperature 

Phases,” R.J. Nemanich and J.C. Mikkelsen, Jr. Proc. of the 14th International Conference 

on the Physics of Semiconductors, Edinburgh, Scotland, No. 43, Chapter 20, p. 661-664 

(1978). 

20. “Hydrogen Environments and Defects in Plasma-Deposited a-Si:H,” D.K. Biegelsen, G. 

Lucovsky, J.C. Knights and R.J. Nemanich. Proc. of the 14th International Conference on 

the Physics of Semiconductors, Edinburgh Scotland, Vol. 43, p. 1143-1146, (1978). 

1979 

21. “Defects in Plasma-deposited a-Si:H,” J.C. Knights, G. Lucovsky and R.J. Nemanich. J. 

Non-Cryst. Solids 32, 393-403 (1979). 

14

22. “Structural Interpretation of the Vibrational Spectra of α-Si:H Alloys,” G. Lucovsky, R.J. 

Nemanich and J.C. Knights. Phys. Rev. B 19, 2064-2073 (1979). 

23. “First- and Second-order Raman Scattering from Finite-size Crystals of Graphite,” R.J. 

Nemanich and S.A. Solin. Phys. Rev. B 20, 392-401 (1979). 

24. “Light Scattering from Correlated Ion Fluctuations in Ionic Conductors,” R.J. Nemanich, 

R.M. Martin and J.C. Mikkelsen, Jr. Solid State Commun. 32, 79-82 (1979). 

25. “Low Frequency Light Scattering from the Cuprous Halides,” R.J. Nemanich, R.M. Martin 

and J.C. Mikkelsen, Jr. Proc. of the International Conference on Fast Ion Transport in 

Solids, Lake Geneva, Wisconsin pp. 547-552, (1979). 

1980 

26. “Interference Enhanced Raman Scattering from very Thin Absorbing Films,” G.A.N. 

Connell, R.J. Nemanich and C.C. Tsai. Appl. Phys. Lett. 36, 31-33 (1980). 

27. “Interference-enhanced Raman Scattering of very Thin Titanium and Titanium Oxide 

Films, R.J. Nemanich, C.C. Tsai and G.A.N. Connell. Phys. Rev. Lett. 44, 273-276 (1980). 

28. “Structural Studies of Amorphous Semiconducting Thin Films using Interference 

Enhanced Raman Scattering,” C.C. Tsai and R.J. Nemanich. J. Non-Cryst. Solids 35 & 36, 

1203-1208 (1980). 

29. “Structure and Defects in the Amorphous Si:As:H System,” R.J. Nemanich and J.C. 

Knights. J. Non-Cryst. Solids 35 & 36, 243-248 (1980). 

30. “Raman Scattering from Magnons in Rare Earth Orthoferrites,” R.M. White, R.J. 

Nemanich and C. Tsang. J. Magnetism and Magnetic Mat. 15-18, 773-774 (1980). 

31. “Compositional Anisotropy and Microstructure of a-Si:H,” R.J. Nemanich, D.K. Biegelsen 

and M.P. Rosenblum. Proc. of the 15th International Conference on the Physics of 

Semiconductors, Kyoto, Japan. J Phys. Soc. Japan 49, 1189-1192 (1980). 

32. “Silicide Formation at the Interface of Pd on Amorphous and Crystalline Si,” C.C. Tsai, 

R.J. Nemanich and T.W. Sigmon. Proc. of the 15th International Conference on the Physics 

of Semiconductors, Kyoto, Japan. J. Phys. Soc. Japan 49, 1265-1268 (1980). 

33. “Raman Spectroscopic Evaluation of Silicides Formed with a Scanned Electron Beam,” 

R.J. Nemanich, T.W. Sigmon, N.M. Johnson, M.D. Moyer and S.S. Lau. Laser and 

Electron-Beam Solid Interactions and Materials Processing, edited by J.F. Gibbons, L. 

D.Hess and T.W. Sigmon, (Mat. Res. Soc. Sym. Proc. 1, Boston, MA, 1980) p. 541-546. 

1981 

15

34. “Light Scattering Study of Boron Nitride Microcrystals,” R.J. Nemanich, S.A. Solin and 

R.M. Martin. Phys. Rev. B 23, 6348-6356 (1981). 

35. “Structure and Growth of the Interface of Pd on a-Si:H,” R.J. Nemanich, C.C. Tsai and 

T.W. Sigmon. Phys. Rev. B 23 - Rapid Communications, 6828-6831 (1981). 

36. “Interference Enhanced Raman Scattering Study of the Interfacial Reaction of Pd an a- 

Si:H,” R.J. Nemanich, C.C. Tsai, M.J. Thompson and T.W. Sigmon. J. Vac. Sci. Tech. 19, 

685-688 (1981). 

37. “Silicide Formation in Pd-a-Si:H Schottky Barriers,” M.J. Thompson, N.M. Johnson, R.J. 

Nemanich and C.C. Tsai. Appl. Phys. Lett. 39, (3), 274-276 (1981). 

38. “Effect of Thermal Annealing on the Structural and Electrical Properties of the Pd-a-Si:H 

Interface,” C.C. Tsai, R.J. Nemanich and M.J. Thompson. Xerox, Palo Alto, CA., (1981). 

39. “Structural and Electrical Properties of Noble Metal-Hydrogenated Amorphous Silicon 

Interfaces,” C.C. Tsai, M.J. Thompson and R.J. Nemanich. J. de Phys. (Paris) 42, C4- 

1077-C4-1080 (1981). 

40. “Phonons of the Metal/Amorphous Silicon Interface Studied by Interference Enhanced 

Raman Scattering,” R.J. Nemanich and C.C. Tsai. J. de Phys. (Paris) 42, C6-822-C6-824 

(1981). 

1982 

41. “Light Scattering from Magnetic Excitations in Orthoferrites,” R.M. White, R.J. Nemanich 

and Conyers Herring. Phys. Rev. B 25, 1822-1836 (1982). 

42. “Microstrain in Laser-Crystallized Silicon Islands on Fused Silica,” S.A. Lyon, R.J. 

Nemanich, N.M. Johnson and D.K. Biegelsen. Appl. Phys. Lett. 40, 316-318 (1982). 

43. “Electronic Structure of CePd3 from Resonant Photoemission ad Optical Reflectivity 

Spectra,” J.W. Allen, R.J. Nemanich and S.-J. Oh. J. Appl. Phys. 53, 2145-2148 (1982). 

44. “Correlated Electrical and Microstructural Studies of Recrystallized Silicon Thin Films on 

Bulk Glass Substrates,” D.K. Biegelsen, N.M. Johnson, R.J. Nemanich, M.D. Moyer and 

L.E. Fennell. Laser and Electron-Beam Interaction with Solids, edited by B.R. Appleton, 

G.K. Cellar, (Mater. Res. Soc. Symp. Proc., 4, Boston, MA, p. 331-336 (1982). 

45. “Surface Topography of Laser Annealed Silicon,” D. Haneman and R.J. Nemanich. Sol. 

State Commun. 43, 203-206 (1982). 

46. “Strain of Laser Annealed Silicon Surfaces,” R.J. Nemanich and D. Haneman. Appl. Phys. 

Lett. 40, 785-787 (1982). 

16

47. “Interfacial Reactions Between Au and Hydrogenated Amorphous Si,” C.C. Tsai, R.J. 

Nemanich and M.J. Thompson. J. Vac. Sci. Tech. 21, 632-635 (1982). 

48. “Lattice Dynamics of the Layered Compounds Inl and InBr,” B.P. Clayman, R.J. 

Nemanich, J.C. Mikkelsen, Jr. and G. Lucovsky. Phys. Rev. B26, 2011-2015 (1982). 

1983 

49. “Aligned, Coexisting Liquid and Solid Regions in Pulsed and cw Laser Annealing of Si,” 

R.J. Nemanich, D.K. Biegelsen and W.G. Hawkins. Laser-Solid Interactions and Transient 

Thermal Processing of Materials, edited by J. Narayan, W.L. Brown, R.A. Lemons, (Mat. 

Res. Soc. Symp. Proc., 13, Boston, MA, p. 211. (1983). 

50. “Aligned, Coexisting Liquid and Solid Regions in Laser-Annealed Si,” R.J. Nemanich, 

D.K. Biegelsen and W.G. Hawkins. Phys. Rev. B27, 7817-7819 (1983). 

51. “Optical Absorption Spectra of Surface and Interface States in Hydrogenated Amorphous 

Silicon,” W.B. Jackson, D.K. Biegelsen, R.J. Nemanich and J.C. Knights. Appl. Phys. 

Lett. 42, 105-107 (1983). 

52. “Configurations of a Chemically Ordered Continuous Random Network to Describe the 

Structure of GeSe2 Glass,” R.J. Nemanich, F.L. Galeener, J.C. Mikkelsen, Jr., G.A.N. 

Connell, G. Etherington, A.C. Wright and R.N. Sinclair. Physica 117B & 118B, 959-961 

(1983). 

53. “Raman Scattering from Hydrogenated Amorphous Silicon,” S.A. Lyon and R.J. 

Nemanich. Physica 117B & 118B, 871-873 (1983). 

54. “Metal-Induced Crystallization of Hydrogenated Amorphous Si Films,” C.C. Tsai, R.J. 

Nemanich, M.J. Thompson and B.L. Stafford. Physica 117B & 118B, 953-955 (1983). 

55. “Energy Dependence of the Carrier Mobility-Lifetime Product in Hydrogenated 

Amorphous Silicon,” W.B. Jackson, R.J. Nemanich and N.M. Amer., Phys. Rev B 27, 

4861-4871 (1983). 

56. “Initial Reactions at the Interface of Pt and Amorphous Silicon,” R.J. Nemanich, W.B. 

Jackson, C.C. Tsai and B.L. Stafford. J. Vac. Sci. Tech. B 1, 519-523 (1983). 

57. “Schottky Barrier Amorphous-Crystalline Interface Formation,” M.J. Thompson, R.J. 

Nemanich and C.C. Tsai. Surface Sci. 132, 250-263 (1983). 

58. “Low Frequency Raman Scattering in Chalcogenide Glasses,” R.J. Nemanich. J. Non- 

Cryst. Sol. 59 & 60, 851-854 (1983). 

17

59. “Interface Kinetics at Metal Contacts on a-Si:H,” R.J. Nemanich, M.J. Thompson, W.B. 

Jackson, C.C. Tsai and B.L. Stafford. J. Non-Cryst. Sol. 59 & 60, 513-516 (1983). 

60. “The Absolute Luminescence Quantum Efficiency in Hydrogenated Amorphous Silicon,” 

W.B. Jackson and R.J. Nemanich, J. Non-Cryst Sol. 59 & 60, 353-356 (1983). 

61. “Summary Abstract: Metal amorphous Si interfaces: Structural and electrical properties,” 

C.C. Tsai, M.J. Thompson, R.J. Nemanich, W.B. Jackson, and B.L. Stafford, J. Vac. Sci. 

Technology A 1, 785-786 (1983). 

62. “Solid Silicon at the Melting Temperature is Crystaline,” D.K. Biegelsen, R.J. Nemanich, 

L.E. Fennel and R.A. Street, Energy Beam-Solid Interactions and Transient Thermal 

Processing, edited by John C.C. Fan and Noble M. Johnson, (Mater. Res. Soc. Sym. Proc. 

23, Boston, Massachusetts, p.383-388 (1983). 

63. “Initial Phase Formation at the Interface of Ni, Pd, or Pt on Si,” R.J. Nemanich, C.C. Tsai, 

B.L. Stafford, J.R. Abelson and T.W. Sigmon, Thin Films and Interfaces Ii, edited by 

J.E.E. Baglin, D.R. Campbell and W.K. Chu, (Mater. Res. Soc. Sym. Proc., 25, Boston, 

Massachusetts, p. 9-14 (1983). 

1984 

64. “Raman Scattering from Solid Silicon at the Melting Temperature,” R.J. Nemanich, D.K. 

Biegelsen, R.A. Street and L.E. Fennel, Phys. Rev. B 29 (Rapid Comm.), 6005-6007 

(1984). 

65. “Electron-Spin-Resonance Study of Boron Doped Amorphous Si(x)Ge(1-x):H Alloys,” M. 

Stutzmann, R.J. Nemanich and J. Stuke. Phys. Rev. B 30, 3595-3602 (1984). 

66. “Summary Abstract: Two-stage process for silicide formation at metal-silicon interfaces,” 

R.J. Nemanich, B.L. Stafford, W.B. Jackson, M.J. Thompson, J.R. Abelson and T.W. 

Sigmon, J. Vac. Sci. Technol. B 2, 588, (1984). 

1985 

67. “Thin Film Kinetics and Reactions at Metal-Silicon Interfaces,” R.J. Nemanich, B.L. 

Stafford, J.R. Abelson and T.W. Sigmon, Proc. 17th Int. Conf. on the Phys. of 

Semiconductors, edited by Chadi and Harrison, p. 155-158, (Springer-Verlag, NY, 1985). 

68. “Initial Reactions and Silicide Formation of Titanium on Silicon Studied by Raman 

Spectroscopy,” R.J. Nemanich, R.T. Fulks, B.L. Stafford and H.A. Vander Plas, J. Vac. 

Sci. Tech. A 3, 938-941 (1985). 

69. “Reactions of Thin Film Titanium on Silicon Studied by Raman Spectroscopy,” R.J. 

Nemanich, R.T. Fulks, B.L. Stafford, H.A. Vander Plas, Appl. Phys. Lett. 46, 670-672 

(1985). 

18

70. “Thickness Dependence of the Reactions at the Interface of Pd and Si,” R.J. 

Nemanich and C.M. Doland, J. Vac. Sci. Tech. B3, 1142-1145 (1985). 

71. “In Situ Ellipsometric Studies of Palladium Silicide Formation,” S.M. Kelso, R.J. 

Nemanich and C.M. Doland, Thin Film-Interfaces and Phenomena, edited by R.J. 

Nemanich, P.S. Ho, and S.S. Lau, (Mater. Res. Soc. Symp. Proc., 54, Boston, 


1986 

72. “Initial Nucleation and the Effects on Epitaxial Silicide Formation,” R.J. Nemanich, C.M. 

Doland, R.T. Fulks, and F.A. Ponce, Thin Films-Interfaces and Phenomena, edited by R.J. 

Nemanich, P.S. Ho, and S.S. Lau, (Mater. Res. Soc. Symp. Proc., 54, Boston, 


73. “Raman Spectroscopy for Semiconductor Thin Film Analysis,” R.J. Nemanich, Materials 

Characterization, edited by Nathan W. Cheung and Marc-A. Nicolet, (Mater. Res. Soc. 

Symp. Proc., 69, Palo Alto, CA p. 23-37 (1986). 

74. “Raman Scattering for Semiconductor Interface Analysis,” R.J. Nemanich, SPIE 

Conference, (1986). 

75. “Schottky Barriers on Phosphorus-doped Hydrogenated Amorphous Silicon: The Effects 

of Tunneling,” W.B. Jackson, R.J. Nemanich, M.J. Thompson and B. Wacker, Phys. Rev. 

B 33, 6936-6945 (1986). 

76. “Formation of Epitaxial Silicides: In situ Ellipsometric Studies,” S.M. Kelso, R.J. 

Nemanich, C.M. Doland and F.A. Ponce, Published in Proceedings of 18th International 

Conference Phys. Semiconductors, Stockholm, Sweden, (1986). 

77. “Effect of Ion Implantation on Low-Temperature Formation of Polycrystalline Silicon 

From LPVD Amorphous Silicon,” A. Chiang, G.Y. Wu, F.A. Ponce and R.J. Nemanich, 

Published in Proceedings of International Conference on Semiconductor and IC 

Technology, (1986). 

1987 

78. “Reactive Interface Formation - Pt/Si(111): Nucleation and Morphology,” R.J. Nemanich, 

C.M. Doland, and F.A. Ponce, J. Vac. Sci. Tachnol. B5, 1039-1043 (1987). 

79. “The Initial Stages of Silicide Epitaxy - Nucleation and Morphology,” R.J. Nemanich, 

C.M. Doland, and F.A. Ponce, Initial Stages of Epitaxial Growth, edited by Robert Hull, J. 

Murray Gibson, David A. Smith, (Mater. Res. Soc. Symp. Proc. 94, Anaheim, CA p. 139- 

150 (1987).. 

19

80. “Defects in single-crystal silicon induced by hydrogenation,” N.M. Johnson, F.A. Ponce, 

R.A. Street, and R.J. Nemanich, Physical Review B 35, 4166-4169 (1987). 

1988 

81. “Raman Scattering Characterization of Carbon Bonding in Diamond and Diamond-Like 

Thin Films,” R.J. Nemanich, J.T. Glass, G. Lucovsky, and R.E. Shroder, J. Vac. Sci. 

Technol. A6, 1783-1787 (1988). 

82. “Strain in Graded Thickness GaAs/Si Heteroepitaxial Structures Grown with a Buffer 

Layer,” R.J. Nemanich, D.K. Biegelsen, R.A. Street, B. Downs, B.S. Krusor, and D.R. 

Yingling, Heteroepitaxay on Silicon: Fundamentals, Structure, and Devices, edited by 

H.K. Choi, R. Hull, H. Ishiwara, R.J. Nemanich, (Mater. Res. Soc. Symp. Proc. 116, Reno, 

Nevada, p. 245-250 (1988). 

83. “Precursor Structures in the Formaiton of Diamond Films,” R.J. Nemanich, R.E. Shroder, 

J.T. Glass, and G. Lucovsky, Proc. 19th International Conf. on the Physics of 

Semiconductors, edited by W. Zawadaki, p. 515-518 (1988). 

84. “Raman analysis of the Composite Structures in Diamond Thin Films,” R.E. Shroder, R.J. 

Nemanich, and J.T. Glass, Proc. of SPIE Diamond Optics Symposium, Proc. SPIE 969, 79 

(1988). 

1989 

85. “Raman Scattering Characterization of Titanium Silicide Formation,” R.J. Nemanich, R. 

Fiordalice, and H. Jeon, IEEE Journal of Quantum Electronics 25, 997-1002 (invited 

contribution) (1989). 

86. “Heteroepitaxial Growth and Characterization of GaAs on Silicon-on Sapphire and 

Sapphire Substrates,” T.P. Humphreys, C.J. Miner, J.B. Posthill, K.Das, M.K. 

Summerville, R.J. Nemanich, C.A. Sukow, and N.R. Parikh, Appl. Phys. Lett. 54, 1687- 

1689 (1989). 

87. “Molecular Beam Epitaxial Growth and Characterization of GaAs on Sapphire and Siliconon-Sapphire 

Substrates,” T.P. Humphreys, N.R. Parikh, K. Das, J.B. Posthill, R.J. 

Nemanich, M.K. Summerville, C.A. Sukow and C.J. Miner, Advances in Materials, 

Precessing and Devices in III-V Compound Semiconductors, edited by Devendra K. 

Sadana, Lester E. Eastman and Russell Dupuis. (Mater. Res. Soc. Symp. Proc., 144, 

Boston, Massachusetts, p. 195-201 (1989). 

88. “Growth and Characterization of Heteroepitaxial GaAs on Semiconductor-on-Insulator and 

Insulating Substrates, III-V Heterostructures for Electronic/Photonic Devices,” T.P. 

Humphreys, K. Das, N.R. Parikh, J.B. Posthill, R.J. Nemanich, C.J. Miner, M.K. 

Summerville, P.L. Ross, and R.J. Markunas, III-V Heterostructures for 

20

Electronic/Photonic Devices, edited by C.W. Tu, V.D. Mattera, A.C. Gossard. (Mater. 

Res. Soc. Symp. Proc., 145, San Diego, California, p. 297-304 (1989). 

89. “Raman Scattering Characterization of Strain in GaAs Heteroepitaxial Films Grown on 

Sapphire and Silicon-on-Sapphire,” T.P. Humphreys, C.A. Sukow, R.J. Nemanich, A. 

Majeed, N.R. Parikh, K. Das, and J.B. Posthill, Jpn. J. Appl. Physics (Part 2) 28, 1595- 

1598 (1989). 

90. “Interface-Enhanced Raman Scattering from Thin Films and Interfaces,” R.J. Nemanich, 

Microbeam Analysis, p. 141-146, (1989). 

91. “Raman Characterization of Strain in GaAs Epitaxial Films Grown on Sapphire and 

Silicon-on-Sapphire Substrates,” T.P. Humphreys, K. Das, C.A. Sukow, N.R. Parikh, R.J. 

Nemanich, and J.B. Posthill, Microbeam Analysis 171-172 (1989). 

92. “Boron doping of Diamond thin films,” J. Mort, D. Kuhman, M. Machonkin, M. Morgan, 

F. Jansen, K. Okumura, Y.M. LeGrice, R.J. Nemanich. Appl. Phys. Lett. 55, 1121-1123 

(1989). 

93. “Raman Scattering From Microcrystalline Si Films: Considerations of Composite 

Structures with Different Optical Absorption Properties,” R.J. Nemanich, E.C. Buehler, 

Y.M. LeGrice, R.E. Shroder, G.N. Parsons, C. Wang, G. Lucovsky, and J.B. Boyce, J. 

Non-Crystalline Solids 114, 813-885, (1989). 

94. “Free Carrier Absorption and the Transient Optical Properties of Amorphous Silicon Thin 

Films: A model Including Time Dependent Free Carrier, and Static and Dispersive 

Interband Contributions to the Complex Dielectric Constant,” B.N. Davidson, G.Locovsky, 

G.N. Parsons, R.J. Nemanich, A. Esser, K. Seibert, and H. Kurz, Proc. of the 13th 

International Conference on Amorphous and Liquid Semiconductors, Asheville, NC, and 

Journal of Non-Crystalline Solids 114, 579-581, (1989). 

95. “Ultrafast Recombination and Trapping in Amorphous Silicon,” A. Esser, K. Seibert, H. 

Kurz, G.N. Parsons, C. Wang, B.N. Davidson, G. Lucovsky, and R.J. Nemanich, Proc. of 

the 13th International Conference on Amorphous and Liquid Semiconductors, Asheville, 

NC, and Journal of Non-Crystalline Solids 114, 573-575, (1989). 

96. “Luminescence Above the Tauc Gap in a-Si:H,” P.M. Fauchet, I.H. Cambell, S.A. Lyon, 

and R.J. Nemanich, Proc. of the 13th International Conference on Amorphous and Liquid 

Semiconductors, Asheville, NC, and Journal of Non-Crystalline Solids 114, 277-279, 

(1989). 

97. “Assessment of GaAs Heteroepitaxial films grown on silicon-on sapphire upgraded by 

double solid-phase epitaxy,” J.B. Posthill, R.J. Markunas, T.P. Humphreys, R.J. Nemanich, 

K. Das, W.R. Parikh, P.L. Ross, and C.J. Miner, Appl. Phys. Lett. 55, 1756-1758 (1989). 

21

98. “Microstructural Defects and their Elimination in Heteroepitaxial GaAs on Silicon-on- 

Sapphire and Sapphire Substrates,” J.B. Posthill, N.R. Parikh, K. Das, T.P. Humphreys, 

R.J. Nemanich, and R.J. Markunas, Proc. 47th Annual Meeting of the Electron 

Microscopy Society of America, edited by G.W. Bailey, 588-589 (1989). 

99. “Low Pressure Deposition of Polycrystalline Diamond films using 1% CH4 in H2 rf 

Discharges,” R.A. Rudder, G.C. Hudson, M.J. Mantini, J.B. Posthill, R.C. Hendry, R.J. 

Markunas, Y.M. LeGrice, And R.J. Nemanich, Technology Update on Diamond Films, 

extended absract - 19, edited by R.P.H. Chang, D. Nelson, And A. Hiraki, (Mater. Res. 

Soc. Proc., p. 89 (1989). 

1990 

100. “Ultrafast recombinaton and trapping in amorphous Silicon,” A. Esser, K. Seibert, H. Kurz, 

G.N. Parsons, C. Wang, B. Davidson, G. Lucovsky, and R.J. Nemanich, Phys. Rev. B 41, 

2879-2884, (1990). 

101. “Surface Morphology of TiSi2 on Si, “ H. Jeon, and R.J. Nemanich, Proceedings of the 

3rd Int. Symposium on Si MBE and Thin Solid Films 184, 357-363, E. Kasper and E.H.C. 

Parker, editors, (1990). 

102. “Photoluminescence above the Tauc gap in a-Si:H,” I.H. Campbell, P.M. Fauchet, S.A. 

Lyon, and R.J. Nemanich, Phys. Rev. B 41, 9871-9879, (1990). 

103. “Analysis of the Composite Structures in Diamond Thin Films using Raman 

Spectroscopy,” R.E. Shroder, R.J. Nemanich, and J.T. Glass, Phys. Rev. B 41, 3738-3745, 

(1990). 

104. “X-Ray Absorption Studies of Titanium Silicide Formation at the Interface of Ti Deposited 

on Si,” D. Aldrich, Q. Islam, H. Jeon, R. Nemanich, and D.E. Sayers, Atomic Scale 

Structure of Interfaces, edited by R.D. Bringans, R.M. Feenstra, J.M. Gibson. (Mater. 

Res. Soc. Symp. Proc., 159, Boston, Massachusetts, p. 167 (1990). 

105. “Surface Morphologies and Interfaces of TiSi2 Formed From UHV Deposited Ti on Si,” 

H. Jeon, R.J. Nemanich, J.W. Honeycutt, and G.A. Rozgonyi, Layered Structures: 

Heterepitaxy, Superlattices, Strain, and Metastability, edited by B.W. Dodson, L.J. 

Schowalter, J.E. Cunningham, F.H. Pollak, (Mater. Res. Soc. Symp. Proc., 160, Boston, 

MA, p. 307-312 (1990). 

106. “Domain Size Determination in Diamond Thin Films,” Y.M. LeGrice, R.J. Nemanich, J.T. 

Glass, Y.H. Lee, R.A. Rudder, and R.J. Markunas, Diamond, Silicon carbide and Related 

Wide Bandgap Semiconductors, edited by J.T. Glass, R. Messier, N. Fujimori, (Mater. 

Res. Soc. Symp. Proc., 162, Boston, MA, p. 219-224 (1990). 

107. “Infared Characterization of the Hydrogen Environments in Diamond Thin Films,” Y.M. 

LeGrice, E.C. Buehler, R.J. Nemanich, J.T. Glass, K. Kabashi, F. Jansen, M.A. Machonkin 

22

and C.C. Tsai, Diamond, Silicon Carbide and Related Wide Bandgap Semiconductors, 

edited by J.T. Glass, R. Meisser, N. Fujimori, (Mater. Res. Soc. Symp. Proc., 162, Boston, 

MA, p. 267-272 (1990). 

108 “Microstructural and Optical Characterization of GaN Films Grown by PECVD on (0001) 

Sapphire Substrates,” T.P. Humphreys, C.A. Sukow, R.J. Nemanich, J.B. Posthill, R.A. 

Rudder, S.V. Hattangady, and R.J. Markunas, Diamond, Silicon Carbide and Related Wide 

Bandgap Semiconductors, edited by J.T. Glass, R. Messier, N. Fujimori, (Mater. Res. Soc. 

Symp. Proc., 162, Boston, Massachusetts, p. 531-536 (1990). 

109. “Characterization of the H Environments in Diamond Films by IR Spectroscopy,” Y.M. 

LeGrice, E. Buehler, R.J. Nemanich, J.T. Glass, F. Jansen, M.A. Machonkin, K. Kobashi, 

and C.C. Tsai, Diamond, Silicon Carbide and Related Wide Bandgap Semiconductors, 

edited by J.T. Glass, R. Messier, N. Fujimori, (Mater. Res. Soc. Symp. Proc., 162, Boston, 

Massachusetts, p. 267 (1990). 

110 . “Formation of Microcrystalline Silicon Films by RMS Process,” C. Wang, G.N. Parsons, 

E.C. Buehler, R.J. Nemanich, and G. Lucovsky, Materials Issues in Microcrystalline 

Semiconductors, edited by Phillippe M. Fauchet, Kazunobu Tanaka, and Chaung Chaung 

Tsai, (Mater. Res. Soc. Symp. Proc., 164, Boston, Massachusetts, p. 21-32 (1990). 

111. “Raman Scattering from Microcrystalline Si Films: Considerations of Composite 

Structures with Different Optical Absorption Properties,” R.J. Nemanich, E.C. Buehler, 

Y.M. LeGrice, R.E. Shroder, G.N. Parsons, C. Wang, G. Lucovsky, and J.B. Boyce, 

Materials Issues In Microcrystalline Semiconductors, (Mater. Res. Soc. Symp. Proc., 164, 

Boston, Massachusetts, p.265-270 (1990). 

112. “Phase formation during reactive molybdenum-silicide formation,” C.M. Doland and R.J. 

Nemanich. J. Mat. Res. 5, 2854-2864, (1990). 

113. “Characterization of Growth Processes of Diamond Thin Films by Raman Spectroscopy,” 

R.J. Nemanich, R.E. Shroder, and J.T. Glass, Nineteenth Biennial Conference on Carbon, 

extended abstract. (1990). 

114. “Interface Morphology, Nucleation and Island Formation of TiSi2 on Si(111),” H. Jeon, 

C.A. Sukow, J.W. Honeyctt, T.P. Humphreys, R.J. Nemanich, and G.A. Rozgonyi, 

Advanced Metalizations in Microelectrics, edited by A. Katz, S.P. Muraka, A. Appelbaum, 

(Mater. Res. Soc. Symp. Proc., 181, San Fransisco, CA, p. 559-564 (1990). 

115. “µc-Silicon Thin Films Deposited by Remote Plasma Enhanced Chemical Vapor 

Deposition Process,” C. Wang, G.N. Parsons, S.S. Kim, E.C. Buehler, R.J. Nemanich and 

G. Lucovsky, Amorphous Silicon Technology, edited by P.C. Taylor, M.J. Thompson, P. G. 

LeComber, Y. Hamakawa and Arun Madan, (Mater. Res. Soc. Symp. Proc., 192, San 

Fransisco, CA, p. 535 (1990). 

23

116. “Epitaxial Growth and Stability of C49 TiSi2 on Si (111),” H. Jeon, J.W. Honeycutt, C.A. 

Sukow, T.P. Humphreys, R.J. Nemanich, and G.A. Rozgonyi, Epitaxial Heterstructures, 

edited by D.W. Shaw, J.C. Bean, V.G. Keramidas, P.S. Peercy, (Mater. Res. Soc. Symp. 

Proc., 198, San Fransisco, CA, p. 595-600 (1990). 

117. “Heteroepitaxial CxSi1-x Metastable Alloys,” J.B. Posthill, R.A. Rudder, S.V. Hattangady, 

G.G. Fountain, T.P. Humphreys, R.J. Nemanich, N.R. Parikh, and R.J. Markunas, Epitaxial 

Heterostructures, edited by Don W. Shaw, John C. Bean, Vassilis G. Keramidas, and Paul 

S. Peercy, (Mater. Res. Soc. Symp. Proc., 198, San Fransisco, CA, p. 497-502 (1990). 

118. “Assesment of SixGe1-x Epitaxial Alloys Grown on Silicon at 350 degrees Celcius,” J.B. 

Posthill, D.P. Malta, S.V. Hattangady, N.R. Parikh, T.P. Humphreys, R.A. Rudder, G.G. 

Fountain, R.J. Nemanich, and R.J. Markunas. Proceedings of the XIIth International 

Congress for Electron Microscopy, Eds. L.D. Peachy and D.B. Williams, 4:646, (1990). 

119. “Photoluminescence Spectroscopy Measurement of Elastic Strain in Heteroepitaxial GaAs 

Films,” T.P. Humphreys, R.J. Nemanich, K. Das, N.R. Parikh, and J.B. Posthill, Electronic 

Letters 26, 835-837, (1990). 

120. “Electrical Properties of B Doped CVD Grown Polycrystalline Diamond Films,” K. 

Nishimura, K. Das, J.T. Glass, K. Kobashi and R.J. Nemanich in The Physics and 

Chemistry of Carbides; Nitrides and Borides, 183-194, (1990). 

121. “Titanium Silicide: Epitaxy, Morphology and Structure,” R.J. Nemanich, H. Jeon, J.W. 

Honeycutt, C.A. Sukow, and G.A. Rozgonyi. MCNC Microelectronics Technical Bulletin, 

2:6-9 (1990). 

122. “Vapor deposition of diamond thin films on various substrates,” Y.H. Lee, K.J. Bachmann, 

J.T. Glass, Y.M. LeGrice, and R.J. Nemanich. Appl. Phys. Lett. 57, 1916-1918, (1990). 

123. “Process and Surface Characterization of Hydrogen Plasma Cleaning of Si(100),” T.P. 

Schneider, J. Cho, J. van der Weide, S.E. Wells, G. Lucovsky, R.J. Nemanich, M.J. 

Mantini, R.A. Rudder, and R.J. Markunas, Chemical Perspectives of Microelectric 

Materials II, edited by I.V. Interrante, K.F. Jenson, L.H. Duboise, M.E. Gross, (Mater. 

Res. Soc. Symp. Proc., 204, Boston, Massachusetts, p. 333 (1990). 

1991 

124. “Electronic Structure, Surface Morphology and Epitaxy of Remote H-Plasma Cleaned 

Si(100),” T.P. Schneider, J. Cho, D.A. Aldrich, Y.L. Chen, D. Maher and R.J. Nemanich, 

Proceedings of the Second International Symposium on Cleaning Technology in 

Semiconductor Device Manufacturing of the Electrochemical Society, Eds. Jerzy Ruzyllo 

and Richard E. Novak, Vol. 92-12, pp 123-127, (1991). 

24

125. “Acetylene Production in a Diamond-Producing Low Pressure rf-Plasma Assisted 

Chemical Vapor Deposition Environment,” R.A. Rudder, G.C. Hudson, J.B. Posthill, R.E. 

Thomas, R.J. Markunas, R.J. Nemanich, Y.M. LeGrice, and T.P. Humphreys. Proceedings 

of the 2nd International Symposium on Diamond Materials, (The Electrochemical Society), 

Vol. 91-8 p. 209 (1991). 

126. “Substrate Effects and the Growth of Homoepitaxial Diamond (100) Layers Using Low 

Pressure rf Plasma-Enhanced Chemical Vapor Deposition,” J.B. Posthill, R.E. Thomas, 

R.J. Markunas, R.J. Nemanich, and D. Black. Proceedings of the 2nd International 

Symposium on Diamond Materials, (The Electrochemical Society), Vol. 91-8 p. 247 

(1991). 

127. “IGFET Fabrication on Homoepitaxial Diamond using insitu Boron at Lithium Doping,” 

Proceedings of the International Symposium on Diamond Materials, G.G. Fountain, S.V. 

Hattangady, J.B. Posthill, R.G. Alley, R.A. Rudder, G.C. Hudson, D.P. Malta, R.E. 

Thomas, R.J. Markumas, T.P. Humphreys, R.J. Nemanich, V. Venkatesau and K. Das. 

(The Electochemical Society) Vol. 91-8, p. 523-529, (1991). 

128. “Observation of Lateral Growth Between Diamond Domains by Scanning Tunneling 

Microscopy,” K.F. Turner, B.R. Stoner, L. Bergman, J.T. Glass, and R.J. Nemanich. 

Proceedings of the Second International Conference on New Diamond Science and 

Technology, edited by R. Meisser, J.T. Glass, J.E. Butler, and R. Roy, (MRS International 

Conference Proceedings Series, Washington, DC p. 607-612 (1991). 

129. “Scanning Tunneling Microscopy and Spectroscopy of PN Junctions Formed by Ion 

Implantation,” J.V. LaBrasca, R.C. Chapman, G.E. McGuire, and R.J. Nemanich. J. Vac. 

Sci. Technol. B 9, 752-757, (1991). 

130. “Deposition of µc-Si and µc-SiC Thin Films by Remote Plasma-Enhanced Chemical Vapor 

Deposition,” G. Lucovsky, C. Wang, R.J. Nemanich, and M.J. Williams, Solar Cells 30, 

419 (1991). 

131. “Surface Topography and Nucleation of Chemical Vapor Deposition Diamond Films on 

Silicon by Scanning Tunneling Microscopy,” K.F. Turner, Y.M. LeGrice, B.R. Stoner, J.T. 

Glass, and R.J. Nemanich, J. Vac. Sci. Technol. B 9, 914-919, (1991). 

132. “Raman Characterizaton of Diamond Film Growth,” R.J. Nemanich, L. Bergman, Y.M. 

LeGrice, and R.E. Shroder. Proceedings of the Second International Conference on New 

Diamond Science and Technology, edited by R. Meisser, J. E. Butler, R. Roy, and J.T. 

Glass, (MRS International Conference Proceedings Series, Washington, DC, p. 741 (1991). 

133. “Selected-Area Homoepitaxial Growth and Overgrowth on Si Patterned Diamond 

Substrates,” R.A. Rudder, J.B. Posthill, G.C. Hudson, D. Malta, R.E. Thomas, R.J. 

Markunas, T.P. Humphreys, and R.J. Nemanich. Proceedings of the Second International 

Conference on New Diamond Science and Technology, edited by R. Messier, J.T. Glass, 

25

J.E. Butler, and R. Roy, (MRS International Conference Proceedings Series, Washington, 

DC, p. 425 (1991). 

134. “Growth and Characterization of Heteroepitaxial Nickel Films on Diamond Substrates,” 

T.P. Humphreys, H. Jeon, R.J. Namanich, J.B. Posthill, R.A. Rudder, D.P. Malta, G.C. 

Hudson, R.J. Markunas, J.D. Hunn, and N.R. Parikh, Evolution of Thin Film and Surface 

Microstructure, edited by C.V. Thompson, J.Y. Tsao, and D.J. Srolovitz, (Mater. Res. Soc. 

Symp. Proc, 202, Boston, Massachusetts, p. 463 (1991). 

135. “Si(100) Surface Preparation by In-Situ or In-Vacuo Exposure to Remotely Plasma- 

Generated Atomic Hydrogen: Applications to Deposited SiO2 and Epitaxial Growth of Si,” 

T. Yasuda, Y. Ma, S. Habermehl, S.S. Kim, G. Lucovsky, T.P. Schneider, J. Cho, and R.J. 

Nemanich, Evolution of Thin Film and Surface Microstructure, edited by C.V. Thompson, 

J.Y. Tsao, D.J. Srolovitz, (Mater. Res. Soc. Symp. Proc., 202, Boston, Massachusetts, p. 

395 (1991). 

136. “Thickness Dependence of Epitaxial TiSi2 on Si (111),” H. Jeon, J.W. Honeycutt, C.A. 

Sukow, G.A. Rozgonyi, and R.J. Nemanich, Evolution of the Thin FIlm and Surface 

Microstructure, edited by C.V. Thompson, J.Y. Tsao, D.J. Srolovitz, (Mater. Res. Soc. 

Symp. Proc., 202, Boston, Massachusetts, p. 637 (1991). 

137. “Microstructures and Domain Size Effects in Diamond Films Characterized by Raman 

Spectroscopy,” R.J. Nemanich, L. Bergman, Y.M. LeGrice, K.F. Turner, and T.P. 

Humphreys. SPIE Proceedings, Applied Spectroscopy Materials Science Conference, 

1437:2 edited by D. Saperstein, (1991). 

138. “Interface Reactions of Titanium on Single Crystal and Thin Film Diamond Analyzed by 

Ultraviolet Photoemission Spectroscopy,” J. van der Weide and R.J. Nemanich. 

Applications of Diamond Films and Related Materials, 73:359-364 edited by Y. Tzeng, M. 

Yoshikawa, M. Murakawa, and A. Feldman, (1991). 

139. “High-Temperatue Rectifying Contacts using Heteroepitaxial Nickel Films in 

Semiconducting Diamond,” T.P. Humphreys, J.V. LaBrasca, R.J. Nemanich, K. Das, and 

J.B. Posthill. Japanese J. Appl. Phys. 30, L1409-L1411 (1991). 

140. “Surface Electronic States of Low Temperature H-Plasma Cleaned Si(100),” J. Cho, T.P. 

Schneider, J. van der Weide, H. Jeon, and R.J. Nemanich, Appl. Phys. Lett. 59, 1995- 

1997, (1991). 

141. “Characterization of Titanium Silicide Contacts Deposited on Semiconducting Diamond 

Substrates,” T.P. Humphreys, H. Jeon, J.V. LaBrasca, K.F. Turner, R.J. Nemanich, K. Das, 

and J.B. Posthill, Applications of Diamond Films and Related Materials, 73:353-358, 

edited by Y. Tzeng, M. Yohshikawa, M. Murakawa, and A Feldman, (1991). 

142. “Deposition of Amorphous and Microcrystalline SiC Alloy thin Films by Remote Plasma- 

Enhanced Chemical-Vapor Deposition Process,” C. Wang, G. Locovsky, and R.J. 

26

Nemanich, Amorphous Silicon Technology, edited by A. Madan, Y. Hamakawa, M. 

Thompson, P.C. Taylor, P.G. LeComber, (Mater. Res. Soc. Symp. Proc., 219, Anaheim, 

Califonia, p. 751 (1991), 

143. “Low Temperature Hydrogen Plasma Cleaning Processes of Si(100), Ge(100), and SixGe1-x 

(100),” T.P. Schneider, D.A. Aldrich, J. Cho, and R.J. Nemanich. Silicon Molecular Beam 

Epitaxy, edited by John C. Bean, Subramanian S. Iyer, Kang I. Wang, (Mater. Res. Soc. 

Symp. Proc. 220, Anaheim, CA, p. 21-26 (1991). 

144. “Heteroepitaxial Growth and Characterizaiton of Titanium Films on Alpha (6H) Silicon 

Carbide,” L.M. Spellman, R.C. Glass, R.F. Davis, T.P. Humphreys, H. Jeon, R.J. 

Nemanich, S. Chevacharoenkul, and N.R. Parikh, Heteroepitaxy of Dissimilar Materials, 

edited by R.F.C. Farrow, J.P. Harbison, P.S. Peercy, A. Zangwill, (Mater. Res. Soc. Symp. 

Proc., 221, Anaheim, CA, p. 99-104 (1991). 

145. “Investigation of Titanium Germanide Formation by Raman Scattering and X-Ray 

Absorption Spectroscopy,” D.B Aldrich, C.L. Jahncke, R.J. Nemanich, and D.E. Sayers, 

Heteroepitaxy of Dissimilar Materials, edited by R.F.C. Farrow, J.P. Harbison, P.S. Peercy 

and A. Zangwill. (Mater. Res. Soc. Symp. Proc., 221, Anaheim, CA, p. 343-348 (1991). 

146. “Titanium Silicide Contacts on Semiconducting Diamond Substrates,” T.P. Humphreys, 

J.V. LaBrasca, and R.J. Nemanich. Electronics Letters 27, 1515-1516, (1991). 

147. “Transmission Electron Microscopy and Vibrational Spectroscopy Studies of Undoped and 

Doped Si,H and Si,C:H Films,” Y.L. Chen, C. Wang, G. Lucovsky, D.M. Maher and R.J. 

Nemanich. J. Vac. Sci. Technol. A 10, (4), 1847-880, (1991). 

148. “Observation of surface modification and nucleation during deposition of diamond on 

silicon by scanning tunneling microscopy,” K.F. Turner, B.R. Stoner, L. Bergman, J.T. 

Glass, and R.J. Nemanich, Journal of Applied Physics 69, 6400-6405 (1991). 

1992 

149. “Chemical Vapor Deposition of Diamond Films from Water Vapor RF-Plasma 

Discharges,” R.A. Rudder, G.C. Hudson, J.B. Posthill, R.E. Thomas, D. Malta, R.J. 

Markunas, T.P. Humphreys, and R.J. Nemanich. Appl. Phys. Lett. 60, (3), 329-331 (1992). 

150. “Effects of Boron Doping on the Surface morphology and Structural Imperfections of 

Diamond Films,” X.H. Wang, G.H.M. Ma, W. Zhu, J.T. Glass, L. Bergman, K.F. Turner, 

and R.J. Nemanich. Diamond and Related Materials 828, (1992). 

151. “Electrical Characterization of Epitaxial Titanium Contacts to Alpha (6H) Silicon 

Carbide,” L.M. Spellman, R.C. Glass, R.F. Davis, T.P. Humphreys, R.J. Nemanich, K. 

27

Das, and S. Chevacharoenkul. Proceedings of ICACSC '91, Amorphous and Crystalline 

Silicon Carbide IV - Recent Developments, edited by: C.Y. Young, M.M. Rahman, and 

G.L. Harris, Springer Proc. in Physics, Vol. 71, 417-422 (1992). 

152. “Growth and Characterization of Titanium Silicide Films on Natural Diamond C(001) 

Substrates,” T.P. Humphreys, J.V. LaBrasca, K.F. Turner, R.J. Nemanich, K. Das, J.B. 

Posthill, J.D. Hunn, and N.R. Parikh, Japanese J. Appl. Phys. 31, 2369-2373 (Part 1) 

(1992). 

153. “Morphology and Phase Stability of TiSi2 on Si,” H. Jeon, C. A. Sukow, J. W. Honeycutt, 

G. A. Rozgonyi and R. J. Nemanich, Journal of Applied Physics 71, 4269-4276 (1992). 

154. “Schottky Barrier Height and Negative Electron Affinity of Titanium on (111) Diamond,” 

R. J. Nemanich and J. van der Weide, J. Vac. Sci. Technol. B 10, 1940-1943, (1992). 

155. “Plasma-Surface Interaction Limits for Remote H-Plasma Cleaning of Si(100),” T. P. 

Schneider, B. L. Bernhard, Y. L. Chen and R. J. Nemanich, Chemical Surface Preparation, 

Passivation and Cleaning for Semiconductor Growth and Processing, edited by R. J. 

Nemanich, C. R. Helms, M. Hirose, G. W. Rubloff, (Mater. Res. Soc. Symp. Proc. 259, 

213-218 (1992). 

156. “Surface Electronic States of Low Temperature H-Plasma Cleaned Si(100) and Ge(100) 

Surfaces,” J. Cho, T. P. Schneider and R. J. Nemanich, Chemical Surface Preparation, 

Passivation and Cleaning for Semiconductor Growth and Processing, edited by R. J. 

Nemanich, C. R. Helms, M. Hirose, G. W. Rubloff (Mater. Res. Soc. Symp. Proc. 259, 

237-242 (1992). 

157. “Influence of Surface Pre-Cleaning on Electrical Properties of Rapid Thermal Oxide and 

Rapid Thermal Chemical Vapor Deposition Oxide,” X. Xu, R. T. Kuehn, J. M. Melzak, G. 

A. Hames, J. J. Wortman, M. C. Ozturk, R. J. Nemanich, G. Harris and D. Maher, 

Chemical Surface Preparation, Passivation and Cleaning for Semiconductor Growth and 

Processing, edited by R. J. Nemanich, C. R. Helms, M. Hirose, G. W. Rubloff (Mater. Res. 

Soc. Symp. Proc. 259, p. 81-86 (1992). 

158. “Nucleation and Morphology of TiSi2 on Si,” R. J. Nemanich, H. Jeon, C. A. Sukow, J. W. 

Honeycutt and G. A. Rozgonyi. Advanced Metallization and Processing for 

Semiconductor Devices and Circuits II, edited by A. Katz, S. P. Muraka, Y. J. Nissim, J. 

M. E. Harper, (Mater. Res. Soc. Symp. Proc., 260, San Francisco, CA p.195-206 (1992). 

159. “Comparison of the Interface and Surface Morphologies of Zirconium and Titanium 

Silicides on Silicon,” C. A. Sukow and R. J. Nemanich. Advanced Metallization and 

Processing for Semiconductor Devices and Circuits II, edited by A. Katz, S. P. Muraka, Y. 

J. Nissim, J. M. E. Harper, (Mater. Res. Soc. Symp. Proc., 260: pp 251-256 (1992). 

160. “Surface Electronic States of Low Temperature H-Plasma Exposed Ge(100),” J. Cho and 

R. J. Nemanich. Physical Review B46, 12421-12426 (1992). 

28

161. “Electrical Conductivity and Photoluminescence of Diamond Films Grown by Downstream 

Microwave Plasma CVD,” B. R. Stoner, J. T. Glass, L. Bergman, R. J. Nemanich, L. D. 

Zolton and J. W. Vandersande, Journal of Electronic Materials 21, 629-634, (1992). 

162. “Interface Structure of Epitaxial TiSi2 on Si(111),” R. J. Nemanich, H. Jeon, J. W. 

Honeycutt, C. A. Sukow and G. A. Rozgonyi. Proc. of the 50th Ann. Meeting of the 

Electron Microscopy Society of America, Electron Microscopy, (Part 2), 1354-1355, 

(1992). 

163. “Surface Electronic States and Stability of the H-terminated Si(100) 1x1 Surface Produced 

by Low temperature H-Plasma Exposure,” J. Cho and R. J. Nemanich. Physical Review 

B46, 15212-15217 (1992). 

1993 

164. “Properties of Interfaces of Diamond,” R. J. Nemanich, L. Bergman, K. F. Turner, J. van 

der Weide and T. P. Humphreys. Trieste Semiconductor Symposium on Wide-Band-Gap 

Semiconductors, Physica B 185, 528-538 (1993). 

165. “EXAFS Study of the Initial Interface Region Formed by Thin Zirconium Films and 

Titanium Films on Silcon (111),” A. M. Edwards, Y. Dao, R. J. Nemanich and D. E. 

Sayers. Jpn. J. Appl. Phys. 32, Suppl. 32-2, pp 393-395 (1993). 

166. “X-Ray Absorption Study of the Local Structure of Zr Thin Films on Silicon (111),” Y. 

Dao, A. M. Edwards, R. J. Nemanich and D. E. Sayers. Jpn. J. Appl. Phys. 32, Suppl. 32-2, 

pp 396-398 (1993). 

167. “XAFS Study of Some Titanium Silicon and Germanium Compounds,” D. B. Aldrich, R. J. 

Nemanich, and D. E. Sayers. Jpn. J. of Appl. Phys. Proceedings from 7th International 

Conference on X-ray Absorption Fine Structure 32, Suppl. 32-2, pp 725-727 (1993). 

168. “Micro-Photoluminescence and Raman Scattering Study of Defect Formation in Diamond 

Films,” L. Bergman, B. R. Stoner, K. F. Turner, J. T. Glass and R. J. Nemanich, J. Appl. 

Phys. 73, 3951-3957 (1993). 

169. “Effect of surface hydrogen on metal-diamond interface properties,” T. Tachibana, J. T. 

Glass and R. J. Nemanich, J. Appl. Phys. 73, 834-842, (1993). 

170. “Argon and Hydrogen Plasma Interactions on Diamond (111) Surfaces; Electronic States 

and Structure,” J. van der Weide and R. J. Nemanich, Appl. Phys. Lett. 62, 1878-1880 

(1993). 

171. “Investigation of Titanium Silicon and Germanium Reaction,” D. B. Aldrich, D. E. Sayers 

and R. J. Nemanich, Evolution of Surface and Thin Film Microstructure, edited by Harry 

29

A. Atwater, Eric Chason, Marcia H. Grabow. (Mater. Res. Soc. Symp. Proc. 280, Boston, 


172. “Surface and Interface Morphology of Small Islands of Titanium and Zirconium Silicides 

on Silicon,” B. L. Kropman, C. A. Sukow and R. J. Nemanich, Evolution of Surface and 

Thin Film Microstructure, edited by Harry A. Atwater, Eric Chason, Marcia H. Grabow. 

(Mater. Res. Soc.Symp. Proc. 280, Boston, Massachusetts, 589-592 (1993). 

173. “Influence of Dry and Wet Cleaning on the Properties of Rapid Thermal Grown and 

Depostied Gate Dielectrics,” Xiaoli Xu, Richard T. Kuehn, Mehmet C.Öztürk, and Jimmie 

J. Wortman, Robert J. Nemanich, Gari S. Harris and Dennis M. Maher, Journal of 

Electronic Materials 22, (3), 335-339, (1993). 

174. “Plasma Surface Interactions and Surface Properties for Remote H-Plasma Cleaning of 

Si(100), T. P. Schneider, J. Cho, Y. L. Chen, D. M. Maher and R. J. Nemanich, Surface 

Chemical Cleaning and Passivation for Semiconductor Processing, edited by G. S. 

Higashi, E. A. Irene, T. Ohmi (Mater. Res. Soc. Symp. Proc. 315, San Francisco, CA, p. 

197-209 (1993). 

175. “A Study of Surface and Subsurface Properties of Si(100) After Hydrogen Ion-Beam 

Exposure,” H. Liu, T. Schneider, Y. L. Chen , A. Buczkokwski, D. Korzec, J. Engeman, D. 

M. Maher and R. J. Nemanich, Surface Chemical Cleaning and Passivation for 

Semiconductor Processing, edited by G. S. Higashi, E. A. Irene, T. Ohmi (Mater. Res. Soc. 

Symp. Proc. 315, San Francisco, CA, p. 231-236 (1993). 

176. “Phase Transition and Formation of TiSi2 Codeposited on Atomically Clean Si(111),” 

Hyeongtag Jeon, Y. S. Cho, E. Y. Kang, J. W. Park, and R. J. Nemanich, Phase 

Transformations in thin Films: Thermodynamics and Kinetics. edited by M. Atzmon, A. L. 

Greer, J. M. E. Harper, M. R. Libera, (Mater. Res. Soc. Symp. Proc 311, p. 275 (1993). 

177. “Effect of surface hydrogen on metal-diamond interfaces properties,” T. Tachibana, J. T. 

Glass, and R. J. Nemanich, J. Appl. Phys. 73, 835-842, (1993). 

178. “Photophoretic Deflection of Particles in Subatmospheric Pressure Chambers,” Ravindran 

Periasamy, Julian Selvaraj, Robert P. Donovan and Robert J. Nemanich (extended 

abstract).TECHCON '93, Atlanta, GA, September 28-30, 1993. 

179. “Effects of Hydrogen Plasma Cleaning Prior to Low Temperature Gate Oxide Deposition,” 

J S. Montgomery, R. J. Nemanich, J. Barnak, A. Bayoumi, C. Silvestre, and J. R. Hauser, 

(poster). TECHCON '93, Atlanta, GA, September 28-30, 1993. 

180. “Heteroepitaxial Nucleation and Growth of Highly Oriented Diamond Films on Silicon Via 

In-Situ Carburization and Bias-Enhanced Nucleation,” Brian R. Stoner, Scott R. Sahaida, 

Dean M. Malta, Andy Sowers, and Robert J. Nemanich, 2nd International Conference on 

the Applications of Diamond Films and Related Materials, Editors: M. Murakawa, Y. 

Tzeng and W. A. Yarborough, Tokyo, Japan, pp. 825-830 (1993). 

30

181. “Titanium Germanosilicide: Phase Formation, Segregation, and Morphology,” D.B. 

Aldrich, Y.L. Chen, D.E. Sayers, and R.J. Nemanich. Silicides, Germanides, and Their 

Interfaces, edited by R. W. Fathauer, S. Manti, L. J. Schowalter, K. N. Tu, Mater. Res. Soc. 

Symp. Proc., Vol 320, pp. 305-310 (1993). 

182. “Local Structural Studies on TiSi2 and ZrSi2 Thin Films on Si(111) Surfaces,” Y. Dao, A. 

M. Edwards, D. E. Sayers and R. J. Nemanich, Silicides, Germanides and Their Interfaces, 

edited by R. W. Fathauer, L. Schowalter, S. Manti, K. N. Tu, (Mater. Res. Soc. Proc., Vol. 

320, Pittsburgh, PA, p. 367-372 (1993). 

183 “Raman Scattering Study of Interface Reactions of Co/SiGe,” Hong Ying, Zhihai Wang, D. 

B. Aldrich, D. E. Sayers, and R. J. Nemanich, Silicides, Germanides and Their Interfaces, 

edited by R. W. Fathauer, L. Schowalter, S. Manti, K. N. Tu, (Mater. Res. Soc. Proc. 320, 

Pittsburgh, PA , p. 335-340 (1994). 

184. “Surface Hydrogen and Band Bending at Metal Diamond Interfaces,” T. Tachibana, J. T. 

Glass, and R. J. Nemanich, Electrochemical Society 3rd International Symposium on 

Diamond Materials, Vol. 93-17, Editors J. P. Dismukes and K. V. Ravi, p. 979-985, (1993). 

185. “Growth and Characterization of SiGe Contacts on Semiconducting Diamond Substrates," 

T. P. Humphreys, P. K. Baumann, K. F. Turner, R. J. Nemanich, K. Das, R. G. Alley, D. P. 

Malta and J. B. Posthill, 3rd International Symposium on Diamond Materials, Honolulu, 

Hawaii, edited by J.P Dismuskers, K.V. Ravi: Electrochemical Soc. Proc. 93-17, 580-586, 

Electrochemical Soc., Pennington, NJ (1993). 

186. “Homoepitaxial Diamond Layers Grown with Different Gas Mixtures in a RF Plasma 

Reactor,” J. B. Posthill, D. P. Malta, R. A. Rudder, G. C. Hudson, R. E. Thomas, R. J. 

Markunas, T. P. Humphreys and R. J. Nemanich, 3rd International Symposium on 

Diamond Materials, Honolulu, Hawaii, May 16-21, (1993). 

1994 

187. “In Situ Remote H-Plasma Cleaning of Patterned Si-SiO2 Surfaces,” R. J. Carter, T. P. 

Schneider, J. S. Montgomery and R. J. Nemanich, J. Electrochem. Society 141, 3136-3140 

(1994). 

188. “Epitaxial Cu Contacts on Semiconducting Diamond,” P. K. Baumann, T. P. Humphreys, 

R. J. Nemanich, K. Ishibashi, N. R. Parikh, L. M. Porter and R. F. Davis, (4th European 

Conference on Diamond, Diamond-like and Related Materials) Diamond and Related 

Materials 3, 883-886 (1994). 

189. “Morphology of TiSi2 and ZrSi2 on Silicon (100) and (111) Surfaces,” C. A. Sukow and R. 

J. Nemanich, J. Mater. Res. 9, 1214-1227, (1994). 

31

190. “Structural Investigation of the Initial Interface Region Formed by Thin Zirconium Films 

on Silicon (111), A. M. Edwards, Y. Dao, K. M. Kemner, R. J. Nemanich and D. E. Sayers, 

J. Appl. Phys. 76, 4630-4635, (1994). 

191. “Angle-Resolved Photoemission of Diamond (111) and (100) Surfaces; Negative Electron 

Affinity and Band Structure Measurements,” J. van der Weide and R. J. Nemanich. 

Presented at the 21st Conference on the Physics and Chemistry of Semiconductor 

Interfaces - Mohonk, New York, January 24-28, 1994, J. Vac. Sci. Technol. B12, 2475- 

2479, (1994). 

192. “The Origin of the Broadband Luminescence and the Effect of Nitrogen Doping on the 

Optical Properties of Diamond Films,” L. Bergman, M. T. McClure, J. T. Glass and R. J. 

Nemanich. J. Appl. Phys. 76, 3020-3027 (1994). 

193. “Observation of a Negative Electron Affinity for Heteroeptaxial AlN on (6H)- 

SiC(0001),” M. C. Benjamin, C. Wang, R. F. Davis, and R. J. Nemanich, Appl. Phys. Lett. 

64, 3288-3290 (1994). 

194. “Hydrogen Plasma Cleaning Prior to Low Temperature Gate Oxide Deposition in Cluster 

Fabricated Mosfets,” J. S. Montgomery, J. P. Barnak, A. Bayoumi, J. R. Hauser, and R. J. 

Nemanich, in Cleaning Technology in Semiconductor Device Manufacturing, edited by J. 

Ruzyllo and R. E. Novak, ECS Proceedings Vol. PV 94-7, (Electrochemical Soc., 

Pennington, NJ) p. 296-306, (1994). 

195. “Reduction of Surface Roughening and Subsurface Defects in H-Plasma Cleaning of 

Si(100),” T. P. Schneider, J. S. Montgomery, H. Ying, J. P. Barnak, Y. L. Chen, D. M. 

Maher and R. J. Nemanich, Cleaning Technology in Semiconductor Device Manufacturing, 

edited by J. Ruzyllo and R. E. Novak, ECS Proceedings, Vol. PV 94-7, Pennington, NJ, 00. 

329-338, (1994). 

196. “Properties of the Heteroepitaxial AlN/SiC Interface” M. C. Benjamin, C. Wang, R. S. 

Kern, R. F. Davis, and R. J. Nemanich, Diamond, SiC and Nitride Wide Bandgap 

Semiconductors, edited by Calvin H. Carter, Jr., Gennady Gildenblat, Shuji Nakamura and 

Robert J. Nemanich (Mater. Res. Soc. Symp. Proc., 339, San Francisco, CA p. 81-88 

(1994). 

197. “Comparison of Surface Cleaning Processes for Diamond C(001),” Peter K. Baumann, T.P. 

Humphreys, and R.J. Nemanich, Diamond SiC Nitride Wide Bandgap Semiconductors, 

edited by Calvin H. Carter, Jr., Gennady Gildenblat, Shuji Nakamura and Robert J. 

Nemanich (Mater. Res. Soc. Symp. Proc. 339, San Fransisco, CA, p. 69-74 (1994). 

198. “Strain and Impurity Content of Synthetic Diamond Crystals,” T. L. McCormick, W. E. 

Jackson, and R. J. Nemanich, Novel Forms of Carbon II, edited by C.L. Renschler, D.M. 

Cox, J.J. Pouch, Y. Achiba (Mater. Res. Soc. Proc. Symp. 349, San Fransisco, CA, p. 445- 

450 (1994). 

32

199. “Recombination Processes of the Broadband and 1.681 eV Optical Centers in Diamond 

Films,” L. Bergman, M.T. McClure, J.T. Glass and R.J. Nemanich, Diamond SiC Wide 

Bandgap Semiconductors, edited by Calvin H. Carter,, Jr., Gennady Gildenblat, Shuji 

Nakamura and Robert J. Nemanich (Mater. Res Soc. Proc. Symp. 339, San Fransisco, CA, 

p. 663-668 (1994). 

200. “Structural and electrcal properties of (Ti0.9Zr0.1)Si2,” Y. Dao, A.M. Edwards, H. Ying, 

D.E. Sayers, and R.J. Nemanich. Appl. Phys. Lett. 65, 2413-2415 (1994). 

201. “Influence of Interfacial Hydrogen and Oxygen on the Schottky Barrier of Nickel on (111) 

and (001) Diamond Surfaces,” J. Van der Weide and R.J. Nemanich, Physical Review B49, 

13629-13637 (1994). 

202. “Negative Electron Affinity Effects on the Diamond (100) Surface,” J. Van der Weide, Z. 

Zhang, P.K. Baumann, M.G. Wensell, J. Bernholc and R.J. Nemanich, Physical Review 

B50, 5803-5806, (1994). 

203. “Bond Length Relaxation in Si1-xGex Alloys,” D.B. Aldrich, R.J. Nemanich and D.E. 

Sayers, Physical Review B 50, p.15 026-15 033, (1994). 

204. “Highly Oriented Diamond Films on Si: Growth, Characterization and Devices,” B.R. 

Stoner, D.M. Malta, A.J. Tessmer, J. Holmes, D.L. Dreifus, R.C. Glass, A. Sowers and R.J. 

Nemanich. SPIE Vol 2151, p. 2-13, Diamond-Film Semiconductors (1994). 

205. “Determination of excess phosphorous in low-temperature GaP grown by gas source 

molecular beam epitaxy,” Y. He, N.A. El-Marsy, J. Ramdani, S.M. Bedair, T.L. 

McCormick, R.J. Nemanich and E.R. Weber, Appl. Phys. Lett. 65, 1-3 (1994). 

1995 

206. “The structure and property characteristics of amorphous/nanocrystalline silicon produced 

by ball milling,” T.D. Shen, C.C. Koch, T.L. McCormick, R.J. Nemanich, J.Y. Huang and 

J.G. Huang, J. Mater. Res. 10, 139-148 (1995). 

207. “Negative Electron Affinity Effects on H Plasma Exposed Diamond (100) Surfaces,” P.K. 

Baumann and R.J. Nemanich. Diamond and Related Materials 4, 802-805 (1995). 

208. “Characterization of a slot antenna microwave plasma source for hydrogen plasma 

cleaning,” D. Korzec, F. Werner, A. Brockhaus, J. Engemann, T.P. Schneider and R.J. 

Nemanich. J. of Vacuum Science and Technology A13, 2074-2085 (1995). 

209. “Stability of C54 Titanium Germanosilicide on a Silicon-Germanium Alloy Substrate,” 

D.B. Aldrich, Y.L. Chen, D.E. Sayers, R.J. Nemanich, S.P. Ashburn and M.C. Ozturk. J. 

Appl. Phys. 77, 5107-5114 (1995). 

33

210. “EXAFS and XRD studies of phase formation of Co in reactions with Si-Ge alloys,” Z. 

Wang, R.J. Nemanich, D.E. Sayers, Physica B 208 & 209, 567, (1995). 

211. “Local structure studies of (Ti1-xZrx)Si2 thin films on Si(111),” Y. Dao, A.M. Edwards, R.J. 

Nemanich, and D.E. Sayers. Physica B 208 & 209, 513-514, (1995). 

212. “Film Thickness in the Ti-Si1-xGex Solid Phase Reaction,” D.B. Aldrich, Holly L. Heck, 

Y.L. Chen, D.E. Sayers, and R.J. Nemanich. J. of Appl. Phys. 78, 4958-4965 (1995). 

213. “Effect of Composition on Phase Formation and Morphology in Ti-Si(1-x)Ge(x) Solid Phase 

Reactions,” D.B. Aldrich, Y.L. Chen, D.E. Sayers, R.J. Nemanich, S.P. Ashburn and M.C. 

Ozturk. J. Mater. Res. 10, (11), p. 2849-2863, (1995). 

214. “Micro-Raman Analysis of Stress State in Diamond Thin Films,” Leah Bergman, K.F. 

Turner, P.W. Morrison, and R.J. Nemanich. Applications of Diamond Films and Related 

Materials: 3rd International Conference, 1995, Editors: A. Feldman, Y Tzeng, W.A. 

Yarbrough, M. Yoshikawa, and M. Murakawa, (NIST, Washington, p 453-456 (1995). 

215. “Negative Electron Affinity Effects and Schottky Barrier Height Measurements of Cobalt 

on DIamond (100) Surfaces,” P.K. Baumann, and R.J. Nemanich. Applications of 

Diamond Films and Related Materials: 3rd International Conference, 1995, Editors: A. 

Feldman, Y. Tzeng, W.A. Yarbrough, M. Yoshikawa, and M. Murakawa, (NIST, 

Washington, p. 41-44 (1995). 

216. “Diamond Electron Affinity Surfaces, Structures and Devices,” R.J. Nemanich, P.K. 

Baumann and J. Van der Weide. Applications of Diamond Films and Related MAterials: 

3rd International Conference, 1995, Editors: A. Feldman, Y. Tzeng, W.A. Yarbrough, M. 

Yoshikawa, and M. Murakawa, (NIST, Washington, p. 17-24 (1995). 

217. “Removal of SiO2 from Si(100) Surface by a Remote RF H2/SiH4 Plasma Prior to Epitaxial 

Growth,” J.P. Barnak, H. Ying, Y.L. Chen, J. Montgomery, and R.J. Nemanich, Ultraclean 

Semiconductor Procesing Technology and surface Chemical Cleaning and Passivation, 

edited by M. Liehr, M. Heyns, M. Hirose, and H. Parks. (Mater. Res. Soc. Symp. Proc., 

386), Pittsburgh, PA, p 351-356 (1995). 

218. “Removal of Flourine from Si(100) Surface by a Remote RF Hydrogen Plasma,” J.P. 

Barnak, S. King, J. Montgomery, Ja-Hum Ku, and R.J. Nemanich. Ultraclean 

Semiconductor Procesing Technology and surface Chemical Cleaning and Passivation, 

edited by M. Liehr, M. Heyns, M. Hirose, and H. Parks. (Mater. Res. Soc. Symp. Proc. 

386, San Fransisco, CA pp. 357-362 (1995). 

219. “RIE Passivation Layer Removal by Remote H-Plasma and H2/SiH4 Plasma Processing,” 

Hong Ying, J.P. Barnak, Y.L. Chen, and R.J. Nemanich. Ultra Clean Semiconductor 

Processing Technology and Surface Chemical Cleaning and Passivation, edited by M. 

Liehr, M. Heyns, M. Hirose, H. Parks. (Mater. Res. Soc. Symp. Proc., 386, San Fransisco, 

CA, pp 285-290 (1995). 

34

220. “Correlation of Roughness and Device Properties for Hydrogen Plasma Cleaning of 

Si(100) Prior to Gate Oxidation,” J.S. Montgomery, J.P. Barnak, C. Silvestre, J.R. Hauser, 

and R.J. Nemanich. Ultraclean Semiconductor Processing Technology and Surface 

Chemical Cleaning and Passivation, edited by M. Liehr, M. Heyns, M. Hirose, H. Parks 

(Mater. Res. Soc. Symp. Proc. 386, San Fransisco, CA, pp. 279-284 (1995). 

221. “Morphology and Stability of (Ti0.9Zr0.1)Si2 Thin Films on Si(111) and Si(100) Formed in 

UHV,” Y. Dao, D.E. Sayers, and R.J. Nemanich. Thin Solid Films 270, 544-548, 1995. 

(Also in the Proceedings for the ICMCTF Conference in San Diego, CA, April 1995. 

222. “Observation of a Negative Electron Affinity for Boron Nitride,” M.J. Powers, M.C. 

Benjamin, L.M. Porter, R.J. Nemanich, R.F. Davis, J.J. Cuomo, G.L. Doll and Stephen J. 

Harris. Applied Physics Letters 67, 3912-3915 (1995). 

223. “Raman and Photoluminescence Analysis of Stress State and Impurity Distribution in 

Diamond Thin Films,” L. Bergman and R.J. Nemanich. J. Appl. Physics 78, 6709-6719, 

(1995). 

224. “UV Photoemission Study of Heteroepitaxial AlGaN Films Grown on 6H-SiC,” M.C. 

Benjamin, M.D. Bremser, T.W. Weeks, Jr., S.W. King, R.F. Davis, and R.J. Nemanich. 

Applied Surface Science 104/105, 455-460 (1996) Presented at Fifth international 

Conference on the Formation of Semiconductor Interfaces, Princeton, NJ, June 26-30, 

1995. 

225. “The Schottly Barrier of Co on Strained and Unstrained SixGe1-x Alloys,” Ja-Hum Ku, 

and R.J. Nemanich. Applied Surface Science 104/105, 262-266 (1996). Presented at Fifth 

International Conference on the Formation of Semiconductor Interfaces, Princeton, NJ, 

June 26-30, 1995. 

226. “Characterization of Cobalt-Diamond (100) Interfaces: Electron Affinity and Schottky 

Barrier,” P.K. Baumann and R.J. Nemanich. Applied Surface Science 104/105, 267-273 

(1996). Presented at Fifth International Conference on the Formation of Semiconductor 

Interfaces, Princeton, NJ, June 26-30, 1995. 

227. “Morphology of Si(100) Surfaces Exposed to a Remote H-Plasma,” J.S. Montgomery, T.P. 

Schneider, R.J. Carter, J.P. Barnak, Y.L. Chen, J.R. Hauser and R.J. Nemanich. Appl. 

Phys. Lett. 67, 2194-2196 (1995). 

228. “Comparison of silicon, nickel, and nickel silicide (Ni3Si) as substrates for epitaxial 

diamond growth,” D.A. Tucker, D-K. Seo, M.H. Whangbo, F.R. Sivazlian, B.R. Stoner, 

S.P. Bozeman, A.T. Sowers, R.J. Nemanich, J.T. Glass. Surface Science 334, 179-194 

(1995). 

35

229. “Silicide Formation and Stability of TiSiGe and Co/SiGe,” Zhihai Wang, D.B. Aldrich, 

Y.L. Chen, D.E. Sayers, and R.J. Nemanich. Thin Solid Films 270, 555-560 (1995). (Also 

in the proceedings for the ICMCTF Conference in San Diego, CA, April (1995.) 

230. “Phase stabilities and surface morphologies of (Ti1-xZrx)Si2 thin films on Si(100),” Y. Dao, 

D.E. Sayers and R.J. Nemanich. J. Appl. Phys. 78, (11), 6584-6591 (1995). 

231 “(Negative) Electron Affinity of AlN and AlGaN Alloys,” R.J. Nemanich, M.C. Benjamin, 

S.W. King, M.D. Bremser, R.F. Davis, B. Chen, Z. Zhang, and J. Bernholc. Gallium 

Nitride and Related Materials, edited by F. A. Ponce, R. D. Dupuis, S. Nakamura and J. A. 

Edmond. (Mater. Resl Soc. Symp. Proc. 395, Boston, MA, Fall pp 777-788 (1995). 

232. “XPS Measurement of the SiC/AlN Band-Offset at the (0001) Interface,” Sean King, M.C. 

Benjamin, R.J. Nemanich, R.F. Davis, and W.R.L. Lambrecht. Gallium Nitride and 

Related Materials, edited by F. A. Ponce, R. D. Dupuis, S. Nakamura and J. A. Edmond. 

(Mater. Res. Soc. Proc. 395, Boston, MA, Fall pp 375-380 (1995). 

233. “Ex situ and In situ Methods for Oxide and Carbon Removal from AlN and GaN 

Surfaces,” Sean W. King, Laura L. Smith, J.P. Barnak, Ja-Hum Ku, Jim A. Christman, 

Mark C. Benjamin, R.J. Nemanich and Robert F. Davis. Gallium Nitride and Related 

Materials, edited by F. A. Ponce, R. D. Dupuis, S. Nakamura and J. A. Edmond (Mater. 

Res. Soc. Symp. Proc. 395, Boston, MA, Fall, pp. 739-744 (1995). 

234. “Characterization of Zirconium Germanosiliciide formed by Solid State Reaction of Zr 

with Si1-xGex Alloys,” Z. Wang, D.B. Aldrich, P. Goeller, R.J. Nemanich and D.E. Sayers. 

Silicide Thin Films-Fabrication, Properties, and Applications, edited by Raymond T. 

Tung, Karen Maex, Paul W. Pellegrini, and Leslie H. Allen. (Mater. Res. Soc. Symp. Proc. 

402, Boston, MA p. 387-392 (1996). 

235. “Epitaxial Films of Cobalt Disilicide (100) Evaporated onto Si(100) from a Mixed Source,” 

P.T. Goeller, Z. Wang, D.E. Sayers, J.T. Glass and R.J. Nemanich. Silicide Thin Films- 

Fabrication, Properties, and Applicatioins, edited by Raymond T. Tung, Karen Maex, Paul 

W. Pellegrini and Leslie H. Allen, (Mater. Res Soc. Proc. Symp. 402, Boston, MA, Fall 

pp. 511-516 (1995). 

236. “Interface Stability of Ti(Si1-yGey)2 and Si1-xGex Alloys,” D.B. Aldrich, F.M. D'Huerle, 

D.E. Sayers and R.J. Nemanich. Silicide Thin Films-Fabrication, Properties, and 

Applicatioins, edited by Raymond T. Tung, Karen Maex, Paul W. Pellegrini and Leslie H. 

Allen, (Mater. Res Soc. Proc. Symp. 402, Boston, MA, Fall pp. 21-26 (1995). 

237. “Titanium Germanosilicide Phase Formation During the Ti-Si1-xGex Solid Phase 

Reactions,” D.B. Aldrich, D.E. Sayers and R.J. Nemanich, Silicide Thin Films-Fabrication, 

Properties, and Applicatioins, edited by Raymond T. Tung, Karen Maex, Paul W. 

Pellegrini and Leslie H. Allen, (Mater. Res Soc. Proc. Symp. 402, Boston, MA, Fall pp. 

405-410 (1995). 

36

238. “Negative Electron Affinity Effects and Schottky Barrier Height Measurements of Metals 

on Diamond (100), (110), and (111) Surfaces,” P.K. Baumann and R.J. Nemanich, 

Diamond for Electronic Applications, edited by David L. Dreifus, Alan Collins, Trevor 

Humphreys, Kumar Das and Pehr E. Pehrsson, (Mater. Res Soc. Proc. Symp. 416, Boston, 

MA, Fall pp. 157-162 (1995). 

1996 

239. “Interface Stability of Ti(SiGe)2 and SiGe Alloys: Tie Lines in the Ternary Equilibrium 

Diagram,” D.B. Aldrich, F.M. d'Heurle, D.E. Sayers, and R.J. Nemanich, Physical Review 

B 53, 279-282 (1996). 

240. “Negative Electron Affinity Surfaces of Aluminum Nitride and Diamond,” R.J. Nemanich, 

P.K. Baumann, M.C. Benjamin, S.W. King, J. van der Weide, and R.F. Davis, Diamond 

and Related Materials 5, 790-796 (1996). 

241. “Electron Emission Measurments from CVD Diamond Surfaces,” S.P. Bozeman, P.K. 

Baumann, B.L. Ward, M.J. Powers, J.J. Cuomo, R.J. Nemanich and D.L. Dreifus, 

Diamond and Related Materials 5, 802-806 (1996). 

242. “Ex situ and In situ Methods for Complete Non-Carbide Carbon Removal from (0001)Si 

6H-SiC Surfaces,” Sean W. King, Mark C. Benjamin, Richard S. Kern, R.J. Nemanich and 

Robert F. Davis. III-Nitride,, SiC and Diamond Materials for Electronic Devices edited by 

D. Kurt Gaskill, Charles D. Brandt and Robert J. Nemanich (Mater. Res. Soc. Symp. 

Proc.423, San Fransisco, CA, Spring p 563-566 (1996). 

243. “Investigation of an NEA Diamond Vacuum Microtriode Array,” C. W. Hatfield, G. L. 

Bilbro, A. S. Morris, P. K. Baumann, B. L. Ward and R. J. Nemanich. III-Nitride, SiC and 

Diamond Materials for Electronic Devices edited by D. Kurt Gaskill, Charles D. Brandt 

and Robert J. Nemanich (Mater. Res. Soc. Symp. Proc.423, San Fransisco, CA, Spring p. 

33-38 (1996). 

244. “Characterization of Zirconium-Diamond Interfaces,” P. K. Baumann, S. P. Bozeman, B. 

L. Ward, and R. J. Nemanich. III-Nitride, SiC and Diamond Materials for Electronic 

Devices edited by D. Kurt Gaskill, Charles D. Brandt and Robert J. Nemanich (Mater. Res. 

Soc. Symp. Proc. 423, San Fransisco, CA, Spring p. 143-148 (1996). 

245. “Surface Morphology of Nanoscale TiSi2 EPITAXIAL Islands on Si(001),” Woochul Yang, 

F. J. Jedema, H. Ade and R. J. Nemanich. Control of Semiconductor Surfaces and 

Interfaces, edited by S. M. Prokes, O. J. Glembocki, S. K. Brierley, J. M. Gibson and J. M. 

Woodall, (Mater. Res. Soc. Symp. Proc. 448, Boston, MA, Fall 1996) p. 223-228. 

246. “Raman Analysis of Electron-Phonon Interactioins in GaN Films,” L. Bergman, M. D. 

Bremser, J. A. Christman, S. W. King, R. F. Davis, and R. J. Nemanich. III-V Nitrides 

37

edited by F. Ponce, T. Moustakas, I. Akasaki, B. Monemar (Mater. Res. Soc. Symp. Proc. 

449, Boston, MA, Fall 1996) p. 725-730. 

247. “Nitride Based Thin Film Cold Cathode Emitters,” James A. Christman, Andrew T. 

Sowers, Michael D. Bremser, Brandon L. Ward, Robert F. Davis and Robert J. Nemanich. 

III-V Nitrides edited by F. Ponce, T. Moustakas, I. Akasaki, B. Monemar (Mater. Res. Soc. 

Symp. Proc. 449, Boston, MA, Fall 1996) p. 1121-1126. 

248. “Growth of Bulk ALN and GaN Single Crystals by Sublimation,” C. M. Balkas Z. Sitar T. 

Zheleva, L. Bergman, I. K. Shmagin, J. F. Muth, R. Kolbas, R. Nemanich, and R. F. Davis. 

III-V Nitrides edited by F. Ponce, T. Moustakas, I. Akasaki, B. Monemar (Mater. Res. 

Soc. Symp. Proc. 449, Boston, MA, Fall p. 41-46 (1996). 

249. “Selective Growth of GaN and Al0.2Ga0.8N on GaN/AlN/6H-SiC(0001) Multilayer 

Substrates Via Organometallic Vapor Phase Epitaxy,” O.H. Nam, M.D. Bremser, B.L. 

Ward, R.J. Nemanich, R.F. Davis, III-V Nitrides edited by F. Ponce, T. Moustakas, I. 

Akasaki, B. Monemar, (Mater. Res. Soc. Symp. Proc., Vol. 449, Boston, MA, Fall 1996) 

p. 107-112, and Jpn.Journal of Appl. Phys., Vol. 36, No. 5A, p L532-L535 (1997). 

250. “Large Crystallite Polysilicon Deposited Using Pulsed-Gas PECVD at Tempatures Less 

than 250°C,” E. Srinivasan, S. J. Ellis R. J. Nemanich and G. N. Parsons. (Mater. Res. Soc. 

Symp Proc., Vol 452, Advances in Microcrystalline and Nanocrystalline Semiconductors, 

p. 989-994 (1996). 

251. “Hydrogen Evolution from Strained SixGe1-x(100)2x1:H Surfaces,” Ja-Hum Ku and R.J. 

Nemanich. J. of Appl. Phys. 80, (8), 4715-4721 (1996). 

252. “Cleaning of GaN Surfaces,” L.L. Smith, S.W. King, R.J. Nemanich, R.F. Davis. J. 

Electronic Mater. 25, (5), 805-810 (1996). 

253. “Removal of Fluorine and CFx Residue from Si (100) Surfaces by Remote RF Hydrogen 

Plasma,” J. P. Barnak, H. Ying, S. King and R. J. Nemanich. Proceedings of the Third 

International Symposium of Ultra Clean Processing of Silicon Surfaces, p. 251-255, 

Antwerp, Belgium (1996). 

254. “Surface electronic Structure of Clean and Hydrogen Chemisorbed SixGe1-x Alloy 

Surfaces,” Ja-Hum Ku and R.J. Nemanich, Physical Review B54, 14102-14110 (1996). 

255. “Phase Transformations during Microcutting Tests on Silicon,” B. V. Tanikella, A. H. 

Somashekhar, A. T. Sowers, R. J. Nemanich and R. O. Scattergood, Appl. Phys. Lett. 69 

(19), 2870-2872 (1996). 

1997 

38

256. “Photoluminescence from mechanically milled Si and SiO2 powders,” T. D. Shen, L. 

Shmagin, C. C. Koch, R. M. Kolbas, Y. Fahmy, L. Bergman, R. J. Nemanich, M. T. 

McClure, Z. Sitar and M. X. Quan, Physical Review B55, (12), 7615-7623, (1997). 

257. “Electrical and Structural Properties of Zirconium Germanosilicide Formed by a Bilayer 

Solid State Reaction of Zr with Strained Sii1-x) Ge(x) Alloys,” Z. Wang, D. B. Aldrich, R. J. 

Nemanich and D. E. Sayers, J. Appl. Phys. 82, (5), 2342-2348, (1997). 

258. “Comparison of electron affinity and Schottky barrier height of Zirconium and copperdiamond 

interfaces,” P. K. Baumann and R. J. Nemanich. J. Vac. Sci. Technol. B15, (4), 

1236-1240 (1997). 

259. “Growth of GaN and A10.2Ga0.8N on Patterened Substrates Via Organometalllic Vapor 

Phase Epitaxy,” Ok-Hyun Nam, Michael D. Bremser, Brandon Ward, Robert J. Nemanich 

and Robert F. Davis, Jpn. J. Appl. Phys. 36, L532-L535 (1997). 

260. “An Integrated Growth and Analysis System for In-situ Xas Studies of Metal- 

Semiconductor Interactions,” Z. Wang, P. T. Goeller, B. I. Boyanov, D.E. Sayers and R. J. 

Nemanich, Journal De Physique IV, C2-562-564 (1997). 

261. “The Characterization of Strain, Impurity Content, and Crush Strength of Synthetic 

Diamond Crystals,” T.L. McCormick, W.E. Jackson, and R.J. Nemanich, J. Mater. Res. 

12, 253-263 (1997). 

262. “The Dependence of the C49-C54 TiSi2 Phase Transition Temperature on Film Thickness 

and Si Substrate Orientation,” Hyeongtag Jeon, Gangjoong Yoon, and R.J. Nemanich, Thin 

Solid Films 299, 178-182 (1997). 

263. “AFM Analysis of HF Vapor Cleaned SiO2 Surfaces,” R. J. Carter, E. J. Bergman, D. R. 

Lee J. Owyang, and R. J. Nemanich, Science and Technology of Semiconductor Surface 

Preparation, edited by G. S. Higashi, M. Hirose, S. Raghavan, and S. Verhaverbeke 

(Mater. Res. Soc. Symp. Proc., Vol. 447, San Francisco, CA p.481-486 (1997). 

264. “Raman Analysis of the Configurational Disorder in AlxGa1-xN films,” Leah Bergman, 

Michael D. Bremser, William G. Perry, Robert F. Davis, Mitra Dutta and Robert J. 

Nemanich. Appl. Phys. Lett. 71, (15), 2157-2159 (1997). 

265. “Thin Films of Aluminum Nitride and Aluminum Gallium Nitride for Cold Cathode 

Applications,” A. T. Sowers, J. A. Christman, M. D. Bremser, B. L. Ward, R. F. Davis and 

R. J. Nemanich. Appl. Phys. Lett. 71, (16), 2289-2291 (1997). 

266. “Characterization of metal-diamond interfaces: electron affinity and Schottky barrier 

height,” P. K Baumann, S. P. Bozeman, B. L. Ward, and R. J. Nemanich. Diamond and 

Related Materials 6, 698-402 (1997). 

39

267. “Structure and stability of cobalt-silicon-germanium thin films,” Peter T. Goeller, Boyan I. 

Boyanov, Dale E. Sayers and Robert J. Nemanich. Nuclear Instruments and Methods in 

Physics Research B 133, 84-89 (1997). 

268. “Correlation of morphology and electrical properties of nanoscale TiSi2 epitaxial islands on 

Si (001),” Woochul Yang, F. J. Jedema, H. Ade, and R. J. Nemanich. Thin Solid Films 

308-309, 627-633 (1997). 

269. “Sublimation growth and characterization of bulk aluminum nitride single crystals,” 

Cengiz M. Balkas, Zlatko Sitar, Tsvetanaka Zheleva, L. Bergman, R. J. Nemanich and R. 

F. Davis. J. of Crystal Growth 179, 363-370 (1997). 

270. “Growth of III-Nitrides via Sublimation and Metalorganic Vapor Phase Epitaxy,” Robert F. 

Davis, B. L. Ward, Z. Sitar, T. Zheleva, L. Bergman, I. K. Shmagin, J. F. Muth, R. M. 

Kolbas, and R. J. Nemanich. Kovine, Zlitine, Technologije 31, (6), 485-494 (1997). 

1998 

271. “Electron Emission from Metal Diamond (100), (111) and (110) Interfaces,” P. K. Baumann 

and R. J. Nemanich, Diamond Rel. Mat. 7, (2-5), 612-619 (1998). 

272. “Electron affinity and Schottky barrier height of metal-diamond (100), (111), and (110) 

interfaces,” P. K. Baumann and R. J. Nemanich, J. of Appl. Phys. 83, (4), 2072-2082 

(1998). 

273. “Raman Analysis of AlxGa1-xN Films,” Leah Bergman, Mitra Dutta, Michael D. Bremser, 

Ok-Hyun Nam, William G. Perry, Dimitri Alexson, Robert F. Davis, Cengiz M. Balkas and 

Robert J. Nemanich. Nitride Semiconductors, edited by F. A. Ponce, S. P. DenBaars, B. K. 

Meyer, S. Nakamura and S. Strite. (Mater. Res. Soc. Symp. Proc., Vol. 482, Boston, 

Massachusetts) p. 543-548. 

274. “Morphology of Silicon Oxides on Silicon Carbide,” M. L. O’Brien, S. Pejdo and R. J. 

Nemanich, Power Semiconductor Materials and Devices, edited by S. J. Pearton, R. J. 

Shul, E. Wolfgang, F. Ren, and S. Tenconi. (Mater. Res. Soc. Symp. Proc., Vol. 483, 

Spring 1998, San Francisco, CA p. 437-442, (1998). 

275. “Electron Emission Properties of Si Field Emitter Arrays Coated with Nanocrystalline 

Diamond from Fullerene Precursors,” T. G. McCauley, T. D. Corrigan, A. R. Krauss, O. 

Auciello, D. Zhou, D. M. Gruen, D. Temple, R. P. H. Chang, S. English, and R. J. 

Nemanich. Covalently Bonded Disordered Thin-Film Materials, edited by M. P. Siegal, W. 

I. Milne, J. E. Jaskie (Mater. Res. Soc. Symp. Proc., Vol 498, 1997 Fall Meeting, Boston, 

MA. p. 227-232 (1998) 

276. “Electron Emission Properties of Diamond and III-V Nitrides,” R. J. Nemanich, P. K. 

Baumann, M. J. Benjamin, S. L. English, J. D. Hartman, A. T. Sowers, B. L. Ward and P. 

C. Yang. Mat. Issues in Vacuum Microelectronics, edited by W. Zhu, L. S. Pan, T. E. 

40

Felter and Christopher Holland (Mater. Res. Soc. Symp. Proc., Vol. 509, 1998 Spring 

Meeting, San Francisco, CA. p 35-46 (1998). 

277. “Relationship of Field Emission Characteristics on Process Gas Nitrogen Content in 

Nitrongen Doped Diamond Films,” A. T. Sowers, B. L. Ward and R. J. Nemanich, Mat. 

Issues in Vacuum Microelectronics, editors W. Zhu, L. S. Pan, T. E. Felter and Christopher 

Holland (Mater. Res. Soc. Symp. Proc., Vol. 509, 1998 Spring Meeting, San Francisco, 

CA. p. 95-100 (1998). 

278. “Examination of the Silicon-Silicon Carbide Interface by Ultraviolet Photoemission 

Spectroscopy,” C. Koitzsch, M. O’Brien, D. Johri, A. Stoltz and R. Nemanich, Wide- 

Bandgap Semiconductors for High Power, High Frequency and High Temperature, edited 

by Steven DenBaars, John Palmour, Michael Shur and Michael Spencer. (Mater. Res. Soc. 

Symp. Proc., Vol. 512 San Francisco, CA. p 357-362 (1998). 

279. “Thickness Effects In The Reaction Of Cobalt With Silicon-Germanium Alloys,” Boyan I. 

Boyanov, Peter T. Goeller, Dale E. Sayers, and Robert J. Nemanich, Advanced 

Interconnects and Contact Materials and Processes for Future Integrated Circuits, editors 

Shyam P. Murarka, Moshe Eizenberg, David B. Fraser, Roland Madar and Raymond Tung, 

(Mater. Res. Soc. Symp. Proc., Vol. 514, Spring 1998, San Francisco, CA p. 165-170 

(1998). 

280. “Morphology of NiSi Film on Si(100): Role of the Interface Strain,” Eliane Maillard- 

Schaller, B. I. Boyanov, S. English and R. J. Nemanich. Advanced Interconnects and 

Contact Materials and Processes for Future Integrated Circuits, editors Shyam P. 

Murarka, Moshe Eizenberg, David B. Fraser, Roland Madar and Raymond Tung 

(Proceedings of the Mater. Res. Soc. Proc., Vol. 514, Spring 1998, San Francisco, CA. p. 

185-190, (1998). 

281. “Real-Time Observation of Ti Silicide Epitaxial Islands Growth with Photoelectron 

Emission Microscopy,” Woochul Yang, H. Ade, and R. J. Nemanich Epitaxy and 

Applications of Si-Based Heterostructures, edited by Eugene A. Fitzgerald, Derek C. 

Houghton and Patricia M. Mooney. (Mater. Res. Soc. Symp. Proc. Vol. 533, 1998 Spring 

Meeting , San Francisco, CA. p 197-202 (1998). 

282. “Electron Emission from Diamond Films and Surfaces,” R. J. Nemanich, P. K. Baumann, 

A. T. Sowers and B. L. Ward, International Union of Materials Research Societies-ICA’97, 

Symposium I, Super Carbon, MYU, Tokyo, edited by S. Fujiwara, M. Kamo, R. Ruoff, R. 

Heinmann, D. Marton and H. Hiraoka, 171-174 (1998). 

283. “Characterization of Copper - Diamond (100), (111) and (110) Interfaces,” P. K. Baumann 

and R. J. Nemanich, Phys. Rev. B58, (3), 1643-1654 (1998). 

284. “Electron Emission Properties of Crystalline Diamond and III-Nitride Surfaces,” R. J. 

Nemanich,, P. K. Baumann, M. C. Benjamin, O. -H. Nam, A. T. Sowers, B. L. Ward, H. 

41

Ade and R. F. Davis. Applied Surface Science 130-132, 694-703 (1998). Proceedings of 

The Fourth International Symposium on Atomically Controlled Surfaces and Interfaces. 

285. “Dependence of (0001) GaN/AlN valence band discontinuity on growth temperature and 

surface reconstruction,” S. W. King, C. Ronning, R. F. Davis, M. C. Benjamin and R. J. 

Nemanich, J. Appl. Phys. 84, (4), 2086-2090 (1998). 

286. “Co-deposition of Cobalt Disilicide on Silicon-Germanium Thin Films,” P. T. Goeller, B. I. 

Boyanov, D. E. Sayers and R. J. Nemanich, Presented at Conference on Multigrid Coatings 

and Thin Films, San Diego, CA, April 21-25, 1997. Thin Solid Films 320, 206-210 (1998). 

287. “Surface Cleaning, Electronic States and Electron Affinity of Diamond (100), (111) and 

(110) Surfaces,” P. K. Baumann and R. J. Nemanich, Surface Science 409, 320-335 

(1998). 

288. “In situ studies of metal-semiconductor interactions with synchrotron radiaiton,” D. E. 

Sayers, P. T. Goeller, B. I. Boyanov and R. J. Nemanich, J. Synchrotron Rad. 5, 1050- 

1051, (1998) 

289. “Structural and electronic properties of boron nitride thin films containing silicon,” C. 

Ronning, A. D. Banks, B. L. McCarson, R. Schlesser, Z. Sitar, R. F. Davis, B. L. Ward and 

R. J. Nemanich. J. Appl. Phys. 84, (9), 5046-5051, (1998). 

290. “Cleaning of AlN and GaN Surfaces,” S. W. King, J. P. Barnak, M. D. Bremser, K. M. 

Tracy, C. Ronning, R. F. Davis, and R. J. Nemanich. J. Appl. Phys. 84, (9), 5248-5260 

(1998). 

291. “Electron Emission Characteristics of GaN Pyramid Arrays Grown via Organommetallic 

Vapor Phase Epitaxy,” B. L. Ward, O. -H. Nam, J. D. Hartman, S. L. English, B. L. 

McCarson, R. Schlesser, Z. Sitar, R. F. Davis and R. J. Nemanich. J. Appl Phys. 84, (9), 

5238-5242 (1998). 

292. “X-ray Photoelectron Diffraction from (3x3) and (√3x√3) R30° (0001)Si 6H-SiC 

Surfaces,” S. W. King, C. Ronning, R. F. Davis, R. S. Busby and R. J. Nemanich. J. Appl. 

Phys. 84, (11), 6042-6048, (1998). 

293. “Piezoelectric measurements with atomic force microscopy,” J. A. Christman, R. R. 

Woolcott, Jr., A. I. Kingon, and R. J. Nemanich, Appl. Phys. Lett., 73, (26), 3851-3853 

(1998). 

294. “A Free Electron Laser - Photoemission Electron Microscope System (FEL-PEEM),” H. 

Ade, W. Yang, S. L. English, J. Hartman, R. F. Davis, R. J. Nemanich, V. N. Litvinenko, 

I. V. Pinayev, Y. Wu and J. M. J. Madey. Surface Review and Letters 5, (6) 1257-1268 

(1998). 

42

295. “Characterization of Electron Emitting Surfaces of Diamond and III-V Nitrides,” R. J. 

Nemanich, P. K. Baumann, M. J. Benjamin, S. L. English, J. D. Hartman, A. T. Sowers and 

B. L. Ward. Diamond Films and Technologies 8: (4), 211-223 (1998 ). 

296. “Film thickness effects in the Co-Si1-xGex solid phase reaction,” B. I. Boyanov, P. T. 

Goeller, D. E. Sayers, and R. J. Nemanich. J. Appl. Phys. 84 (8), 4285-4291 (1998). 

1999 

297. “Role of the substrate strain in the sheet resistance stability of NiSi deposited on Si(100),” 

Eliane Maillard-Schaller, B.I. Boyanov, S. English and R.J. Nemanich, J. Appl. Physics 85, 

(7), 3614-3618 (1999). 

298. “Raman Analysis of the E1 and A1 Quasi-LO and -TO Modes in Wurtzite AlN,” Leah 

Bergman, Mitra Dutta, Cengiz Balkas, Robert F. Davis, James A. Christman, Dimitir 

Alexson and R. J. Nemanich, J. Appl. Phys 85, (7), 3535-3539 (1999). 

299. “Confined phonons and phonon-mode properties of III-V nitrides with wurtzite crystal 

structure,” D. Alexson, Leah Bergman, Mitra Dutta, K. W. Kim, S. Komirenko, Robert J. 

Nemanich, B. C. Lee, Michael A. Stroscio, and SeGi Yu. Physica B 263-264, 510-513 

(1999). 

300. “Electron Emission from Crystalline Diamond Surfaces,” R. J. Nemanich, P. K. Baumann, 

A. T. Sowers and B. L. Ward, Advances in Science and Technology 21, Proceedings of 

Topical Symposium IV- Diamond Films: Synthesis, Processing and Applications, 9th 

Cimtec-World Forum on New Materials Symposium, Techna Srl, p. 217-228, 1999. 

301. “Raman Analysis of Phonon Lifetimes in AlN and GaN of Wurtzite Structure,” Leah 

Bergman, Dimitri Alexson, Patrick L. Murphy, Mitra Dutta, Michael A. Stroscio, Cengiz 

Balkas, Hyumin Shin, Robert F. Davis and Robert J. Nemanich. Phys. Rev. B 59, (20), 

12977-12982 (1999). 

302. “Raman Analysis and Field Emission Study of Ion Beam Etched Diamond Films,” M. 

Park, D. R. McGregor, L. Bergman, R. J. Nemanich, J. J. Hren, J. J. Cuomo, W. B. Choi 

and V. V. Zhirnov. J. Vac. Sci. Technol. B 17, (2), 700-704 (1999). 

303. “Effect of nitrogen incorporation on electron emission from chemical vapor deposited 

diamond,” M. Park, A. T. Sowers, C. Lizzul Rinne, R. Schlesser, L. Bergman, R. J. 

Nemanich, Z. Sitar, J. J. Hren, J. J. Cuomo, V. V. Zhirnov and W. B. Choi. J. Vac. Sci. 

Technol. B 17, (2), 734-739 (1999). 

304. “Wet Chemical Processing of (0001)Si 6H-SiC: Hydrophobic and Hydrophilic Surfaces,” 

Sean W. King, Robert J. Nemanich and Robert F. Davis. Journal of the Electrochemical 

Society, 146, (5), 1910-1917 (1999). 

43

305. “Imaging Electron Emission from Diamond and III-V Nitride Surfaces with Photo-Electron 

Emission Microscopy,” R. J. Nemanich, S. L. English, J. D. Hartman, A. T. Sowers, B. L. 

Ward, H. Ade and R. F. Davis. Applied Surface Science 146,287-294 (1999). 

306. “Growth of Epitaxial CoSi2 on SiGe(001),” B. I. Boyanov, P. T. Goeller, D. E. Sayers and 

R. J. Nemanich. J. Appl. Phys. 86, (2), 1355-1362 (1999). 

307. “Hydrogen Plasma Removal of Post-RIE Residue for Backend Procesing,” A. 

Somashekhar, H. Ying, P. B. Smith, D. B. Aldrich and R. J. Nemanich, Journal of 

Electrochemical Society 146, (6), 2318-2321 (1999). 

308. “The effect of germanium on the CoSiGe thin-film reaction,” Boyan I. Boyanov, Peter T. 

Goeller, Dale E. Sayers and Robert J. Nemanich, J. Synchrotron Rad. 6, 521-523, (1999). 

309. “Cobalt silicide formation on 6H silicon carbide,” A. O. Porto, B. I. Boyanov, D. E. Sayers 

and R. J. Nemanich, J. Synchrotron Rad. 6, 188-189 (1999). 

310. “Dry Ex situ Cleaning Processes for (0001)Si 6H-SiC Surfaces,” Sean W. King, Robert J. 

Nemanich and Robert F. Davis. J. Electrochemical Society 146, (7), 2648-2651 (1999). 

311. “Thermochemical stability of silicon-oxygen-carbon alloy thin films: A model system for 

chemical and structural relaxation at SiC-SiO2 interfaces.” D. M. Wolfe, B. J. Hinds, F. 

Wang, G. Lucovsky, B. L. Ward, M Xu, R. J. Nemanich and D. M. Maher. J. Vac. Sci. 

Technol. A 17, (4), 2170-2177 (1999). 

312. “Phonon Dynamics and Lifetimes of AlN GAN Crystallites,” Leah Bergman, Dimitir 

Alexson, Robert J. Nemanich, Mitra Dutta, Michael A. Stroscio, Cengiz Balkas and Robert 

F. Davis. GaN and Related Alloys, edited by Stephen J. Pearton, Chihping Kuo, Alan F. 

Wright and Takeshi Uenoyama (Mat. Res. Soc. Symp Proc. Vol. 537, Spring, San 

Francisco, CA) p G 6.65, (1999); and MRS Internet J NSR 4, U794-799, Suppl. 1 (1999). 

313. “Field Emission Properties of Nitrogen-Doped Diamond Films,” A. T. Sowers, B. L. Ward, 

S. L. English and R. J. Nemanich, Journal of Appl. Phys, 86, (7), 3973-3982 (1999). 

314. “Chemical Vapor Cleaning of 6H-SiC Surfaces,” Sean W. King, R. Scott Kern, Mark C. 

Benjamin, John P. Barnak, Robert J. Nemanich and Robert F. Davis, J. Electrochemical 

Society 147, (9), 3448-3454 (1999). 

315. “Valence Band Discontinuity, Surface Reconstruction, and Chemistry of (0001), (000-1), 

and (1-100) 2H-AlN/6H-SiC Interfaces,” S. W. King, R. F. Davis, C. Ronning, M C. 

Benjamin and R. J. Nemanich, J. Appl. Physics 86, (8), 4483-4490 (1999). 

316. “X-ray Photoelectron Spectroscopy Analysis of GaN/(0001)/AlN and AlN/(0001) GaN 

Growth Mechanisms,” S. W. King, E. P. Carlson, R. J. Therrien, J. A. Christman, R. J. 

Nemanich and R. F. Davis. J. Appl. Phys. 86, (10), 5584-5593 (1999). 

44

317. “Germanium Segregation in the Co/SiGe Si(001) thin film system,” Peter T. Goeller, 

Boyan I. Boyanov, Dale Sayers, Robert J. Nemanich, Alline F. Myers and Eric B. Steel. J. 

Mater. Res. 14, (11), 4372-4384 (1999). 

318. “An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical 

solution deposition technique,” S. H. Kim, D. J. Kim, K. M. Lee, M. Park, A. I. Kingon, R. 

J. Nemanich, J. Im and S. K. Streiffer. J. Mater. Res. 14, (11), 4395-4401 (1999). 

319. “Raman scattering of tetrahedrally-bonded amorphous carbon deposited at oblique angles,” 

M. Park, S. M. Camphausen, A. F. Myers, P. T. Barletta, V. Sakhrani, L. Bergman, R. J. 

Nemanich and J. J. Cuomo. Materials Letters 41, (5), 229-233 (1999). 

320. “Valence Band Discontinuity of the (0001) 2H-GaN / (111) 3C-SiC Interface,” S. W. King, 

R. F. Davis, C. Ronning and R.J. Nemanich, J. Electronic Mater. 28, (12), L34-L37 

(1999). 

321. “Reduction of the Phase Transition Temperature of TiSi2 on Si(111) using a Ta Interlayer,” 

Bokhee Jung, Young Do Kim, Woochul Yang, R. J. Nemanich and Hyeongtag Jeon, 

Advanced Interconnects and Contacts, editors: D. C. Edelstein, T. Kikkawa, M. C. 

Ozturk, K. N. Tu, and E. J. Weitzman, (Mater. Res. Soc. Symp. Proc. Vol. 564, p. 59-64 

(1999). Spring 1999, San Francisco, CA). 

322. “Stress Relaxation in Uniquely Oriented SiGe/Si Epitaxial Layers,” M. E. Ware and R. J. 

Nemanich. Thin Films: Stresses and Mechanical Properties VIII, edited by R. Vinci, O. 

Kraft, N. Moody, P. Besser, and E. Shaffer, II. (Mater. Res. Soc. Symp. Proc. Vol. 594 , 

p.163-168 (1999). Boston, MA. 

323. “Electrical Properties of Nanoscale TiSi2 Islands on Si,” Jaehwan Oh, Hoon Ham, Peter 

Laloli and R. J. Nemanich, Self-Organized Processes in Semiconductor Alloys, edited by 

A. Mascarenhas, D. Follstaedt, T. Suzuki and B. Joyce, (Mater. Res. Soc. Vol. 583, p. 111- 

116 (1999). Boston, MA. 

324. “Real-Time Observation of Pt-Si Liquid Micro-Droplet Migration by Photo-Electron 

Emission Microscopy,” W. Yang, H. Ade and R. J. Nemanich. Materials Issues and 

Modeling for Device Nanofabrication, Editors L. Merhari, L. Wille, K. Gonsalves, M. 

Gyure, S. Matsui, and L. Whitman. (Mater. Res. Soc. Symp. Proc. Vol. 584 p. 201-206, 

(1999). Boston, MA. 

325. “Correlation of Photo Electron Emission Microscopy and Field Emission from Nitrogen- 

Doped Diamond Films,” R. J. Nemanich, F. A. M. Koeck, S. L. English and A. T. Sowers, 

Sixth International Symposium on Diamond Materials, Electrochemical Society 

Proceedings Vol. 99-32 Honolulu, Hawaii, p. 206-215 1999. 

326. “The Role of Oxide Impurities in Surface Residue Nucleation Due to Anhydrous 

HF/Methanol Vapor Phase Cleaning,” R. J. Carter, J. R. Hauser, and R. J. Nemanich, Sixth 

45

2000 

International Symposium on Cleaning Technology in Semiconductor Device 

Manufacturing, Electrochemical Society Proceedings Vol. 99-36, 137-44, 1999. 

327. “Growth and Characterization of GaN single crystals,” C. M. Balkas, Z. Sitar, L. Bergman, 

I. K. Shmagin, J. F. Muth, R. Kolbas, R. J. Nemanich and R. F. Davis, J. Cryst. Growth 

208, 100-106 (2000). 

328. “Nongeometric field enhancement in semiconducting cold cathodes and in metal-insulatorsemiconductor 

structures,” Griff L. Bilbro and Robert J. Nemanich, Appl. Phys. Lett. 76, 

(7), 891-893 (2000). 

329. “Photoluminescence and recombination mechanisms in GaN/Al0.2Ga0.8N superlatice,” Leah 

Bergman, Mitra Dutta, M. A. Stroscio, S. M. Komirenko, C. J. Eiting, D. J. H. Lambert, H. 

K. Kwon, R. D. Dupuis and R. J. Nemanich, Appl. Phys Lett. 76, (15), 1969-1971 (2000). 

330. “Measurement of Field Emission from Nitrogen-Doped Diamond Films,” A. T. Sowers, B. 

L. Ward, S. L. English and R. J. Nemanich, Diamond and Related Materials 9, (9-10), 

1569-73 (2000). 

331. “Schottky barrier height and electron affinity of titanium on AlN,” B. L. Ward, J. 

D.Hartman, E. H. Hurt, K. M. Tracy, R. F. Davis and R. J. Nemanich, J. Vac. Sci. Tech. B 

18, (4), 2082-2087 (2000). 

332. “Effects of a Ta interlayer on the phase transition of TiSi2 on Si (111),” Hyeongtag Jeon, 

Bokhee Jung, Young Do Kim, Woochul Yang and R. J. Nemanich, J. Appl. Phys. 88, (5), 

2467-2471 (2000). 

333. “Surface Residue Islands Nucleation in Anhydrous HF/Alcohol Vapor Processing of Si 

Surfaces,” Richard J. Carter, John R. Hauser and Robert J. Nemanich, J. Electrochem. Soc. 

147, (9), 3512-3518, (2000). 

334. “Spatial Variation of Ferroelectric Properties in Pb(Zr0.3Ti0.7)03 Thin Films Studied by 

Atomic Force Microscopy,” James A. Christman, Seung-Hyun Kim, Hiroshi Maiwa, Jon- 

Paul Maria, Angus I. Kingon, Brian Rodriguez and R. J. Nemanich, J. Appl. Phys. 87, (11), 

8031-8034 (2000). 

335. “Photoemission of the SiO2-SiC Hetero-Interface,” M. L. O’Brien, C. Koitzsch and R. J. 

Nemanich, Proc. of Int. Conf. on Silicon Dielectric Interfaces, and J. Vac. Sci. Tech. B 18, 

(3), 1776-1784 (2000). 

336. “Anomalous Field Enhancement in Planar Semiconducting Cold Cathodes from 

Spontaneous Ordering in the Accumulation Region,” Griff L. Bilbro and Robert J. 

Nemanich. Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel 

Displays, edited by Kevin L. Jensen, Robert J. Nemanich, Paul Holloway, Troy Trottier, 

46

William Mackie, Dorota Temple and Junji Itoh (Mater. Res. Soc. Symp. Proc. Vol. 621, p. 

R6.4.1-R6.4.7) San Francisco, CA, April (2000). 

337. “Thermionic FEEM, PEEM and I/V Measurements of N-Doped CVD Diamond Surfaces,” 

F. A. M. Koeck, J. M. Garguilo, B. Brown and R. J. Nemanich. Electron-Emissive 

Materials, Vacuum Microelectronics and Flat-Panel Displays, edited by Kevin L. Jensen, 

Robert J. Nemanich, Paul Holloway, Troy Trottier, William Mackie, Dorota Temple and 

Junji Itoh (Mat. Res. Soc. Proc. Vol 621, p. R6.5.1-R6.5.6) San Francisoc, CA April 

(2000). 

338. “Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001),” J. 

D. Hartman, K. Naniwae, C. Petrich, V. Ramachandran, R. M. Feenstra, R. J. Nemanich 

and R. F. Davis, Materials Science Forum 338-342, Pt. 1, 353-6 (2000). 

339. “Electron Emission from Carbon Films: Issues of Uniformity,” R. J. Nemanich, F. A. M. 

Koeck, and J. Garguilo. Proc. of First International Symposium on Cold Cathodes, The 

Electrochemical Society, Vol. 2000 (28), 193-200. Editors M. Cahay, K. L. Jensen, P. D. 

Mumford, J. Yater, R. A. Murphy, D. Temple and V. J. Kapoor, 2000. 

340. “Effect of Interface Manipulation for MBE Growth of AIN on 6H-SiC,” Koichi Naniwae, 

Jeff Hartman, Chris Petrich, Robert F. Davis and Robert J. Nemanich. Wide-bandgap 

Electronic Devices, Editors: R. J. Shul, F. Ren, M. Murakami, W. Pletschen (Mater. Res. 

Soc. Symp. Proc. Vol. 621, p. T5.6 2000). 

2001 

341. “Ultraviolet Raman Study of A1(LO) and E2 Phonons in InxGa1-xN Alloys,” Dimitri 

Alexson, Leah Bergman, Mitra Dutta, Michael A. Stroscio, C. A. Parker, S. M. Bedair, N. 

A. El-Masry, Fran Adar and R. J. Nemanich, J. Appl. Phys. 89, (1), 798-800 (2001). 

342. “Optical Characterization of Wide Bandgap Amorphous Semiconductors (a-Si:C:H)-Effect 

of Hydrogen Dilution,” Minseo Park, C. W. Teng, V. Sakhrani, M. B. McLaurin, R. M. 

Kolbas, R. C. Sanwald, R. J. Nemanich, J. J. Hren and J. J. Cuomo, J. Appl. Phys. 89, (2), 

1130-37 (2001). 

343. “XAFS Studies of the Formation of Cobalt Silicide on (√3 by √3) SiC(0001),” W. Platow, 

D. K. Wood, J. E. Burnette, R. J. Nemanich and D. E. Sayers, J. Synchrotron Rad. 8, 475- 

477, (2001). 

344. “Formation of Cobalt Disilicide Films on (√3 by √3) 6H-SiC (0001),” W. Platow, D. K. 

Wood, K. M. Tracy, J. E. Burnette, R. J. Nemanich and D. E. Sayers, Phys. Rev. B 63, 

115312-1, 7, (2001). 

47

345. “Quantitative analysis of a-Si1-xCx:H: H thin films by vibrational spectroscopy and nuclear 

methods,” D. Gracin, K. Bogdanovic, V. Borjanovic, M. Jaksic, Z. Pastuovic, J. M. Dutta, 

B. Vlahovic and R. J. Nemanich Vacuum 61, (2-4) 303-308, (2001). 

346. “Photon energy dependence of contrast in photoelectron emission microscopy of Si 

devices,” V. W. Ballarotto, K. Siegrist, R. J. Phaneuf, E. D. Williams, W. -C. Yang and R. 

J. Nemanich, Appl. Phys. Lett. 78, (22), 3547-3549, (2001). 

347. “UV-FEL Photo-Electron Emission Microscopy of the Dynamics of Nanostructures on 

Silicon Surfaces,” W. C. Yang, H. Ade and R. J. Nemanich. “Laser Applications in 

Microelectronic and Optoelectronic Manufacturing VI,” Edited by M. C. Gower, H. 

Helvajian, K. Sugioka and J. J. Dubowski. (SPIE, Bellingham, WA, 2001) SPIE Vol. 4274, 

168-176, (2001). 

348. “Thermionic FEEM, PEEM and I/V Measurements of Hydrogen Terminated N-Doped 

CVD Diamond Surfaces,” F. A. M. Koeck, J. M. Garguilo, B. Brown and R. J. Nemanich. 

Proceedings of Sixth Applied Diamond Conference/Second Frontier Carbon Technology 

Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M. Murakawa, Y. 

Koga, K. Kobashi and G. A. J. Amaratunga, 126-131, (2001). 

349. “Field Emission, PEEM and FEEM Measurements of Emitting Sites of MPCVD grown 

NanoCrystalline diamond Films,” J. M. Garguilo, F. A. M. Koeck, Billyde Brown and R. J. 

Nemanich, Proceedings of Sixth Applied Diamond Conference/Second Frontier Carbon 

Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M. 

Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga, 133-137, (2001). 

350. “High-Pressure Polymerization of Single Wall Carbon Nanotubes,” M. Popov, M. Kyotani, 

Y. Koga and R. J. Nemanich, Proceedings of Sixth Applied Diamond Conference/Second 

Frontier Carbon Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. 

Yoshikawa, M. Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga, 681-686, 

(2001). 

351. “Phonons in III-V nitrides: Confined phonons and interface phonons,” M. Dutta, D. 

Alexson, L. Bergman, R. J. Nemanich, R. Dupuis, K. W. Kiim, S. Komirenko, and M. 

Stroscio, Physica. E 11, (Low-dimensional systems and nanostructures) 277-280 (2001). 

352. “Measurements of the Band Offset of SiO2 on Clean GaN,” E. H. Hurt, T. E. Cook, Jr., K. 

M. Tracy, R. F. Davis, G. Lucovsky and R. J. Nemanich GaN and Related Alloys edited by 

J.E. Northrup, J. Neugebauer, D.C. Look, S.F. Chichibu, H. Riechert (Mater. Res. Soc. 

Proc. Vol. 693, p. I9.10) Boston, MA, 2001). 

48

353. “Measurements of the Effective Piezoelectric Constant of Nitride Thin Films and 

Heterostructures using Scanning Force Microscopy,” B. J. Rodriguez, D-J. Kim, A.I. 

Kingon and R.J. Nemanich, GaN and Related Alloys, edited by J.E. Northrup, J. 

Neugebauer, S.F. Chichibu, D.C. Look and H. Riechert. (Mater. Res. Soc. Proc. Vol. 693, 

p.I9.9.1) Boston, MA, 2001. 

354. “Chemical, Electrical, and Structural Properties of Ni/Au Contacts on Chemical Vapor 

Cleaned p-typed GaN,” P.J. Hartlieb, A. Roskowski, R.F. Davis and R.J. Nemanich. GaN 

and Related Alloys, edited by J.E. Northrup, J. Neugebauer, S.F. Chichibu, D.C. Look and 

H. Riechert (Mater. Res. Soc. Proc. Vol. 693, p. I11.40.1) Boston, MA, 2001. 

355. “Growth of epitaxial CoSi2 on 6H-SiC (0001) Si,” W. Platow, R. J. Nemanich, D. E. Sayers, 

J. D. Hartman and R. F. Davis, J. Appl. Phys. 90, (12), 5924-5927 (2001). 

356. “Imaging electron emission from diamond films surfaces: N-doped diamond vs. 

nanostructured diamond,” F. A. M. Koeck, J. M. Garguilo and R. J. Nemanich, Diamond 

and Related Materials 10, 1714-1718 (2001). 

357. “Selective bond breaking in amorphous hydrogenated silicon by using Duke FEL,” D. Gr 

acin, V. Borjanovic, B. Valhovic, A. Sunda-Meya, T. M. Patterson, J. M. Dutta, S. Hauger, 

I. Pinayev, M. E. Ware, D. Alexson, R. J. Nemanich and B. von Roedern Nuclear 

Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, 

Detectors and Associated Equipment 475(1-3), 635-639 (2001). 

2002 

358. “Pd growth and subsequent Schottky barrier formation on chemnical vapor cleaned p-type 

GaN Surface,” P. J. Hartlieb, A. Roskowski, R. F. Davis, W. Platow and R. J. Nemanich. J. 

Appl. Phys. 91, (2), 732-738 (2002). 

359. “Electrical, Structural and Microstructural Characteristics of As-Deposited and Annealed 

Pt and Au Contacts on Chemical-Vapor-Cleaned GaN Thin Films,” E.A. Preble, K.M. 

Tracy, S. Kiesel, H. McLean, P.Q. Miraglia, R.J. Nemanich, R.F. Davis, M. Albrecht and 

David J. Smith, J Appl. Phys. 91, (4), 2133-2137 (2002). 

360. “Superhard Phase Composed of Single-wall Carbon Nanotubes,” M. Popov, M. Kyotani, 

R. J. Nemanich and Y. Koga, Phys. Rev. B 65 (3), art.no. 033408 (2002). 

361. “Chemical, Electrical, and Structural Properties of Ni/Au Contacts on Chemical Vapor 

Cleaned p-typed GaN,” P.J. Hartlieb, A. Roskowski, R.F. Davis and R.J. Nemanich, J. 

Appl. Phy. 91, (11), 9151-9160. (2002) 

362. “Piezoresponse force microscopy for polarity imaging of GaN,” B.J. Rodriguez, A. 

Gruverman, A.L. Kingon, R.J. Nemanich, O. Ambacher. Appl. Phys. Lett. 80 (22), 4166- 

4168 (2002). 

49

363. “Enhanced low-temperature thermionic field emission from surface-treated N-doped 

diamond films,” F.A.M. Kock, J.M. Garguilo, B. Brown, R.J. Nemanich, Diamond Relat. 

Mater. 11, (3-6), 774-779 (2002). 

364. “TiC nanoisland formation on 6H-SiC(0001)(Si),” W. Platow, J. Oh, R.J. Nemanich, D.E. 

Sayers, J.D. Hartman, R.J. Davis, J. Appl. Phys. 91, (9), 6081-6084 (2002). 

365. “Analysis of Ti-silicide formation with a thin Ta interlayer on Si (100),” H. Jeon, H. Won, 

Y. Kim, J. Lee, R.J. Nemanich, J. Korean Phys. Soc. 40, (5), 903-907 (2002). 

366. “X-ray and Raman Analysis of GaN Produced by Ultrahigh-Rate Magnetron Sputter 

Epitaxy,” M. Park, J-P. Maria, J.J. Cuomo, Y.C. Chang, J.F. Muth, R.M. Kolbas, R.J. 

Nemanich, E. Carlson, J. Bumgarner, App Phys Lett. (2002). 

367. “Single electron tunneling of nanoscale TiSi2 islands on Si,” Jaehwan Oh, Vincent 

Meunier, Hoon Ham and R. J. Nemanich, J. Appl. Phys. 92, (6), 3332-3337 (2002). 

368. “Current-voltage and imaging of TiSi2 islands on Si(001) surfaces using conductive-tip 

atomic force microscopy,” Jaehwan Oh and R. J. Nemanich, J. Appl. Phys. 92, (6), 3326- 

3331 (2002) 

369. “Electronic States at the Interface of Ti-Si Oxide on Si(100),” C. C. Fulton, G. Lucovsky 

and R. J. Nemanich, J. Vac. Sci. Technol. B 30, (4), 1726-1731 (2002). 

370. “Piezoresponse Force Microscopy for Piezoelectric Measurements of III-Nitride 

Materials,” B.J. Rodriguez, A. Gruverman, A.I. Kingon, R.J. Nemanich J. Cryst. Growth. 

246 (3-4), 252-258 (2002). 

371. “Nanoscale Observation of Photoinduced Domain Pinning and Investigation of Imprint 

Behavior in Ferroelectric Thin Films,” A. Gruverman, B.J. Rodriguez, R.J. Nemanich and 

A.I. Kingon, J. Appl. Phys. 92, (5), 2734-2739 (2002). 

372. “Analysis of Ti-silicide formation with a thin Ta interlayer on Si (100),” H. Jeon, H. Won, 

Y. Kim, J. Lee, R.J. Nemanich, J. Korean Phys. Soc. 40 (5), 903-907 (2002). 

373. "Photo Electron Emission Microscopy (PEEM), Field Emission Electron Microscopy 

(FEEM) and Thermionic FEEM of Nitrogen and Sulfur Doped Carbon Films," F.A.M. 

Koeck, S. Gupta, B.R. Weiner, G. Morell, J.M. Garguilo, Billyde Brown, and R.J. 

Nemanich, in Cold Cathodes, edited by M. Cahay et al., Electrochem. Soc. Proc. Vol. 

2002-18, 39 (2002). 

2003 

374. “Measurement of the band offsets of SiO2 on clean n- and p-type GaN(0001)”, T.E. Cook, 

C.C. Fulton, W.J. Mecouch, K.M. Tracy, R.F. Davis, E.H. Hurt, G. Lucovsky, R.J. 

Nemanich, J. Appl. Phys. 93, (7), 3995-4004, (2003). 

50

375. “Spatial and temperature dependence of electron emission from nanocrystalline diamond 

films,” R.J. Nemanich, J.M. Garguilo, F.A.M. Kock. Diamond and Other Carbon 

Materials III, editors P. Vincenzini and P. Ascarelli (Techna, Florence, 2003) p. 139-150. 

376. “Future research needs for carbon based materials,” R.J. Nemanich, O. Auciello, J.L. 

Davidson, J.T. Glass, and G.M. Swain, in Diamond and Other Carbon Materials III, 

editors P. Vincenzini and P. Ascarelli (Techna, Florence, 2003) p. 193-204. 

377. “Fibrous structures on diamond and carbon surfaces formed by hydrogen plasma under 

direct-current bias and field electron-emission properties,” K. Kobashi, T. Tachibana, Y. 

Yokota, N. Kawakami, K. Hayashi, K. Yamamoto, Y. Koga, S. Fujiwara, Y. Gotoh, H. 

Nakahara, H. Tsuji, J. Ishikawa, F. A. Kock, R.J. Nemanich, J. Mater. Res. 18, (2), 305- 

326, (2003). 

378. “Spatial distribution of electron emission sites for sulfur doped and intrinsic 

nanocrystalline diamond films,” F.A.M. Kock, J.M. Garguilo, R.J. Nemanich, S. Gupta, 

B.R. Weiner, G. Morell, Diamond Relat. Mater. 12, (3-7), 474-480 (2003). 

379. “Response to "Comment on 'Pd growth and subsequent Schottky barrier formation on 

chemical vapor cleaned p-type GaN surfaces' [J. Appl. Phys. 91, 732 (2002)],” P.J. 

Hartlieb, A. Roskowski, R.F. Davis, W. Platow, R.J. Nemanich, J. Appl. Phys. 93, (6), 679- 

3679 (2003). 

380. “Characterization of hydrogen etched 6H-SiC(0001) substrates and subsequently grown 

AlN films,” J.D. Hartman, A.M. Roskowski, Z.J. Reitmeier, K.M. Tracy, R.F. Davis, R.J. 

Nemanich, Vac Sci Technol A 21, (2), 394-400 (2003). 

381. “Wavelength-dependent Raman Scattering of Hydrogenated Amorphous Silicon Carbon 

with red, green, and blue light excitation,” M. Park, V. Sakhrani, J-P. Maria, J.J. Cuomo, 

W.W. Teng, J.F. Muth, M.E. Ware, B.J. Rodriguex, R.J. Nemanich, J. Mater. Res. 18, (4), 

768-771 (2003). 

382. “Influence of strain, surface diffusion and Ostwald ripening on the evolution of 

nanostructures for erbium on Si(001),” L. Fitting, M.C. Zeman, W.-C. Yang, R.J. 

Nemanich, J. Appl. Phys. 93, (7), 4180-4184 (2003). 

383. “Gold Schottky contacts on oxygen plasma-treated, n-type ZnO(000⎯1),” B.J. Coppa, R.F. 

Davis, R.J. Nemanich, Appl. Phys. Lett. 82, (3), 400-402 (2003). 

384. “Attractive migration and coalescence: A significant process in the coarsening of TiSi2 

islands on the Si(111) surface,” W.C. Yang, H. Ade and R.J. Nemanich, Phys. Rev. Lett., 

90, (13): art. no. 136102 (2003). 

51

385. “Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors”, A. 

Gruverman, B.J. Rodriguez, A.I. Kingon, R.J. Nemanich, J.S. Cross, M. Tsukada. Appl. 

Phys. Lett., 82 (18), 3071-3073 (2003). 

386. “Micro-Raman study of electronic properties of inversion domains in GaN-based lateral 

polarity heterostructures,” M. Park, J.J. Cuomo, B.J. Rodriguez, W. Yang, R.J. Nemanich, 

O. Ambacher. J. Appl Phys 93, (12), 9542-9547 (2003). 

387. “Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors,” A. 

Gruverman, B.J. Rodriguez, A.I. Kingon, R.J. Nemanich, A.K. Tagantsev, J.S. Cross, and 

M. Tsukada, Appl. Phys. Lett. 83, (4), 728-730 (2003). 

388. “Band offset measurements of the Si3N4/GaN (0001) interface,” T.E. Cook, Jr., C.C. 

Fulton, W.J. Mecouch, R.F. Davis, J. Appl. Phys. 94, (6), 3949-3954 (2003). 

389. “Preparation and Characterization of Atomically Clean, Stoichiometric Suraces of n- and 

p-type GaN(0001),” K.M. Tracy, W.J. Mecouch, R.F. Davis, J. Appl. Phys. 94, (5), 3163- 

3172 (2003). 

390. “Electrical and chemical characterization of the Schottky barrier formed between clean n- 

GaN(0001) surfaces and Pt, Au, and Ag,” K. M. Tracy, P. J. Hartlieb, S. Einfeldt, R. F. 

Davis, E. H. Hurt, R. J. Nemanich, J. Appl. Phys. 94, (6), 3939-3948 (2003). 

391. “Electronic structure of transition metal high-k dielectrics: interfacial band offset energies 

for microelectronic devices,” G. Lucovsky, G.B. Rayner Jr., Yu Zhang, C.C. Fulton, R.J. 

Nemanich, G. Appel, H. Ade, J.L. Whitten, Appl. Surf. Sci. 212, 563-569 (2003). 

392. “High-pressure phase transformation of silicon nitride,” J. Patten, R. Fesperman, S. Kumar, 

S. McSpadden, J. Qu, M. Lance, R. Nemanich, J. Huening, Appl Phys Lett. 83, (23) 4740- 

4742 (2003). 

393. “Band offset measurements of the GaN (0001)/HfO2 interface,” T.E. Cook, C.C. Fulton, 

W.J. Mecouch, R.F. Davis, G. Lucovsky, R.J. Nemanich, J Appl Phys. 94, (6), 3949-3954 

(2003). 

394. “Photoelectron emission microscopy observation of inversion domain boundaries of GaNbased 

lateral polarity heterostructures,” W.C. Yang, B.J. Rodriguez, M. Park, R.J. 

Nemanich, O. Ambacher, V. Cimalla, J Appl Phys. 94, (9), 5720-5725 (2003). 

2004 

395. “Three-dimensional high-resolution reconstruction of polarization in ferroelectric 

capacitors by piezoresponse force microscopy,” B.J. Rodriguez, A. Gruverman, A.I. 

Kingon, R.J. Nemanich, J.S. Cross, J Appl Phys. 95 (4): 1958-1962 (2004). 

52

396. “Shape stability of TiSi2 islands on Si (111),” W.C. Yang, H. Ade, R.J. Nemanich, J Appl 

Phys. 95, (3), 1572-1576 (2004). 

397. “Process-dependent band structure changes of transition-metal (Ti,Zr,Hf) oxides on Si 

(100),” C.C. Fulton, G. Lucovsky, R.J. Nemanich, Appl Phys Lett. 84 (4) 580-582 (2004). 

398. “Analysis of a nonorthogonal pattern of misfit dislocation arrays in SiGe epitaxy on highindex 

Si substrates,” M.E. Ware, R.J. Nemanich, J.L. Gray, R. Hull, J Appl Phys. 95, (1) 

115-122 (2004). 

399. “In situ cleaning and characterization of oxygen- and zinc-terminated, n-type, 

ZnO{0001},” B.J. Coppa, C.C. Fulton, P.J. Hartleb, R.F. Davis, B.J. Rodrigues, B.J. 

Shields, R.J. Nemanich. J. Appl Phys, 95, (10) 5856-5864, (2004). 

400. “Stability and dynamics of Pt-Si liquid micro-droplets on Si (001) surfaces,” W.-C. Yang, 

H. Ade, R.J. Nemanich. Physical Review B. 69, (4), Art. No. 045421 (2004). 

401. “Electronic Properties of GaN (0001) –Dielectric Interfaces,” T.E. Cook, C.C. Fulton, W.J. 

Mecouch, R.F. Davis, G. Lucovsky, R.J. Nemanich. Int. J. High Speed Electron. Syst. 14, 

No.1, 107-125, (2004). 

402. “Raman spectroscopy of diamond and doped diamond,” S Prawer, RJ Nemanich, 

Philosophical Transactions of the Royal Society of London Series A-Mathematical 

Physical and Engineering Sciences, 362, 1824, 2537-2565 (2004). 

403. “Photoionization threshold of eumelanosomes determined using UV free electron laser - 

Photoelectron emission microscopy,” A. Samokhvalov, J. Garguilo, W.C. Yang, G.S. 

Edwards, R.J. Nemanich, J.D. Simon, J. Phys. Chem. B 108, 42, 16334-16338 Oct 21 

(2004). 

404. “Role of thin Fe catalyst in the synthesis of double- and single-wall carbon nanotubes via 

microwave chemical vapor deposition,” Y.Y.Wang, S.Gupta, R.J. Nemanich, App. Phys. 

Lett. 85, 13, 2601-2603 Sep 27 (2004). 

405. “Interface instabilities and electronic properties of ZrO2 on silicon (100)”, C.C. Fulton, 

T.E. Cook, G. Lucovsky, R.J. Nemanich, J. Appl. Phys. 96, 5, 2665-2673, Sep 1, (2004). 

406. “Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 layers sandwiched 

between thicker SiO2 layers”, CL Hinkle, C Fulton, RJ Nemanich, G Lucovsky, Applied 

Surface Science, 234, 1-4, 240-245 Jul 15 (2004). 

407. “On the thermionic emission from nitrogen-doped diamond films with respect to energy 

conversion,” F.A.M. Koeck, J.M. Garguilo, R.J. Nemanich, Diamond and Related 

Materials 13, 11-12, 2052-2055 Nov-Dec (2004). 

53

408. “Direct bonding of GaN and SiC; A novel technique for electronic device fabrication,” J. 

Lee, R.F. Davis, R.J. Nemanich, Int. J. High Speed Electron. Syst. 14, No.1, 83-105, 

(2004). 

409. “A novel approach for determining the effective tunneling mass of electrons in HfO2 and 

other high-K alternative gate dielectrics for advanced CMOS devices,” C. L. Hinkle, C. 

Fulton, R. J. Nemanich, G. Lucovsky. Microelectronic Engineering, 72, 1-4, 257-262, 

April 2004. (Proceedings of the 13th Biennial Conference on Insulating Films on 

Semiconductors. Barcelona, 18 - 20 June 2003) 

410. “Fibrinogen adsorption onto microwave plasma chemical vapor deposited diamond films,” 

G.J. Garguilo, B.A. Davis, M. Buddie, F.A.M. Kock, R.J. Nemanich, Diamond and Related 

Materials 13, (4-8): 595-599 (2004). 

411. “Direct correlation of surface morphology with electron emission sites for intrinsic 

nanocrystalline diamond films,” E.M. Kock, J.M. Garguilo, R.J. Nemanich, Diamond and 

Related Materials 13, (4-8), 1022-1025 (2004). 

412. “Experimental studies of the formation process and morphologies of carbon nanotubes with 

bamboo mode structures,” Y.Y.Wang, G.Y. Tang, F.M. Koeck, B. Brown, J.M. Garguilo, 

R.J. Nemanich, Diamond and Related Materials 13, (4-8), 1287-1291 (2004). 

413. “Polarization dependent electron affinity of LiNbO3 surfaces”, W.-C. Yang, B.J. 

Rodriguez, A. Gruverman, R.J. Nemanich. Appl Phys Lett 85, (12), 2316-2318 (2004). 

414. “Spectroscopic studies of metal high-k dielectrics: transition metal oxides and silicates, and 

complex rare earth/transition metal oxides”, G. Lucovsky, J. G. Hong, C. C. Fulton, Y. 

Zou, R. J. Nemanich, H. Ade, D. G. Scholm, J. L. Freeouf Phy Stat Sol B, 241 (10), 2221- 

2235 (2004). 

415. “Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 layers sandwiched 

between thicker SiO2 layers”, C.L. Hinkle, C. Fulton, R.J. Nemanich and G. Lucovsky, 

Appl. Surf. Sci, 234, (1-4), 240-245 (2004). 

416. “X-ray absorption spectra fro transition metal high-kappa dielectrics: Final state 

differences for intra- and interatomic transitions,” G. Lucovsky, J.G. Hong, C.C. Fulton, Y. 

Zou, R.J. Nemanich, H. Ade. J. Vac. Sci. Technol. B 22, 4, 2132-2138 (2004). 

2005 

417. “Investigation of the mechanism of polarization switching in ferroelectric capacitors by 

three- dimensional piezoresponse force microscopy”, Rodriguez BJ, Gruverman A, 

Kingon AI, Nemanich RJ, Cross JS, Appl Phys A – Materials Science & Processing, 80, 1, 

99-103 (2005). Published on line, 9 July, 2004 

54

418. “Oxidation Potentials of Human Eumelanosomes and Pheomelanosomes”, Alexander 

Samokhvalov, Lian Hong, Yan Liu, Jacob Garguilo, Robert J. Nemanich, Glenn S. 

Edwards and John D. Simon. Photochemistry and Photobiology, 81: 145–148, (2005) 

419. “Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force 

microscopy”, B. J. Rodriguez, R. J. Nemanich, A. Kingon, and A. Gruverman, S. V. 

Kalinin, K. Terabe, X. Y. Liu, K. Kitamura. Appl. Phys. Lett. 86, 012906 (2005) 

420. “Scanning probe investigation of surface charge and surface potential of GaN-based 

heterostructures,” B. J. Rodriguez, W.-C. Yang, R. J. Nemanich, A. Gruverman, Appl. 

Phys. Lett. 86, 112115 (2005) 

421. “Atomic force microscopy-based experimental setup for studying domain switching 

dynamics in ferroelectric capacitors,” C. Dehoff, B. J. Rodriguez, A. I. Kingon, R. J. 

Nemanich, and A. Gruverman, J. S. Cross, Rev. Sci. Instr. 76, (2005) 

422. “Preparation and characterization of atomically clean, stoichiometric surfaces of 

AIN(0001),” W. J. Mecouch, B. P. Wagner, Z. J. Reitmeier, R. F. Davis, C. Pandarinath, B. 

J. Rodriguez, R. J. Nemanich, J. Vac. Sci. Technol. A 23(1), (2005). 

423. “High negative ion yield from light molecule scattering,” J.A. Scheer, M. Wieser, P. Wurz, 

P. Bochsler, E. Hertzberg, S.A. Fuselier, F.A. Koeck, R.J. Nemanich, M. Schleberger. 

Nuclear Instruments & Methods In Physics Research Section B-Beam Interactions with 

Materials and Atoms 230: 330-339 Sp. Iss. SI, APR 2005. 

424. “Conduction band states of transition metal (TM) high-k gate dielectrics as determined 

from X-ray absorption spectra,” G. Lucovsky, J.G. Hong, C.C. Fulton, N.A. Stoute, Y. 

Zou, R.J. Nemanich, D.E. Aspnes, H. Ade, D.G. Schlom. Microelectronics Reliability 45 

(5-6): 827-830 MAY-JUN (2005). 

425. “Photo-electron emission and atomic force microscopies of the hydrogen etched 6H- 

SiC(0001) surface and the initial growth of GaN and AlN,” J.D. Hartman, K. Naniwae, C. 

Petrich, R. Nemanich, R.F. Davis. Applied Surface Science 242 (3-4): 428-436 APR 15 

(2005). 

426. “Imaging temperature-dependent field emission from carbon nanotube films: Single versus 

multiwalled,” S. Gupta Y.Y. Wang, J.M. Garguilo, R.J. Nemanich. Applied Physics Letters 

86 (6): Art. No. 063109 FEB (2005). 

427. “Synchrotron x-ray studies of vitreous SiO2 over Si(001). I. Anisotropic glass 

contribution,” M. Castro-Colin, W. Donner, S.C. Moss, Z. Islam, S.K. Sinha, R. Nemanich, 

H.T. Metzger, P. Bosecke, T. Shulli. Physical Review B 71 (4): Art. No. 045310 JAN 

(2005). 

55

428. “Synchrotron x-ray studies of vitreous SiO2 over Si(001). II. Crystalline contribution,” M. 

Castro-Colin, W. Donner, S.C. Moss, Z. Islam, S.K. Sinha, R. Nemanich. Physical Review 

B 71 (4): Art. No. 045311 JAN (2005). 

429. “Multi-walled carbon nanotube interactions with human epidermal keratinocytes,” N.A. 

Monteiro-Riviere, R.J. Nemanich, A.O Inman, Y.Y. Wang, J.E. Riviere. Toxicology 

Letters 155 (3): 377-384 MAR 15 (2005). 

430. “Photo electron emission microscopy of polarity-patterned materials,” W.C. Yang, B.J. 

Rodriguez, A. Gruverman, R.J.Nemanich. Journal of Physics-Condensed Matter 17 (16): 

S1415-S1426 Sp. Iss. SI, APR 27 (2005). 

431. “Conduction band-edge states associated with the removal of d-state degeneracies by the 

Jahn-Teller effect,” G. Lucovsky , C.C. Fulton, Y. Zhang, Y. Zou, J. Luning, L.F. Edge, 

J.L.Whitten, R.J. Nemanich, H. Ade, D.G. Schlom, V.V. Afanase'v, A. Stesmans, S. 

Zollner , D. Triyoso, B.R. Rogers. IEEE Transactions on Device and Materials Reliability 

5 (1): 65-83 MAR (2005). 

432. “Final state effects in VUV and soft X-ray absorption spectra of transition metal oxides and 

silicate alloys: comparisons between experiment and ab initio calculations,” G. Lucovsky, 

Y. Zhang, C.C. Fulton, Y. Zou, R.J. Nemanich, H. Ade, J.L. Whitten. Journal of Electron 

Spectroscopy and Related Phenomena Volumes 144-147, 917-919, June (2005). 

433. “Studies of the coupling of final d*-states in mixed Hf and Ti oxides (HfO2)x(TiOx)1−x and 

other complex oxides,” C.C. Fulton, G. Lucovsky, Y. Zhang, Y. Zou, R.J. Nemanich, H. 

Ade and J.L. Whitten. Journal of Electron Spectroscopy and Related Phenomena, (144- 

147), 913-916, June (2005). 

434. “Growth and field emission properties of small diameter carbon nanotube films,” Y.Y. 

Wanga, S. Guptaa, J.M. Garguiloa, Z.J. Liub, L.C. Qinb R.J. Nemanicha. Diamond and 

Related Materials, (14) Issues 3-7, 714-718, March-July (2005). Proceedings of Diamond 

2004, the 15th European Conference on Diamond, Diamond-Like Materials, Carbon 

Nanotubes, Nitrides and Silicon Carbide 

435. “Field enhanced thermionic electron emission from sulfur doped nanocrystalline diamond 

films,” F.A.M. Köck, J.M. Garguilo, R.J. Nemanich. Diamond and Related Materials, (14) 

Issues 3-7, 704-708, March-July (2005). Proceedings of Diamond 2004, the 15th European 

Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides and Silicon 

Carbide 

436. “Structural, microstructural, and electrical properties of gold films and Schottky contacts 

on remote plasma-cleaned, n-type ZnO{0001} surfaces,” B.J. Coppa, C.C. Fulton, S.M. 

Kiesel, R.F. Davis, C. Pandarinath, J.E. Burnette, R.J. Nemanich, D.J. Smith, Journal of 

Applied Physics 97 (10): Art. No. 103517 Part 1, MAY 15 (2005). 

56

437. “Increased field-emission site density from regrown carbon nanotube films,” Y.Y. Wang, 

S. Gupta, M. Liang, R.J. Nemanich. Journal of Applied Physics 97 (10): Art. No. 104309 

Part 1, MAY 15 (2005). 

438. “Formation of stable titanium germanosilicide thin films on Si1-xGex,” J.E. Burnette, R.J. 

Nemanich, D.E. Sayers. Journal of Applied Physics 97 (11): Art. No. 113521 JUN 1 

(2005). 

439. “AlN bulk crystals grown on SiC seeds,” R. Dalmau, R. Schlesser, B.J. Rodriguez, R.J. 

Nemanich, Z. Sitar. Journal of Crystal Growth 281 (1): 68-74 JUL 15 (2005). 

440. “Applications of Free-Electron Lasers in the Biological and Material Sciences,” 

G.S. Edwards, S.J. Allen, R.F. Haglund, R.J. Nemanich, B. Redlich, J.D. Simon and W.- 

C. Yang. Photochemistry and Photobiology, 81 : 4, 711-735. July (2005). 

441. “Self-organized nanoscale Ge dots and dashes on SiGe/Si superlattices,” L. Fitting, M. E. 

Ware, J. R. Haywood, Jennifer J. H. Walter, and R. J. Nemanich. Journal of Applied 

Physics, 98, (2): 024317, July 15 (2005 ). 

442. “Hollow to bamboolike internal structure transition observed in carbon nanotube films,” Y. 

Y. Wang, S. Gupta, R. J. Nemanich, Z. J. Liu, L. C. Qin. Journal of Applied Physics 98 

(1): Art. No. 014312 JUL 1 (2005). 

443. “Secondary electron emission of chemical-vapor-deposited diamond by impact of slow H + , 

D + , H2 + , C + , O + , and O2 + ions,” M. Wieser, P. Wurz, R. J. Nemanich, S. A. Fuselier. 

Journal of Applied Physics 98, 034906 (2005). 

444. “Direct studies of domain switching dynamics in thin film ferroelectric Capacitors,” A. 

Gruverman, B. J. Rodriguez, C. Dehoff, J. D. Waldrep, A. I. Kingon, R. J. Nemanich, J. S. 

Cross. Applied Physics Letters 87, 082902 (2005). 

445. “NICE: an instrument for direct mass spectrometric measurement of interstellar neutral 

gas,” M. Wieser, P. Wurz, P. Bochsler, E. Moebius, J. Quinn, S. A. Fuselier, A. Ghielmetti, 

J. N. DeFazio, T. M. Stephen, R. J. Nemanich. Measurement Science & Technology 16 (8): 

1667-1676 AUG (2005). 

446. “Conduction band-edge d-states in high-k dielectrics due to Jahn–Teller term splittings,” G. 

Lucovsky, C.C. Fulton, Y. Zhang, J. Luning, L. Edge, J.L. Whitten, R.J. Nemanich, D.G. 

Schlom, V.V. Afanase'v. Thin Solid Films Volume 486, Issues 1-2, 129-135 August 22 

(2005). 

447. “Thermionic field emission from nanocrystalline diamond-coated silicon tip arrays,” J. M. 

Garguilo, F. A. M. Koeck, R. J. Nemanich, X. C. Xiao, J. A. Carlisle, O. Auciello. Physical 

Review B 72 (16): Art. No. 165404 OCT (2005). 

57

448. “Sulfur doped nanocrystalline diamond films as field enhancement based thermionic 

emitters and their role in energy conversion,” F.A.M. Koeck, R.J. Nemanich, Diamond and 

Related Materials 14 (11-12): 2051-2054, (2005). 

449. “Thermal stability of TiO2, ZrO2, or HfO2 on Si„(100) by photoelectron emission 

microscopy,” M. C. Zeman, C. C. Fulton, G. Lucovsky, and R. J. Nemanich, W.-C. Yang. 

Journal Of Applied Physics 99, 023519 (2006). 

450. “Emission characterization from nitrogen-doped diamond with respect to energy 

conversion,” F. A. M. Koeck , R. J. Nemanich. Diamond & Related Materials 15 (2-3): 

217-220 (2006). 

451. “Electronic properties of the Zr-ZrO2-SiO2-Si(100) gate stack structure,” C. C. Fulton, G. 

Lucovsky, R. J. Nemanich. Journal Of Applied Physics 99 (6): Art. No. 063708 (2006). 

452. “Photoionization Thresholds of Melanins Obtained from Free Electron Laser– 

Photoelectron Emission Microscopy, Femtosecond Transient Absorption Spectroscopy 

and Electron Paramagnetic Resonance Measurements of Oxygen Photoconsumption,” T. 

Ye, L. Hong, J. Garguilo, A. Pawlak, G. S. Edwards, R. J. Nemanich, T. Sarna, J. D. 

Simon. Photochemistry and Photobiology, 82: 733–737, (2006). 

453. “Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission 

microscopy,” M. C. Zeman, C. C. Fulton, G. Lucovsky, and R. J. Nemanich, W.-C. Yang. 

Journal Of Applied Physics 99, 023519 (May 2006). Art. No. 109902 

454. “Photo and field electron emission microscopy, from sulfur doped nanocrystalline diamond 

films,” F.A.M. Koeck, M. Zumer, V. Nemanic, R.J. Nemanich, Diamond & Related 

Materials 15 (2006) 880–883 

455. “The effect of Schottky barrier lowering and nonplanar emitter geometry on the 

performance of a thermionic energy converter, J.R. Smith, R.J. Nemanich, G.L. Bilbro, 

“Diamond and Related Materials 15, Issues 4-8 , April-August 870-874 (2006). 

456. “Electron emission microscopy of nano-crystal graphitic films as high current density 

electron sources,” FAM Koeck, AN Obraztsov, RJ Nemanich, Diamond and Related 

Materials 15, Issues 4-8, April-August 875-879 (2006). 

457. “Localized emission from flat diamond cathodes,” Griff L. Bilbro, Robert Nemanich 

Diamond & Related Materials 15 1418 – 1423 (2006). 

458. “The surface oxidation potential of human neuromelanin reveals a spherical architecture 

with a pheomelanin core and a eumelanin surface”, William D. Bush, Jacob Garguilo, 

Fabio A. Zucca, Alberto Albertini, Luigi Zecca, Glenn S. Edwards, Robert J. Nemanich, 

and John D. Simon. Proceedings Of The National Academy Of Sciences Of The United 

States Of America 103 (40): 14785-14789 OCT 3 2006 

58

459. “Fabrication of metallic nanowires on a ferroelectric template via photochemical reaction”, J. N. 

Hanson, B. J. Rodriguez, R.J. Nemanich, A. Gruverman. Nanotechnology 17 (19): 4946-4949 

(OCT 14 2006) 

59

8. Invited Conference Presentations 

1. "Low Frequency Light Scattering from the Cuprous Halides," International Conference on 

Fast Ion Transport in Solids, Lake Geneva, Wisconson , 1979. 

2. "Reactions at the Metal-Si Interface Studied by Interference Enhanced Raman Scattering," 

March Meeting of the APS, Los Angeles, 1981. 

3. "Interference Enhanced Raman Scattering from Metal/Semiconductor Interfaces," Ninth 

International Conference on Raman Spectroscopy, Tokyo, Japan, 1984. 

4. "Silicide Formation at Thin Film Interfaces," Third International Conference on Solid 

Films and Surfaces, Sydney, Australia, 1984. 

5. "Raman Spectroscopy for Semiconductor Thin Film Analysis," Spring Meeting of the 

Materials Research Society, Palo Alto, CA, 1986. 

6. "The Initial Stages of Silicide Epitaxy - Nucleation and Morphology," Spring Meeting of 

the Materials Research Society, Palo Alto, CA, 1987. 

7. "Characterization of Diamond Films by Raman Spectroscopy," Stanford University Short 

Course on Diamond Films, Stanford, CA, 1989. 

8. "Characterization of Growth Processes of Diamond Thin Films by Raman Spectroscopy," 

U.S. ARO Workshop - Army Applications for Diamond and Diamondlike Materials, 

Chapel Hill, NC, 1989. 


Penn. State AVS-MRS symposium on Preparation and Characterization of Diamond and 

Diamond-like Materials, University Park, PA, 1989. 

10. "Interference Enhanced Raman Scattering from Thin Films and Interfaces," Microbeam 

Analysis Symposium, Asheville, NC, 1989. 

11. "Diamond Characterization - Bulk properties," UC Berkeley Extension Short Course - 

"Diamond Thin Films: Synthesis and Applications," San Francisco, 1990. 


TMS Meeting, Anaheim, California, 1990. 

13. "Use of Raman Scattering for Temperature Measurement of Silicon," Semiconductor 

Research Corporation Topical Research Workshop on Temperature Measurements, Santa 

Fe, New Mexico, 1990. 

14. "Raman Characterization of Diamond Film Growth," Second International Conference on 

the New Diamond Science and Technology, Washington, DC, 1990. 

60

15. "Characterization of Diamond Films," Short Course Materials Research Society 

Symposium, Anaheim, California, Spring 1991. 

16. "Cleaning and Passivation of Si Surfaces for Semiconductor Thin Film Growth or 

Processing," Gordon Research Conference, Plymouth, New Hampshire, 1991. 

17. "Raman Characterization of Thin Diamond Films," International Conference of Physics 

Students, Vienna, Austria, 1991 (presented by Eugen Buehler). 

18. "Nucleation and Morphology of TiSi2 on Si," Materials Research Society Symposium, San 

Francisco, California, April, 1992. 

19. "Properties of Interfaces of Diamond," Trieste Semiconductor Symposium on Wide-Band- 

Gap Semiconductors, Trieste, Italy, July, 1992. 

20. "Interface Structure of Epitaxial TiSi2 on Si(111)," 50th Annual Electron Microscopy 

Society of America meeting, Boston, August, 1992. 

21. "Plasma Surface Interactions and Surface Properties of Remote Plasma Cleaned Si(100)," 

Seoul, Korea, Korea Technical Symposium, November 1992. 

22. "Metal/Diamond Interfaces: Negative Electron Affinity Effects," American Physical 

Society, Seattle, March, 1993. 

23. "Plasma-surface interactions and surface properties for remote plasma cleaning of Si(100)," 

Materials Research Society Symposium Y, San Francisco, CA, April 13, 1993. 

24. "Stacked gate MOSFET with raised source-drain configuration using single wafer cluster 

technology,” Santa Clara Plastics' 1st Annual Symposium, Boise, Idaho, October 7-8, 

1993. 

25. "Disordered Structures in CVD Diamond Films," Symposium on Amorphous Insulators, 

Winter Park, Colorado, August 7-11, 1994. 

26. "Characterization of Semiconductors with a UV Photoemission Electron Microscope,” 

Materials Characterization with IR, VUV and Soft X-ray Microscopy, Duke Free Electron 

Laser Laboratory, March 17, 1995. 

27. “Hydrogen Plasma Cleaning,” Presented to the Clean Wafer Club, June 1995. 

28. "Diamond Negative Electron Affinity Surfaces, Structures and Devices,” 3rd International 

Conference on the Applications of Diamond Films and Related Materials, NIST, 

Gaithersburg, MD, August 21-24, 1995. 

61

29. “Negative Electron Affinity Surfaces of AlN and Diamond,” Diamond Films '95, 

Barcelona, Spain, September 10-15, 1995. 

30. “(Negative) Electron Affinity of AlN and AlGaN Alloys,” Material Research Society, 

Symposium AAA, Boston, MA, Fall 1995. 

31. “Ohmic Contacts in Si-Ge Alloys,” Annual TMS Meeting, Los Angeles, CA, February 6, 

1996 

32. “Electron Emission from Diamond and Other Wide Bandgap Semiconductors,” University 

of Twente, Amsterdam, Holland, February 20-25, 1996. 

33. “Electron Emission from Diamond and Other Wide Bandgap Semiconductors,” 

International School of Physics Enrico Fermi, Varenna, Italy, July 29-Augurst 2, 1996. 

34. “Electron Emission From Diamond and other Wide bandgap Semiconductors,” Frontier 

Carbon Technology Symposium in Tsukuba, Japan.October 18-26, 1996. 

35. “Electron Emission from Diamond Films and Surfaces,” International Union of Materials 

Research Societies-ICA’97, Symposium I, Super Carbon, Tokyo, Japan, September 16-19, 

1997. 

36. “Electron Emission Properties of Diamond and Nitride Surfaces,” The Fourth International 

Symposium on Atomically Controlled Surfaces and Interfaces, Waseda University, Tokyo, 

Japan, October 27-30, 1997 

37. “Free electron laser and Photo Emission Electron Microscope (PEEM) in Materials 

Research,” Materials Research Society, NC Section Annual Symposium, Microelectronics 

Center of North Carolina, November 20, 1997. 

38. “Formation and Characterization of Nanoscale Epitaxial Islands on Silicon,” Materials 

Research Society symposium Surface-Controlled Nanoscale Materials for High-Added- 

Value Applications, Boston, Dec. 1997. 

39. “Characterization of Electron Emitting Surfaces of Diamond and III-V Nitrides,” Second 

International Symposium on Diamond Electronic Devices, Osaka, Japan, March 9-10, 

1998. 

40. “Photo-Electron Emission Microscopy of Semiconductor Surfaces,” FEL Workshop at 

Vanderbilt University, Nashville, TN. March 23-24, 1998. 

41. “Electron Emission Properties of Crystaline Diamond and Nitride Surfaces,” Materials 

Research Society, symposium Materials Issues in Vacuum Microelectronics, San 

Francisco, April, 1998. 

62

42. “Remote Plasma and HF Vapor Phase Approaches for In Situ Cleaning,” SCP International 

Symposium on Wafer Surface Conditioning, Boise, ID. April 23-24, 1998. 

43. “Electron Emission from Crystalline Diamond Surfaces,” R. J. Nemanich, P. K.Baumann, 

A. T. Sowers and B. L. Ward. 8th CIMTEC Conference.Florence, Italy. June 13-17, 1998. 

44. “Imaging Electron Emission from Diamond and III-V Nitrides with Photo-electron 

Emission Microscopy,” R. J. Nemanich, S. L. English, J. D. Hartman, A. T. Sowers, B. L. 

Ward, H. Ade, and R. F. Davis. Presented at 2nd International Vacuum Electron Sources 

Conference, Ibaraki, Japan, July 3-12, 1998. 

45. “Photo-Electron Emission Microscopy of Semiconductor Surfaces,” R. J. Nemanich. S. L. 

English, J. D. Hartman, W. Yang, H. Ade, and R. F. Davis, Microscopy and Microanalysis 

‘98 Meeting, Atlanta, GA, July 12-17, 1998. 

46. “Surfaces and Interfaces of Diamond and Other Wide Bandgap Materials,” R. J. Nemanich, 

P. K. Baumann, S. L. English, A. T. Sowers, B. L. Ward, J. van der Weide, H. Ade and R. 

F. Davis. IVMEC-E- Emission Meeting, July 23-25, 1998, Asheville, NC. 

47. “Instabilities of Interfaces of SiGe Alloys,” Robert J. Nemanich, David Aldrich, Boyan 

Boyanov, Peter Goeller and Dale E. Sayers. 4th International Conference on Electronic 

Materials, Plenary Session II, Korea, August 23-29, 1998. 

48. “Correlation of Electron Affinity and Electron Emission of Diamond,” R. J. Nemanich, P. 

K. Baumann, S. English, A. T. Sowers and B. L. Ward. Sixth International Conference on 

New Diamond Science and Technology, Johannesburgh, South Africa, August 30- 

September 4, 1998. 

49. “UV-FEL PEEM Studies of Dynamical Properties of Surfaces,” R. J. Nemanich. SURA 

Workshop on UV, X-Ray and Gamma Ray Applications of FELs, Washington, DC, 

November 20, 1998. 

50. “Electron Emission from Nitrogen doped CVD Diamond films,” A. T. Sowers, B. L. Ward 

and R. J. Nemanich. WE-Heraeus Seminar, Technische Universitat at Ilmenau, Germany. 

May 1999. 

51. “Electron Emission and PEEM of Nitrogen Doped Diamond Films,” 5 th International 

Conference on Advanced Materials, Beijing, China, June 13-18, 1999. 

52. “Variable Wavelength PEEM of N and B Doped Diamond Films,” Applied Diamond 

Conference/Frontier Carbon Technology, Tsukuba, Japan. August 31-September 3, 1999. 

53. “Photoemission microscopy studies of electron emission and electron affinity of diamond,” 

R. J. Nemanich, S. L. English, F. A. M. Koeck, A. T. Sowers and H. Ade. 10 th Eurpoean 

Conference on Diamond, Diamond-Like Materials, Carbon, Nanotubes, Nitrides and 

Silicon Carbide, Prague, Czech Republic, September 12-17, 1999. 

63

54. “Correlation of PEEM and Field Emission of CVD Diamond,” R. J. Nemanich, D. 

Alexson, A. T. Sowers and B. L. Ward. 196 th Electrochemical Society Conference, 

Honolulu, Hawaii, October 17-22, 1999. 

55. “Integrated HF Vapor Phase Cleaning and Surface Preparation for Gate Dielectrics,” R. J. 

Nemanich, 2 nd Annual International SEMATECH Wafer Cleaning and Surface Preparation 

Workshop, 2000. April 11-12, 2000. 

56. “Prospects for Diamond/Carbon based Micro and Nano Structures,” Plenary talk at First 

FCT Symposium, Tokyo, Japan, June 4-8, 2000. 

57. “Imaging Electron Emission from Diamond Film Surfaces: N-doped Diamond vs. 

Nanostructured Diamond,” R.J. Nemanich, F.A.M. Köck, and J.M. Garguilo, 7 th 

International Conference on New Diamond Science and Technology, (ICNDST-7) City 

University of Hong Kong, July 24-28, 2000. 

58. “UV Photo-Electron Emission Microscopy of the Dynamics of Nanostructures on Silicon 

Surfaces,” R. J. Nemanich, Woochul Yang and Harald Ade. 22nd International Free 

Electron Laser Conference and 7th FEL Users Workshop, Duke University, Durham, NC 

August 13-18, 2000. 

59. “Electron Emission from Wide Bandgap Semiconductors: Issues of Spatial Uniformity,” R. 

J. Nemanich, F. Kock, J. Garguilo, and G. Bilbro, First International Symposium on Cold 

Cathodes, 198 th Meeting of the Electrochemical Society, Phoenix, AZ, October 25-27, 

2000. 

60. “UV-FEL photo-electron emission microscopy of nanostructures on silicon surfaces,” R. J. 

Nemanich, W. Yang, and H. Ade, Photonics West, LASE, San Jose, CA, January 20-26, 

2001. 

61. “Temperature dependence of electron emission from diamond/carbon films,” R. J. 

Nemanich, F. A. M. Koeck and J. M. Garguilo. The International Topical Meeting on Field 

Electron Emission from Carbon Materials, Moscow, Russia, July 2-4, 2001. 

62. “N-Doped CVD Diamond Films as a Low Temperature Thermionic Field Electron 

Source,” Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint 

Conference, (ADC/FCT), Auburn, Alabama, Aug. 4-10, 2001. 

63. “Electron Emission from Carbon Materials,” LXXXVII Annual Meeting of SIF (Italian 

Physical Society), University Milano-La Bicocca, Milan, Italy, Sept. 22-27, 2001. 

64. “Diamond Field Emission Devices for Displays and Microsystems,” Robert J. Nemanich, 

March Meeting 2002 American Physical Society, Indianapolis, IN, March 18-22, 2002. 

64

65. “Spatial and temperature dependence of electron emission from nanocrystalline diamond 

films,” R.J. Nemanich, J.M. Garguilo, F.A.M. Kock. CIMTEC International Conferences on 

Modern Materials & Technologies. 3 rd International Conference, Diamond and Other 

Carbon Materials. Florence, Italy, July 14-18, 2002. 

66. “Future research needs for carbon based materials,” R.J. Nemanich. CIMTEC International 

Conferences on Modern Materials & Technologies. 3 rd International Conference, Diamond 

and Other Carbon Materials. Florence, Italy, July 14-18, 2002. 

67. “Piezoresponse Force Microscopy for Piezoelectric Measurements and Polarity Imaging of 

III-Nitride Materials,” R.J. Nemanich, B.J. Rodriguez, A. Gruverman, A.I. Kingon,. 

International Workshop on Bulk Nitride Semiconductors, Ariau Lodge, Amazonas, Brazil, 

May 18-23, 2002. 

68. “Raman Investigation on Inversion Domains in GaN.” M. Park, J. J. Cuomo, W.-C. Yang, 

B. J. Rodriguez, R. J. Nemanich, O. Ambacher, Joint Meeting, the Materials Research 

Society (MRS)-North Carolina Section and the Mid-Atlantic Chapter of the American 

Vacuum Society (AVS), Chapel Hill, North Carolina, U. S. A., Nov. 15, 2002. 

69. “Piezoresponse Force Microscopy and Photo Electron Emission Microscopy of GaN Lateral 

Polarity Heterostructures,” R.J. Nemanich, B.J. Rodriguez, W-C. Yang, M. Par, A. 

Gruverman, A.I. Kingon, ONR Workshop on Defect Characterization Techniques in Wide 

Gap Semiconductors, Maui, Hawaii, March 16-20, 2003. 

70. “Processing-induced changes in GaN/insulator interface electronic states,” Robert 

Nemanich, Tri-Services Workshop on Process Induced Defects in Wide Bandgap 

Semiconductors, ONR, Grants Pass, OR, Aug. 17-21, 2003. 

71. “Dynamics of Nano Wire Formation on Si(100) Surfaces,” R.J. Nemanich, Lena Fitting, A. 

Sunda-Meya,M.C. Zeman, W-C Yang, IUMRS-ICAM 2003, Yokohama, Japan, Oct. 8-13, 

2003. 

72. “Approaches for Involving Materials Researchers in Education Outreach Programs,” Robert 

Nemanich, IUMRS-ICAM 2003, Yokohama, Japan, Oct. 8-13, 2003. 

73. “Trends in Surface and Interface Electronic Properties of III-Nitride Materials,” R.J. 

Nemanich, 2 nd Brazil-MRS Meeting, Rio de Janeiro, Brazil, Oct. 26-29, 2003. 

74. “Perspectives on International Collaboration from the International Union of Materials 

Research Societies – IUMRS,” Robert Nemanich, 2 nd Brazil-MRS Meeting, Rio de Janeiro, 

Oct. 26-29, 2003. 

75. “Welcome presentation,” Words by co-organizers and sponsors, Robert Nemanich, 2nd 

Brazil-MRS Meeting, Rio de Janeiro, Oct. 26-29, 2003. 

65

76. “Structural Challenges for Materials ‘Research and Materials’ Technologies: View from the 

United States and from Other Countries of the Americas,” R. Nemanich, Workshop 

Scientific and Technological Development in the Americas, Quito, Ecuador, Dec. 10-12, 

2003. 

77. “Cross-Hatch morphology, misfit dislocation, and strain relaxation in SiGe epitaxy on highindex 

Si surfaces”, R.J. Nemanich, M.E. Ware, L. Fitting 2004 U.S. Workshop on the 

Physics and Chemistry of II-VI Materials Oct. 5-7, 2004 Chicago, Il 

78. “Imaging Nanostructures in Motion,” R.J. Nemanich. Nanoscience in the 21 st Century, Oct. 

15-16, Fall Meeting of the Illinois Section of the American Association of Physics Teachers, 

2004 Peoria, Il. 

79. “Influence of strain, surface diffusion and ostwald ripening on the evolution of 

nanostructures on Si surfaces,” R.J. Nemanich, W.L. Yang, L. Fitting, M.C. Zeman, 3 rd 

Brazil MRS Meeting, Oct. 10-13, 2004, Iquassu Falls, Brazil. 

80. “Passivation and Processing-Induced Changes in GaN/Insulator Interfaces,” RJ Nemanich, 

T.E. Cook, Jr. C.C. Fulton, W.J. Mecouch, R.F. Davis, G. Lucovsky, AVS 51 st International 

Symposium & Exhibition Nov. 14 – 19, 2004 Anaheim, CA 

81. “The Potential of Carbon Based Materials in Vacuum Thermionic Energy Conversion,” F.A. 

Koeck, J.R. Smith, J. Garguilo, Y. Wang, S. Gupta, G. Bilbro, R.J. Nemanich. 2005 Spring 

Meeting MRS, March 28 – April 1, 2005, San Francisco, CA. 

82. Plenary sessions: Advanced Materials Panelists. International conference on materials 

research and education: Future trends and Opportunities Doha, Qatar April 2005. 

83. “The Potential of Diamond Materials in Vacuum Thermionic Energy Converstion,” Franz 

A. M. Koeck, Yingjie Tang, Joshua Smith, Griff L. Bilbro, and Robert J. Nemanich. The 

24th International Conference on Thermoelectrics, June 19-23, 2005, Clemson, SC. 

84. “Photoelectric Effect,” R.J. Nemanich. 100 th Anniversary of Physics’ Greatest Year, 

Einstein Centennial Series, Cox Hall, NCSU, Raleigh, NC March 21, 2005 

85. “The Potential of Diamond Materials in Vacuum Thermionic Energy Converstion,” R.J. 

Nemanich. ICT 2005 Clemson University, Clemson, SC June 19-23, 2005 

86. “Thermionic and Field Electron Emission from Nanostructured Carbon Materials for Enegy 

Conversion and Vacuum Electronics,” Franz Koeck, Yunyu Wang, Robert J. Nemanich. 

The 31 st Annual Conference of the IEEE Industrial Electronics Society, Nov. 6-10, 2005, 

Sheraton Capitol Center, Raleigh, NC. 

87. “Interface band alignment at High-k / Metal gate structures: Interface dipoles and internal 

fields,” R. Nemanich. 36 th IEEE Semiconductor interface specialists conference, Arlington, 

VA Dec. 2005. 

66

88. International Union of Materials Research Societies 4th Forum on New Materials, Co-Chair 

and Steering Committee CIMTEC 2006, R. Nemanich, June 4 to 9, 2006, Acireale, Sicily, 

Italy. 

9. Short Courses and Tutorials 

“Characterization of Diamond Films,” J.T. Glass and R.J. Nemanich, Short Course, 

Materials Research Society - Spring Meeting, Anaheim, 1991. 

“Diamond Films: Growth and Properties,” R.J. Nemanich, J.T. Glass, and J. Von 

Windheim, Short Course, Materials Research Society - Fall Meeting, Boston, 1992. 

“Diamond Films: Growth and Properties,” Linda S. Plano, David Dreifus, and R.J. 

Nemanich, Short Course, Materials Research Society - Spring Meeting, San Francisco, 

1994. 

“Electron Emission From Diamond,” Michael Geis and Robert J. Nemanich, Tutorial, 

Materials Research Society - Fall Meeting, Boston, 1995. 

“Electron Field Emitters Based on Carbon Materials,” R.J. Nemanich, J.L. Davidson, W.P. 

Kang, Sixth Applied Diamond Conference/Second Frontier Carbon Technology Joint 

Conference, (ADC/FCT), Auburn, Alabama, Aug. 4-10, 2001. 

10. Seminars and Colloquia (after 1986) 

1. “Novel Liquid and Solid Phases of Laser Annealed Si,” NCSU SPS Seminar (1986). 

2. “The Initial Stages of Thin Film Epitaxy at Silicide/Si Interfaces,” Princeton University, 

EE Department Seminar (1986). 

3 “Scanning Tunneling Microscopy Applications to Heteroepitaxial Film Growth,” UNC- 

Chapel Hill, Department of Physics Colloquium (1987). 

4. “Silicide Formation on Crystalline and Amorphous Si,” NCSU, Materials Science and 

Engineering Colloquium (1987). (Repeated on video tape as one of the years’ five best ) 

5. “Initial Stages of Thin Film Epitaxy,” University of Houston, Department of Physics 

Seminar (1988). 

6. “Growth and Characterization of Diamond Thin Films,” Xerox, PARC, Seminar (1988). 

67

7. “Carbon Bonding in Diamond Thin Films,” Wake Forest University, Department of 

Physics Colloquium (1988). 

8. “Scanning Tunneling Microscopy - Nuts and Bolts and Applications,” NCSU, SPS 

Seminar (1988). 

9. “Silicides/Silicon Heteroepitaxy: Surface Preparation, Interface Structure, and 

Morphology,” Battelle Pacific Northwest Laboratories, Seattle, Washington (1991). 

10. “Interfaces on Diamonds,” North Carolina State University, Department of Physics 

Colloquium (1991). 

11. “Interfaces on Diamond: Negative Electron Affinity Affects,” University of Virginia, Joint 

seminar of the Department of Physics and Department of Material Science (October 1992). 

12. “Surface and Interface Morphologies of Epitaxial TiSi2 and ZrSi2 on Si,” Hyandai, Seoul, 

Korea (November 19, 1992). 

13. “Surface and Interface Morphologies of Epitaxial TiSi2 and ZrSi2 on Si,” Korean Institute 

of Science and Technology (KIST), Seoul, Korea (November 20, 1992). 

14. “Surface and Interface Morphologies of Epitaxial TiSi2 and ZrSi2 on Si,” Samsung, Seoul, 

Korea (November 21, 1992). 

15. “Metal/Diamond Interfaces: Negative-Electron-Affinity Effects,” Materials Science and 

Engineering, N. C. State University, (April 2, 1993). 

16. “Negative electron affinity affects on diamond,” Department of Physics Solid State 

Seminar, UNC-Chapel Hill, January 18, 1994. 

Lecture Series on Surfaces, Interfaces, and Thin Films: Presented at Wuppertal University, 

Department of Electrical Engineering, Center for Microstructures Research 

17. “Surface Energy and Thin Film Nucleation (fundamentals),” May 26, 1994, 

Forschungszentrum fur Mikrostrukturtechnik, Wuppertal, Germany. 

18. “Surface Reactions and H-Plasma Assisted Surface Phase Transformations,” June 15, 

1994, Forschungszentrum fur Mikrostrukturtechnik, Wuppertal, Germany. 

19. “Diamond Film Growth and Characterization,” June 17, 1994, Forschungszentrum 

fur Mikrostrukturtechnik, Wuppertal, Germany. 

20. “Properties of Diamond Films and Surfaces,” June 21, 1994, Forschungszentrum fur 

Mikrostrukturtechnik, Wuppertal, Germany. 

68

21. “Raman Scattering for Semiconductor Thin Film Analysis,” June 23, 1994, 

Forschungszentrum fur Mikrostrukturtechnik, Wuppertal, Germany. 

22. “Negative Electron Affinity of Diamond Surfaces,” June 20, 1994, Philips GmbH Research 

Laboratories Aachen, Germany. 

23. “Negative Electron Affinity of Diamond Surfaces,” June 27, 1994, Max Planck Institute for 

Semiconductor Research, Stuttgart, Germany. 

24. “Wafer Cleaning for in situ Processing of Silicon,” June 28, 1994 Institute for 

Semiconductor Research, Stuttgart, Germany. 

25. “Negative Electron Affinity of Diamond and AlN,” Dec. 15, 1994, NEC Research Institute, 

Princeton, NJ. 

26. “Hydrogen Plasma Cleaning,” R. J. Nemanich. Presented to the Clean Wafer Club, June 9, 

1995 

27. “Electron Emission From Wide Bandgap Semiconductors,” Condensed Matter Seminar for 

the Department of Physics, University of North Carolina, Chapel Hill, NC January 17, 

1996 

30. ”Electron Emission from Diamond and other Wide bandgap Semiconductors,” Osaka 

University, Japan, October 1996. 

31. “Surface and Interface Properties of SiGe Alloys,” University of Virginia, Department of 

Physics Colloquium, November 11, 1996. 

32. “Surface and Interface Properties of SiGe Alloys,” University of Michigan, Department of 

Physics invited colloquium, January 30, 1997-February 1, 1997. 

33. “Negative Electron Affinity Surfaces of Wide Bandgap Nitrides and Diamond,” Ohio 

University, Department of Physics Colloquium, April 24-26, 1997. 

34. “Photo-Electron Emission Microscopy of Semiconductor Surfaces,” Vanderbilt University, 

Nashville, TN, March 23-24, 1998. 


Boyanov, Peter Goeller and Dale E. Sayers. Samsung, Elect. Div., Korea, August 24, 

1998. 


Boyanov, Peter Goeller and Dale E. Sayers. Presented at Hanyang University Colloquium, 

Korea, August 28, 1998. 

69

37. “Characterization of Electron Emitting Surfaces of Diamond and III-V Nitrides,” R. J. 

Nemanich, P. K. Baumann, M. C. Benjamin, S. L. English, J. D. Hartman, A. T. Sowers 

and B. L. Ward. Presented at Samsung Adv. Mat. Division, Korea, August 28, 1998. 

38. “Photo Electron Emission Microscopy (PEEM) of Semiconductor Surfaces using UV Free 

Electron Laser Excitation,” Royal Institute of Techology, Stockholm, Sweden. May 24, 

1999. 

39. “Photo Electron Emission Microscopy (PEEM) of Semiconductor Surfaces using UV Free 

Electron Laser Excitation,” University of Illinois, June 29-July 1, 1999. 

40. “Electron Emission from Wide Bandgap Semiconductors: Issues of Spatial Uniformity,” R. 

J. Nemanich, F. Koeck, J. Garguilo, and G. Bilbro, Argonne National Labs, Argonne, IL 

November 1, 2000. 

41. “Electron Emission from Carbon Materials,” Arizona State University, Department of 

Physics Colloquium, Nov. 15, 2001. 

42. “Growth Dynamics of Silicide Nanostructures,” R.J. Nemanich, Woochul Yang, Lena 

Fitting, seminar, Department of Materials Science and Engineering, Hanyang University, 

Seoul, South Korea, May 28, 2002. 


Fitting, seminar, Samsung Electronics, Suwon, South Korea, May 28, 2002. 

44. “Atomic Force Microscopy to Image Piezoresponse of III-Nitride Materials,” Robert 

Nemanich and Brian Rodriguez, Texas Tech University, Lubbock, Texas, Oct. 3, 2002. 


Fitting, Colloquium Department of Materials Science, Univ. of Wisconsin, Madison, WI, 

Oct. 10, 2002. 

46. “Electron Emission from Nanostructured Carbon Materials,” R. Nemanich, F.A.M. Koeck, 

J.M. Garguilo, First U.S. Armenian Workshop on New Electronic Materials, Ashtarak, 

Armenia, Nov. 3-10, 2002. 

47. “Atomic Force Microscopy to Image Piezoresponse of III-Nitride Materials,” Robert 

Nemanich and Brian Rodriguez, First U.S. Armenian Workshop on New Electronic 

Materials, Ashtarak, Armenia, Nov. 3-10, 2002. 


Fitting, Jaehwan Oh, Matthew Zeman, Materials Colloquium, Case Western Reserve 

University, Jan. 28, 2003 

70

11. Grants Awarded 

1. “Complex Si Structures,” Xerox Corp., 9/87, $20,000. 

2. “Characterization of Epitaxial and Polycrystalline Silicide Formation,” MCNC 87 

Competitive Grants Program, 9/87 - 9/89, $20,000. 

3. “Reactive Heteroepitaxial Film Growth - Nucleation and Morphology of Silicide-Si 

Interfaces,” NSF, 3/88 - 2/92, $105,000 per year. 

4. “Deposition of Semiconductor Films and Studies of Fundamental Electronic Processes in 

the Pico- and Femto-second Regime,” (Joint program with Professor, H. Kurz, Technical 

University of Aachen), NC Board of Science and Technology, Lucovsky and Nemanich, 

2/88 - 1/90, $25,000 per year. 

5. “Center for Advanced Electronic Materials Processing,” NSF Engineering Research 

Program; N. A. Masnari, Director; R. Nemanich - Coordinator of Wafer Cleaning Thrust 

Area; 9/88 - 9/99, $120,000 to 175,000 per year. 

6. “Raman Characterization of Carbon Bonding in Diamond Thin Films,” Research Triangle 

Institute, 1/1/89 - 12/31/90, $28,000 per year. 

7. “Analysis of Complex Semiconductor Thin Film Structures,” Research Triangle Institute, 

8/15/88 - 8/31/90, $7,500 per year. 

8. “Fundamental Studies of Defect Generation in Amorphous Silicon Alloys Grown by 

Remote Plasma-Enhanced Chemical-Vapor Deposition,” SERI, Lucovsky, Nemanich and 

Bernholc, 7/89-12/91, $125,000 per year . 

9. “Studies of Semiconducting Diamond Films: Synthesis and Characterization of Structural, 

Chemical and Electronic Properties,” Japanese Ministry of International Trade and Industry 

(MITI), Jointly with NCSU, Kobe Steel Ltd., and Harwell Laboratory (England), PI - J. 

Glass, 8/89 - 8/92, $60,000 per year for NCSU. 

10. “Optical Characterization of Diamond Films,” Kobe Steel, 1/1/90-12/31/91, $25,000 per 

year. 

11. “Static and Dynamic Properties of Semiconductor Microstructures,” North Carolina Board 

of Science and Technology, R.J. Nemanich and G. Lucovsky, 1/1/90-6/30/91, $25,000 per 

year. 

12. “Electronic Processes in the Femto- & Pico-Second Regime of N,” North Carolina Board 

of Science and Technology, R.J. Nemanich and G. Lucovsky, 2/89-12/90, $25,000 per 

year. 

71

13. “Raman Characterization of Carbon Bonding in Diamond Thin Films,” Kobe 

Development, R.J. Nemanich, 1/1/90-6/30/92, $25,000.00 per year. 

14. “Characterization of Diamond Film Nucleation and Growth Surface,” Office of Naval 

Research, R.J. Nemanich, 4/1/90-10/31/91, $80,000. 

15. “Growth Controlled Microstructures: Opto-Electronic Properties,” North Carolina Board of 

Science and Technology, R.J. Nemanich, 8/1/90-6/1/92, $25,000 per year. 

16. “Atomic Scale Characterization of Thin Film Diamond Surface and Interface Properties,” 

The Office of Naval Research, R.J. Nemanich, 4/1/91-3/31/92, $50,000. 


10/1/90 - 6/30/91, $7,500. 

18. “Growth, Characterization, and Device Development in Monocrystalline Diamond Films,” 

Office of Naval Research, R.F. Davis and R.J. Nemanich, 2/1/91-11/30/91, $32,000. 


R.J. Nemanich and T.P. Humphreys, 8/15/91-8/31/92, $7,500. 

20. “Interface Properties of Wide Bandgap Semiconductor Structures,” The Office of Naval 

Research - University Research Initiative, R.F. Davis and R.J. Nemanich, 1/1/92-12/31/96, 

$999,340 per year. 

21. “Metal-Semiconductor Contacts to Diamond,” Kobe Development, T.P. Humphreys and 

R.J. Nemanich, 6/1/91-5/31/92, $30,000. 

22. “Heteroepitaxial Silicide Formation on Silicon and SiGe Alloy Nucleation, Morphology 

and Stability,” National Science Foundation, R. J. Nemanich, $105,000 per year 7/1/92- 

6/30/95. 

23. “Atomic Scale Characterization of Thin Film Diamond Surface and Interface Properties,” 

Office of Naval Research, through and in collaboration with the Research Triangle 

Institute, R. J. Nemanich, 1/1/92-12/31/94, $40,000 per year. 

24. “Characterization of Diamond Films and Contacts,” Kobe Development, R. J. Nemanich 

and T. P. Humphreys, 4/1/92-3/31/93, $71,000. 

25. “Raman Scattering Characterizations of Diamond Thin Films and Surfaces,” Research 

Triangle Institute, R. J. Nemanich, 11/19/91-7/14/92, $10,150. 

26. “Low Temperature Deposition and Characterization of n- and p-Type Silicon Carbide Thin 

Films and Associated,” Office of Naval Research, R. J. Nemanich, 4/1/92-9/30/92, 

$24,906. 

72

27. “Design of Prototype Chemical Vapor Deposition Reactor,” Battelle Pacific Northwest 

Laboratories, R.F. Davis and R. J. Nemanich, 3/23/93-12/28/94, $149,000. 

28. “Particle Growth in Subatmospheric Pressure Processing Equipment,” Research Triangle 

Institute, R. Nemanich, (9/92-8/94, $22,000 per year). 

29. “Measurement of Strain in 300-600 µm Single Crystal,” GE Superabrasive, R. J. 

Nemanich, 3/24/93-6/30/94, $40,000. 

30. “Advanced Growth & Surface Analysis System for In-Situ Studies of Interface 

Information,” Department of Energy, D. E. Sayers and R. J. Nemanich (September 1993, 

$330,000.00). 

31. “Diamond Based Cold Cathode Triodes/High Frequency and Power Application,” 

Diamond Microelectronics Corp., R. J. Nemanich, (January 1995, $234,137). 

32. “A New Diamond Electron Emitter Device,” PTS Company (STTR Proposal to ONR), R. 

J. Nemanich, (January 1995, $40,000). 

33. “Development of Cold Cathode Emitters Based on Diamond,” Office of Naval Research 

(ASSERT), R.F. Davis and R.J. Nemanich, (June 1995, $90,000). 

34. “Photo-Electron Emission Microscopy Free Electron Laser System,” Office of Naval 

Research, R.J. Nemanich, R.F. Davis and H. Ade, (July 1995, $689,665). 

35. “Defects and Impurities in 4H and 6H SiC Homoepitaxial Layers,” Office of Naval 

Research, R.F. Davis, J. Baliga, R. J. Nemanich, (July 1995-July 1998, $400,000 /yr). 

36. “Phonons in Quantum Epitaxial Structures of Wide Bandgap Materials,” Army Research 

Office, (3/1/97-2/28/2000, $232,000) 

37. “Interface Engineering and Defect Control in Heteroepitaxial Growth of GaN,” Office of 

Naval Research, R. Nemanich, R. Davis and H. Ade, (June 1997-June 1999, $250,000). 

38. “Ultra-Violet Raman & Photoluminescence Spectroscopy for the Study of Wide Bandgap 

Semiconductors,” DURIP Army Research Office, R. Nemanich and L. Bergman (March 

98-March 99, $112,500). 

39. “Characterization of Electron Emission from Frontier Carbon Materials,” Japan Fine 

Ceramics Center, R.J. Nemanich and Z. Sitar (Dec 1998 – March 2002, $400,000). 

40. “Compact Power Suplies Based on Heterojunction Switching in Wide Band Gap 

Semiconductors,” ONR MURI, R. Davis (PI) Wafer Bonding and Interfaces Project 

(Nemanich) (June 98- May 2003, ~$120,000 per yr). 

73

41. “UV-FEL Studies of the Dynamics of Surface Processes and Film Growth,” R. Nemanich 

(PI), H. Ade, and R. Davis (Subcontract through Duke Univ from AFOSR, Sept 2000 – 

August 2004, $105,000 per yr.). 

42. “Dynamics of Interface Instabilities & Nanostructure Formation on Si & SiGe Alloys,” 

NSF, R. J. Nemanich, $380,809. 4/1/2001 –3/31/2004 

43. “Ohmic Contacts to Bulk N-Type Gallium Nitride,” Kyma Technologies Inc., STTR-Phase 

I, BMDO, N, Oarjm R.J. Nemanich, J. Cuomo, $42,000. 11/26/2002 – 5/26/2003 

44. “Characterization of Electron emission from Frontier Carbon Materials of Electron 

Emission,” Japan Fine Ceramics Center - NEDO, R. J. Nemanich and Z. Sitar, 

$383,504.00. 12/18/1998 –3/31/2003 

45. “Compact Power Supplies Based on Heterojunction Switching in Wide band gap 

Semiconductors,” ONR, R. F. Davis, K. W. Kim, R. J. Nemanich, and Z. Sitar, $5,544,999. 

4/01/1998 – 12/31/2003. 

46. “Synthesis & Processing of Carbon-based Nanostructured Materials,” Argonne Nat Lab, 

R.J. Nemanich, $84,000. 3/29/2002 – 3/28/2006 

47. “Growth and Characterization of GaN, AlGaN Piezoelectronics and Electron Structure 

Emitting Computation of Para and Pie,” University of California-San Diego, R. F. Davis, 

R. J. Nemanich and J. Bernholc, $625,000. 5/1/1999 – 11/29/2005 

48. “Materials Processing & Characterization for a Novel High Current Switch,” PTS Co., 

SBIR-Phase I, US Air Force, R.J. Nemanich, $20,000. 5/7/2002 – 5/6/2003 

49. “Materials Processing and Characterization for a Novel High Current Switch, Phase II,” 

Power Technology Services Co. (PTS), SBIR-Phase II, US Air Force, R. Nemanich, G. 

Bilbro, $312,785, 07/01/2003 - 06/30/2005. 

50. “Indentation, Scribing and Machining of HPPT Material,” Western Michigan University, 

National Science Foundation-FGR, R. Scattergood, R.J. Nemanich, $210,846, 08/01/2003 - 

06/30/2005. 

51. “Self Organized Epitaxial SiGe Multilayer Structures (The Center for Nanoscopic 

Materials Design),” University of Virginia, National Science Foundation-MRSEC, R. 

Nemanich, $50,000, 06/01/2004- 05/31/2005. 

52. “Application of in-situ Spectroscopy Methods and ab initio Theory to Band Alignment and 

Thermal Stability at Metal-High k Gate Dielectric Interfaces,” NCSU Center for Advanced 

Electronic Material Processing-NSF, Semiconductor Research Corp., R. Nemanich, 

$93,132, 04/01/2004- 03/31/2006. 

74

53. “Carbon Nanostructures for Energy Conversion, Sensing, Electronics and Displays,” 

Vanderbilt University, US Army Research Laboratories, R. Nemanich (PI), Z. Sitar, C. 

Sagui, S. Franzen, K. Weninger, $3,715,000, 05/20/2004- 05/19/2008 

54. “Acquisition of a Scanning Probe System for Characterization of Nanostructure 

Properties,” National Science Foundation , R. Nemanich, C. Gorman, H. Hallen, J. Krim, 

$450,000.00, 08/01/2003 - 07/31/2005 

55. “Fabrication of GaN Schottky Diode Power Rectifier on Bulk GaN with Advanced Metal 

Contacts,” Kyma Technologies, Inc, SBIR-Phase II, US Dept. of Defense, R. Nemanich, J. 

Cuomo, $50,000, 10/01/2004- 09/30/2006. 

56. “Interdisciplinary Doctoral Program in Electronic Materials,” US Dept. of Education, D. 

Larick, R. Nemanich, $931,104, 07/01/2005- 06/30/2008 

57. “Carbon Nanostructures and Wide Bandgap Semiconductors for Vacuum Thermionic 

Energy Conversion,” University of California - San Cruz (Prime--US Navy), R. Nemanich, 

G. Bilbro, R. Davis, Z. Sitar, $1,170,000, 05/21/2003 through 11/30/2006. 

58. “Thermionic Converters Based on Nanostructured Carbon Materials,” Power Technology 

Services Co. (PTS), SBIR Phase I, US Air Force, R. Nemanich, $33,295, 07/01/2003 - 

06/30/2004. 

59. “Materials Processing and Characterization for a Thermionic Converter Based on 

Nanostructured Carbon Materials,” Power Technology Services Co. (PTS), SBIR Phase II, 

US Air Force, R. Nemanich, G. Bilbro, $190,042, 03/25/2004 - 03/25/2006. 

60. “NIRT: Configurable Nano Patterned Polar Surfaces for Molecular Pattern Formation and 

Transfer,” R. Nemanich (PI), C. Gorman, A. Kingon, M. Oliver-Hoyo, L. Clarke, T. Pearl, 

A. Grouverman, National Science Foundation-MRI, $1,600,000, 08/01/2004 - 07/31/2008. 

61. “Multi-functional Extreme Environment Surfaces: Nanotribology for Air and Space,” US 

Air Force, J. Krim (PI), R. Nemanich, D. Brenner, A. Kingon, M. Zikry. $5,751,678.00, 

05/01/2004- 04/30/2009 

62. “Dynamics of Formation and Electronic Properties of Nanostructures on Silicon,” NSF, R. J. 

Nemanich, $255,000. 8/1/2005 –7/31/2008 

63. “High Power Diamond Electronics,” Denso Corporation, R.J. Nemanich, $140,000, 

10/01/07-09/09. 

64. “Photo-stimulated nanopattern formation on polarity patterned ferroelectric surfaces,” NSF, 

R.J. Nemanich, $420,386, 07/01/2008-06/30/2011. 

75

biographical summary of robert j. nemanich - Department of Physics ...

Create successful ePaper yourself

Delete template?

Save as template?